Surface reconstructions on GaAs(001)

Surface Science Reports

Volumn 63, Issue 7, 2008, Pages 295-327

  Ohtake, Akihiro ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

GaAs(001) surface; Reconstruction; Reflectance difference spectroscopy; Reflection high energy electron diffraction; Scanning tunneling microscopy

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; HIGH ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SURFACE TREATMENT;

REFLECTANCE DIFFERENCE SPECTROSCOPY; REFLECTION HIGH-ENERGY ELECTRON DIFFRACTION;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 46549086588     PISSN: 01675729     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfrep.2008.03.001     Document Type: Review

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