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Volumn 60, Issue 8, 1999, Pages 5927-5937

Electron-beam-induced fragmentation in ultrathin C60 films on Si(100)-2 × 1-H: Mechanisms of cage destruction

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EID: 8344258062     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.60.5927     Document Type: Article
Times cited : (29)

References (77)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.