Two types of structures for the GaAs(001)-c(4×4) surface

Applied Physics Letters

Volumn 83, Issue 25, 2003, Pages 5193-5195

  Ohtake, Akihiro ^a   Koguchi, Nobuyuki ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIMERS; LIGHT REFLECTION; METALLORGANIC VAPOR PHASE EPITAXY; MOLECULAR BEAM EPITAXY; MONOCHROMATORS; PHASE EQUILIBRIA; PHASE SHIFT; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; SUBSTRATES; X RAY PHOTOELECTRON SPECTROSCOPY;

REFLECTANCE DIFFERENCE SPECTROSCOPY (RDS); TUNNELING CURRENTS;

CRYSTAL ATOMIC STRUCTURE;

EID: 0942277528     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1635078     Document Type: Article

References (16)

1. See, for example, N. P. Kobayashi, T. R. Ramachandran, P. Chen, and A. Madhukar, Appl. Phys. Lett. 68, 3299 (1996); R. Heiz, T. R. Ramachandran, A. Kalburge, Q. Xie, I. Mukhametzhanov, P. Chen, and A. Madhukar, Phys. Rev. Lett. 78, 4071 (1997); N. Koguchi, S. Takahashi, and T. Chikyow, J. Cryst. Growth 111, 688 (1991).
2. See, for example, N. P. Kobayashi, T. R. Ramachandran, P. Chen, and A. Madhukar, Appl. Phys. Lett. 68, 3299 (1996); R. Heiz, T. R. Ramachandran, A. Kalburge, Q. Xie, I. Mukhametzhanov, P. Chen, and A. Madhukar, Phys. Rev. Lett. 78, 4071 (1997); N. Koguchi, S. Takahashi, and T. Chikyow, J. Cryst. Growth 111, 688 (1991).
3. See, for example, N. P. Kobayashi, T. R. Ramachandran, P. Chen, and A. Madhukar, Appl. Phys. Lett. 68, 3299 (1996); R. Heiz, T. R. Ramachandran, A. Kalburge, Q. Xie, I. Mukhametzhanov, P. Chen, and A. Madhukar, Phys. Rev. Lett. 78, 4071 (1997); N. Koguchi, S. Takahashi, and T. Chikyow, J. Cryst. Growth 111, 688 (1991).
4. A. R. Avery, D. M. Holmes, J. Sudijono, T. S. Jones, and B. A. Joyce, Surf. Sci. 323, 91 (1995).
5. G. R. Bell, J. G. Belk, C. F. McConville, and T. S. Jones, Phys. Rev. B 59, 2947 (1999).
6. M. Sauvage-Simkin, R. Pinchaux, J. Massies, P. Calverie, N. Jedrecy, J. Bonnet, and I. K. Robinson, Phys. Rev. Lett. 62, 563 (1989).
7. J. Falta, R. M. Tromp, M. Copel, G. D. Pettit, and P. D. Kirchner, Phys. Rev. Lett. 69, 3068 (1992); Phys. Rev. B 48, 5282 (1993).
8. J. Falta, R. M. Tromp, M. Copel, G. D. Pettit, and P. D. Kirchner, Phys. Rev. Lett. 69, 3068 (1992); Phys. Rev. B 48, 5282 (1993).
9. N. Moll, A. Kley, E. Pehlke, and M. Scheffler, Phys. Rev. B 54, 8844 (1996).
10. A. Ohtake, J. Nakamura, S. Tsukamoto, N. Koguchi, and A. Natori, Phys. Rev. Lett. 89, 206102 (2002).
11. A. Ohtake, M. Ozeki, T. Yasuda, and T. Hanada, Phys. Rev. B 65, 165315 (2002), and references therein.
12. When the As-covered sample was heated without As fluxes, sharp c(4 × 4) RHEED patterns have never been observed.
13. M. J. Begarney, L. Li, C. H. Li, D. C. Law, Q. Fu, and R. F. Hicks, Phys. Rev. B 62, 8092 (2000).
14. U. Resch-Esser, N. Esser, D. T. Wang, M. Kuball, J. Zengenhagen, B. O. Fimland, and W. Richter, Surf. Sci. 352-354, 71 (1996).
15. I. Kamiya, D. E. Aspnes, L. T. Florez, and J. P. Harbison, Phys. Rev. B 46, 15894 (1992).
16. N. Esser, W. G. Schmidt, C. Cobet, K. Fleischer, A. I. Shkrebtii, C. O. Fimland, and W. Richter, J. Vac. Sci. Technol. B 19, 1756 (2001).