SCOPUS 정보 검색 플랫폼

Surface Science

Volumn 366, Issue 3, 1996, Pages

Scanning tunneling microscopy and spectroscopy of individual C60 molecules on Si(100)-(2 × 1) surfaces

(5) Yao, Xiaowei a Ruskell, Todd G a Workman, Richard K a Sarid, Dror a Chen, Dong b

a UNIVERSITY OF ARIZONA (United States)

b IBM (United States)

Author keywords

Chemisorption; Fullerenes; Physisorption; Scanning tunneling microscopy; Scanning tunneling spectroscopies; Silicon

Indexed keywords

ADSORPTION; ANNEALING; CHEMISORPTION; ELECTRONIC STRUCTURE; INTERFACES (MATERIALS); SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING SILICON; SILICON CARBIDE; SPECTROSCOPY; SUBSTRATES; SURFACE PHENOMENA;

ADSORBATES; PHYSISORPTION; SCANNING TUNNELING SPECTROSCOPY;

FULLERENES;

EID: 0030283225 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/0039-6028(96)00938-7 Document Type: Article

Times cited : (65)

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