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Volumn 20, Issue 13, 2009, Pages 135706-
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Modelling the manipulation of C60 on the Si001 surface performed with NC-AFM.
a
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Author keywords
[No Author keywords available]
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Indexed keywords
FULLERENE C60;
FULLERENE DERIVATIVE;
SILICON;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
CHEMICAL STRUCTURE;
CHEMISTRY;
COMPUTER SIMULATION;
MONTE CARLO METHOD;
SCANNING TUNNELING MICROSCOPY;
TEMPERATURE;
THEORETICAL MODEL;
THERMODYNAMICS;
COMPUTER SIMULATION;
FULLERENES;
MICROSCOPY, ATOMIC FORCE;
MICROSCOPY, SCANNING TUNNELING;
MODELS, MOLECULAR;
MODELS, THEORETICAL;
MONTE CARLO METHOD;
SILICON;
TEMPERATURE;
THERMODYNAMICS;
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EID: 67649097218
PISSN: None
EISSN: 13616528
Source Type: Journal
DOI: 10.1088/0957-4484/20/13/135706 Document Type: Article |
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Times cited : (23)
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References (0)
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