-
1
-
-
21544461610
-
-
10.1063/1.358463
-
H. Morkoç, S. Strite, G. B. Gao, M. E. Lin, B. Sverdlov, and M. Burns, J. Appl. Phys. 76, 1363 (1994). 10.1063/1.358463
-
(1994)
J. Appl. Phys.
, vol.76
, pp. 1363
-
-
Morkoç, H.1
Strite, S.2
Gao, G.B.3
Lin, M.E.4
Sverdlov, B.5
Burns, M.6
-
2
-
-
0000976094
-
-
10.1063/1.1287776
-
M. W. Cole, P. C. Joshi, C. W. Hubbard, M. C. Wood, M. H. Ervin, and B. Geil, J. Appl. Phys. 88, 2652 (2000). 10.1063/1.1287776
-
(2000)
J. Appl. Phys.
, vol.88
, pp. 2652
-
-
Cole, M.W.1
Joshi, P.C.2
Hubbard, C.W.3
Wood, M.C.4
Ervin, M.H.5
Geil, B.6
-
4
-
-
0034140780
-
SiC and GaN bipolar power devices
-
DOI 10.1016/S0038-1101(99)00235-X
-
T. P. Chow, V. Khemka, J. Fedison, N. Ramungul, K. Matocha, Y. Tang, and R. J. Gutmann, Solid-State Electron. 44, 277 (2000). 10.1016/S0038-1101(99) 00235-X (Pubitemid 30564963)
-
(2000)
Solid-State Electronics
, vol.44
, Issue.2
, pp. 277-301
-
-
Chow, T.P.1
Khemka, V.2
Fedison, J.3
Ramungul, N.4
Matocha, K.5
Tang, Y.6
Gutmann, R.J.7
-
5
-
-
33646671441
-
Self-interaction-corrected pseudopotentials for silicon carbide
-
DOI 10.1103/PhysRevB.73.195205
-
B. Baumeier, P. Krüger, and J. Pollmann, Phys. Rev. B 73, 195205 (2006). 10.1103/PhysRevB.73.195205 (Pubitemid 43740463)
-
(2006)
Physical Review B - Condensed Matter and Materials Physics
, vol.73
, Issue.19
, pp. 195205
-
-
Baumeier, B.1
Kruger, P.2
Pollmann, J.3
-
7
-
-
0031191172
-
-
10.1002/1521-396X(199707)162:1<409::AID-PSSA409>3.0.CO;2-O
-
R. J. Trew, Phys. Status Solidi A 162, 409 (1997). 10.1002/1521- 396X(199707)162:1<409::AID-PSSA409>3.0.CO;2-O
-
(1997)
Phys. Status Solidi A
, vol.162
, pp. 409
-
-
Trew, R.J.1
-
9
-
-
3042512275
-
-
10.1016/S0921-5107(98)00438-3
-
R. R. Siergiej, R. C. Clarke, S. Sriram, A. K. Agarwal, R. J. Bojko, A. W. Morse, V. Balakrishna, M. F. MacMillan, A. A. Burk, Jr., and C. D. Brandt, Mater. Sci. Eng., B 61-62, 9 (1999). 10.1016/S0921-5107(98)00438-3
-
(1999)
Mater. Sci. Eng., B
, vol.61-62
, pp. 9
-
-
Siergiej, R.R.1
Clarke, R.C.2
Sriram, S.3
Agarwal, A.K.4
Bojko, R.J.5
Morse, A.W.6
Balakrishna, V.7
MacMillan, M.F.8
Burk, Jr.A.A.9
Brandt, C.D.10
-
11
-
-
0037290261
-
4H-SiC bipolar junction transistor with high current and power density
-
DOI 10.1016/S0038-1101(02)00199-5, PII S0038110102001995
-
I. Perez-Wurfl, R. Krutsinger, J. T. Torvik, and B. Van Zeghbroeck, Solid-State Electron. 47, 229 (2003). 10.1016/S0038-1101(02)00199-5 (Pubitemid 35385406)
-
(2003)
Solid-State Electronics
, vol.47
, Issue.2
, pp. 229-231
-
-
Perez-Wurfl, I.1
Krutsinger, R.2
Torvik, J.T.3
Van Zeghbroeck, B.4
-
12
-
-
0035852234
-
P-type doping of SiC by high dose Al implantation - Problems and progress
-
DOI 10.1016/S0169-4332(01)00510-4, PII S0169433201005104
-
V. Heera, D. Panknin, and W. Skorupa, Appl. Surf. Sci. 184, 307 (2001). 10.1016/S0169-4332(01)00510-4 (Pubitemid 34019046)
-
(2001)
Applied Surface Science
, vol.184
, Issue.1-4
, pp. 307-316
-
-
Heera, V.1
Panknin, D.2
Skorupa, W.3
-
13
-
-
0000444447
-
-
10.1063/1.1290690
-
S.-K. Lee, C.-M. Zetterling, E. Danielsson, M. Östling, J.-P. Palmquist, H. Högberg, and U. Jansson, Appl. Phys. Lett. 77, 1478 (2000). 10.1063/1.1290690
-
(2000)
Appl. Phys. Lett.
, vol.77
, pp. 1478
-
-
Lee, S.-K.1
Zetterling, C.-M.2
Danielsson, E.3
Östling, M.4
Palmquist, J.-P.5
Högberg, H.6
Jansson, U.7
-
14
-
-
0035852239
-
Contact formation in SiC devices
-
DOI 10.1016/S0169-4332(01)00678-X, PII S016943320100678X
-
B. Pécz, Appl. Surf. Sci. 184, 287 (2001). 10.1016/S0169-4332(01) 00678-X (Pubitemid 34019044)
-
(2001)
Applied Surface Science
, vol.184
, Issue.1-4
, pp. 287-294
-
-
Pecz, B.1
-
15
-
-
0036498168
-
Development of refractory ohmic contact materials for gallium arsenide compound semiconductors
-
DOI 10.1016/S1468-6996(01)00150-4, PII S1468699601001504
-
M. Murakami, Sci. Technol. Adv. Mater. 3, 1 (2002). 10.1016/S1468- 6996(01)00150-4 (Pubitemid 34141154)
-
(2002)
Science and Technology of Advanced Materials
, vol.3
, Issue.1
, pp. 1-27
-
-
Murakami, M.1
-
16
-
-
35348906101
-
Ta/Ni/Ta multilayered ohmic contacts on n-type SiC
-
DOI 10.1016/j.apsusc.2007.06.022, PII S0169433207008148
-
H. Yang, T. H. Peng, W. J. Wang, D. F. Zhang, and X. L. Chen, Appl. Surf. Sci. 254, 527 (2007). 10.1016/j.apsusc.2007.06.022 (Pubitemid 47588463)
-
(2007)
Applied Surface Science
, vol.254
, Issue.2
, pp. 527-531
-
-
Yang, H.1
Peng, T.H.2
Wang, W.J.3
Zhang, D.F.4
Chen, X.L.5
-
17
-
-
21544483536
-
Formation and role of graphite and nickel silicide in nickel based ohmic contacts to n -type silicon carbide
-
DOI 10.1063/1.1872200, 083709
-
I. P. Nikitina, K. V. Vassilevski, N. G. Wright, A. B. Horsfall, A. G. O'Neill, and C. M. Johnson, J. Appl. Phys. 97, 083709 (2005). 10.1063/1.1872200 (Pubitemid 40920574)
-
(2005)
Journal of Applied Physics
, vol.97
, Issue.8
, pp. 1-7
-
-
Nikitina, I.P.1
Vassilevski, K.V.2
Wright, N.G.3
Horsfall, A.B.4
O'Neill, A.G.5
Johnson, C.M.6
-
18
-
-
0033753032
-
-
10.1016/S0038-1101(00)00056-3
-
S.-K. Lee, C.-M. Zetterling, M. Östling, J.-P. Palmquist, H. Högberg, and U. Jansson, Solid-State Electron. 44, 1179 (2000). 10.1016/S0038-1101(00)00056-3
-
(2000)
Solid-State Electron.
, vol.44
, pp. 1179
-
-
Lee, S.-K.1
Zetterling, C.-M.2
Östling, M.3
Palmquist, J.-P.4
Högberg, H.5
Jansson, U.6
-
19
-
-
0038160338
-
-
10.1007/s11664-003-0133-z
-
B. T. Lee, J. Y. Shin, S. H. Kim, J. H. Kim, S. Y. Han, and J. L. Lee, J. Electron. Mater. 32, 501 (2003). 10.1007/s11664-003-0133-z
-
(2003)
J. Electron. Mater.
, vol.32
, pp. 501
-
-
Lee, B.T.1
Shin, J.Y.2
Kim, S.H.3
Kim, J.H.4
Han, S.Y.5
Lee, J.L.6
-
20
-
-
0042229227
-
-
10.1016/S0038-1101(03)00165-5
-
W. Lu, W. C. Mitchel, G. R. Landis, T. R. Crenshaw, and W. Eugene Collins, Solid-State Electron. 47, 2001 (2003). 10.1016/S0038-1101(03)00165-5
-
(2003)
Solid-State Electron.
, vol.47
, pp. 2001
-
-
Lu, W.1
Mitchel, W.C.2
Landis, G.R.3
Crenshaw, T.R.4
Eugene Collins, W.5
-
21
-
-
50349092470
-
-
10.1007/s10854-007-9446-7
-
B. Barda, P. Macháč, M. Hubičková, and J. Náhlík, J. Mater. Sci.: Mater. Electron. 19, 1039 (2008). 10.1007/s10854-007-9446-7
-
(2008)
J. Mater. Sci.: Mater. Electron.
, vol.19
, pp. 1039
-
-
Barda, B.1
MacHáč, P.2
Hubičková, M.3
Náhlík, J.4
-
23
-
-
0035932328
-
Phase formation at rapid thermal annealing of Al/Ti/Ni ohmic contacts on 4H-SiC
-
DOI 10.1016/S0921-5107(00)00597-3, PII S0921510700005973
-
K. Vassilevski, K. Zekentes, K. Tsagaraki, G. Constantinidis, and I. Nikitina, Mater. Sci. Eng., B 80, 370 (2001). 10.1016/S0921-5107(00)00597-3 (Pubitemid 32334328)
-
(2001)
Materials Science and Engineering B: Solid-State Materials for Advanced Technology
, vol.80
, Issue.1-3
, pp. 370-373
-
-
Vassilevski, K.1
Zekentes, K.2
Tsagaraki, K.3
Constantinidis, G.4
Nikitina, I.5
-
24
-
-
0001166147
-
-
10.1063/1.108964
-
J. Crofton, P. A. Barnes, J. R. Williams, and J. A. Edmond, Appl. Phys. Lett. 62, 384 (1993). 10.1063/1.108964
-
(1993)
Appl. Phys. Lett.
, vol.62
, pp. 384
-
-
Crofton, J.1
Barnes, P.A.2
Williams, J.R.3
Edmond, J.A.4
-
25
-
-
0031272866
-
-
10.1016/S0038-1101(97)00168-8
-
J. Crofton, L. Beyer, J. R. Williams, E. D. Luckowski, S. E. Mohney, and J. M. Delucca, Solid-State Electron. 41, 1725 (1997). 10.1016/S0038-1101(97) 00168-8
-
(1997)
Solid-State Electron.
, vol.41
, pp. 1725
-
-
Crofton, J.1
Beyer, L.2
Williams, J.R.3
Luckowski, E.D.4
Mohney, S.E.5
Delucca, J.M.6
-
26
-
-
2942687826
-
-
10.1016/j.apsusc.2004.03.253
-
B. Veisz and B. Pécz, Appl. Surf. Sci. 233, 360 (2004). 10.1016/j.apsusc.2004.03.253
-
(2004)
Appl. Surf. Sci.
, vol.233
, pp. 360
-
-
Veisz, B.1
Pécz, B.2
-
27
-
-
0036568350
-
Morphological study of the Al-Ti ohmic contact to p-type SiC
-
DOI 10.1016/S0038-1101(01)00327-6, PII S0038110101003276
-
S. E. Mohney, B. A. Hull, J. Y. Lin, and J. Crofton, Solid-State Electron. 46, 689 (2002). 10.1016/S0038-1101(01)00327-6 (Pubitemid 34207609)
-
(2002)
Solid-State Electronics
, vol.46
, Issue.5
, pp. 689-693
-
-
Mohney, S.E.1
Hull, B.A.2
Lin, J.Y.3
Crofton, J.4
-
28
-
-
0036630880
-
-
10.2320/matertrans.43.1684
-
O. Nakatsuka, T. Takei, Y. Koide, and M. Murakami, Mater. Trans. 43, 1684 (2002). 10.2320/matertrans.43.1684
-
(2002)
Mater. Trans.
, vol.43
, pp. 1684
-
-
Nakatsuka, O.1
Takei, T.2
Koide, Y.3
Murakami, M.4
-
30
-
-
28044465437
-
Investigation of Au/Ti/Al ohmic contact to N-type 4H-SiC
-
DOI 10.1016/j.sse.2005.08.013, PII S0038110105002297
-
S.-C. Chang, S.-J. Wang, K.-M. Uang, and B.-W. Liou, Solid-State Electron. 49, 1937 (2005). 10.1016/j.sse.2005.08.013 (Pubitemid 41691053)
-
(2005)
Solid-State Electronics
, vol.49
, Issue.12
, pp. 1937-1941
-
-
Chang, S.-C.1
Wang, S.-J.2
Uang, K.-M.3
Liou, B.-W.4
-
32
-
-
2442648160
-
-
10.1007/s11664-004-0203-x
-
S. Tsukimoto, K. Nitta, T. Sakai, M. Moriyama, and M. Murakami, J. Electron. Mater. 33, 460 (2004). 10.1007/s11664-004-0203-x
-
(2004)
J. Electron. Mater.
, vol.33
, pp. 460
-
-
Tsukimoto, S.1
Nitta, K.2
Sakai, T.3
Moriyama, M.4
Murakami, M.5
-
34
-
-
60449106810
-
-
10.1103/PhysRevB.79.045318
-
Z. Wang, S. Tsukimoto, M. Saito, and Y. Ikuhara, Phys. Rev. B 79, 045318 (2009). 10.1103/PhysRevB.79.045318
-
(2009)
Phys. Rev. B
, vol.79
, pp. 045318
-
-
Wang, Z.1
Tsukimoto, S.2
Saito, M.3
Ikuhara, Y.4
-
35
-
-
19344362666
-
Direct sub-angstrom imaging of a crystal lattice
-
DOI 10.1126/science.1100965
-
P. D. Nellist, M. F. Chisholm, N. Dellby, O. L. Krivanek, M. F. Murfitt, Z. S. Szilagyi, A. R. Lupini, A. Borisevich, W. H. Sides, Jr., and S. J. Pennycook, Science 305, 1741 (2004). 10.1126/science.1100965 (Pubitemid 39249634)
-
(2004)
Science
, vol.305
, Issue.5691
, pp. 1741
-
-
Nellist, P.D.1
Chisholm, M.F.2
Dellby, N.3
Krivanek, O.L.4
Murfitt, M.F.5
Szilagyi, Z.S.6
Lupini, A.R.7
Borisevich, A.8
Sides Jr., W.H.9
Pennycook, S.J.10
-
36
-
-
0032560108
-
Electron microscopy image enhanced [7]
-
DOI 10.1038/33823
-
M. Haider, H. Rose, S. Uhlemann, B. Kabius, and K. Urban, Nature (London) 392, 768 (1998). 10.1038/33823 (Pubitemid 28225307)
-
(1998)
Nature
, vol.392
, Issue.6678
, pp. 768-769
-
-
Haider, M.1
Uhlemann, S.2
Schwan, E.3
Rose, G.4
Kabius, B.5
Urban, K.6
-
37
-
-
10044280330
-
Interface structure and atomic bonding characteristics in silicon nitride ceramics
-
DOI 10.1126/science.1104173
-
A. Ziegler, J. C. Idrobo, M. K. Cinibulk, C. Kisielowski, N. D. Browning, and R. O. Ritchie, Science 306, 1768 (2004). 10.1126/science.1104173 (Pubitemid 39601392)
-
(2004)
Science
, vol.306
, Issue.5702
, pp. 1768-1770
-
-
Ziegler, A.1
Idrobo, J.C.2
Cinibulk, M.K.3
Kisielowski, C.4
Browning, N.D.5
Ritchie, R.O.6
-
38
-
-
30844465764
-
Grain boundary strengthening in alumina by rare earth impurities
-
DOI 10.1126/science.1119839
-
J. P. Buban, K. Matsunaga, J. Chen, N. Shibata, W. Y. Ching, T. Yamamoto, and Y. Ikuhara, Science 311, 212 (2006). 10.1126/science.1119839 (Pubitemid 43108183)
-
(2006)
Science
, vol.311
, Issue.5758
, pp. 212-215
-
-
Buban, J.P.1
Matsunaga, K.2
Chen, J.3
Shibata, N.4
Ching, W.Y.5
Yamamoto, T.6
Ikuhara, Y.7
-
39
-
-
0346458533
-
The interface between silicon and a high-k oxide
-
DOI 10.1038/nature02204
-
C. J. Först, C. R. Ashman, K. Schwarz, and P. E. Blöchl, Nature (London) 427, 53 (2004). 10.1038/nature02204 (Pubitemid 38094817)
-
(2004)
Nature
, vol.427
, Issue.6969
, pp. 53-56
-
-
Forst, C.J.1
Ashman, C.R.2
Schwarz, K.3
Blochl, P.E.4
-
41
-
-
33646564981
-
Determination of interface atomic structure and its impact on spin transport using Z-contrast microscopy and density-functional theory
-
DOI 10.1103/PhysRevLett.96.196101
-
T. J. Zega, A. T. Hanbicki, S. C. Erwin, I. Žutić, G. Kioseoglou, C. H. Li, B. T. Jonker, and R. M. Stroud, Phys. Rev. Lett. 96, 196101 (2006). 10.1103/PhysRevLett.96.196101 (Pubitemid 43727882)
-
(2006)
Physical Review Letters
, vol.96
, Issue.19
, pp. 196101
-
-
Zega, T.J.1
Hanbicki, A.T.2
Erwin, S.C.3
Zutic, I.4
Kioseoglou, G.5
Li, C.H.6
Jonker, B.T.7
Stroud, R.M.8
-
42
-
-
0000248583
-
-
10.1103/PhysRevLett.84.3899
-
C. I. Carlisle, D. A. King, M. L. Bocquet, J. Cerda, and P. Sautet, Phys. Rev. Lett. 84, 3899 (2000). 10.1103/PhysRevLett.84.3899
-
(2000)
Phys. Rev. Lett.
, vol.84
, pp. 3899
-
-
Carlisle, C.I.1
King, D.A.2
Bocquet, M.L.3
Cerda, J.4
Sautet, P.5
-
43
-
-
33746968640
-
Microstructural relationships between compounds in the Ti-Si-C system
-
DOI 10.1016/j.scriptamat.2006.05.014, PII S1359646206003782
-
Z. J. Lin, M. J. Zhuo, Y. C. Zhou, M. S. Li, and J. Y. Wang, Scr. Mater. 55, 445 (2006). 10.1016/j.scriptamat.2006.05.014 (Pubitemid 44202275)
-
(2006)
Scripta Materialia
, vol.55
, Issue.5
, pp. 445-448
-
-
Lin, Z.J.1
Zhuo, M.J.2
Zhou, Y.C.3
Li, M.S.4
Wang, J.Y.5
-
44
-
-
0001089894
-
-
10.1103/PhysRevB.54.10257
-
C. Persson and U. Lindefelt, Phys. Rev. B 54, 10257 (1996). 10.1103/PhysRevB.54.10257
-
(1996)
Phys. Rev. B
, vol.54
, pp. 10257
-
-
Persson, C.1
Lindefelt, U.2
-
46
-
-
67650563007
-
-
10.2320/matertrans.MC200831
-
S. Tsukimoto, K. Ito, Z. Wang, M. Saito, Y. Ikuhara, and M. Murakami, Mater. Trans. 50, 1071 (2009). 10.2320/matertrans.MC200831
-
(2009)
Mater. Trans.
, vol.50
, pp. 1071
-
-
Tsukimoto, S.1
Ito, K.2
Wang, Z.3
Saito, M.4
Ikuhara, Y.5
Murakami, M.6
-
47
-
-
0036132255
-
Finding the optimum Al-Ti alloy composition for use as an ohmic contact to p-type SiC
-
DOI 10.1016/S0038-1101(01)00208-8, PII S0038110101002088
-
J. Crofton, S. E. Mohney, J. R. Williams, and T. Isaacs-Smith, Solid-State Electron. 46, 109 (2002). 10.1016/S0038-1101(01)00208-8 (Pubitemid 33126067)
-
(2002)
Solid-State Electronics
, vol.46
, Issue.1
, pp. 109-113
-
-
Crofton, J.1
Mohney, S.E.2
Williams, J.R.3
Isaacs-Smith, T.4
-
48
-
-
0024263925
-
Chemically sensitive structure-imaging with a scanning transmission electron microscope
-
DOI 10.1038/336565a0
-
S. J. Pennycook and L. A. Boatner, Nature (London) 336, 565 (1988). 10.1038/336565a0 (Pubitemid 19007313)
-
(1988)
Nature
, vol.336
, Issue.6199
, pp. 565-567
-
-
Pennycook, S.J.1
Boatner, L.A.2
-
50
-
-
12844286241
-
-
10.1103/PhysRevB.47.558
-
G. Kresse and J. Hafner, Phys. Rev. B 47, 558 (1993). 10.1103/PhysRevB.47.558
-
(1993)
Phys. Rev. B
, vol.47
, pp. 558
-
-
Kresse, G.1
Hafner, J.2
-
51
-
-
25744460922
-
-
10.1103/PhysRevB.50.17953
-
P. E. Blöchl, Phys. Rev. B 50, 17953 (1994). 10.1103/PhysRevB.50. 17953
-
(1994)
Phys. Rev. B
, vol.50
, pp. 17953
-
-
Blöchl, P.E.1
-
52
-
-
23244460838
-
-
10.1103/PhysRevB.46.6671
-
J. P. Perdew, J. A. Chevary, S. H. Vosko, K. A. Jackson, M. R. Pederson, D. J. Singh, and C. Fiolhais, Phys. Rev. B 46, 6671 (1992). 10.1103/PhysRevB.46. 6671
-
(1992)
Phys. Rev. B
, vol.46
, pp. 6671
-
-
Perdew, J.P.1
Chevary, J.A.2
Vosko, S.H.3
Jackson, K.A.4
Pederson, M.R.5
Singh, D.J.6
Fiolhais, C.7
-
55
-
-
11944256577
-
-
10.1103/RevModPhys.64.1045
-
M. C. Payne, M. P. Teter, D. C. Allan, T. A. Arias, and J. D. Joannopoulos, Rev. Mod. Phys. 64, 1045 (1992). 10.1103/RevModPhys.64.1045
-
(1992)
Rev. Mod. Phys.
, vol.64
, pp. 1045
-
-
Payne, M.C.1
Teter, M.P.2
Allan, D.C.3
Arias, T.A.4
Joannopoulos, J.D.5
-
56
-
-
34547564932
-
-
10.1103/PhysRev.56.340
-
R. P. Feynman, Phys. Rev. 56, 340 (1939). 10.1103/PhysRev.56.340
-
(1939)
Phys. Rev.
, vol.56
, pp. 340
-
-
Feynman, R.P.1
-
57
-
-
0037091644
-
-
10.1103/PhysRevB.65.165401
-
M. Brandbyge, J. Mozos, P. Ordejón, J. Taylor, and K. Stokbro, Phys. Rev. B 65, 165401 (2002). 10.1103/PhysRevB.65.165401
-
(2002)
Phys. Rev. B
, vol.65
, pp. 165401
-
-
Brandbyge, M.1
Mozos, J.2
Ordejón, P.3
Taylor, J.4
Stokbro, K.5
-
58
-
-
0037171091
-
The SIESTA method for ab initio order-N materials simulation
-
DOI 10.1088/0953-8984/14/11/302, PII S0953898402307379
-
J. M. Soler, E. Artacho, J. D. Gale, A. García, J. Junquera, P. Ordejón, and D. Sánchez-Portal, J. Phys.: Condens. Matter 14, 2745 (2002). 10.1088/0953-8984/14/11/302 (Pubitemid 34288362)
-
(2002)
Journal of Physics Condensed Matter
, vol.14
, Issue.11
, pp. 2745-2779
-
-
Soler, J.M.1
Artacho, E.2
Gale, J.D.3
Garcia, A.4
Junquera, J.5
Ordejon, P.6
Sanchez-Portal, D.7
-
59
-
-
34948827595
-
Nonequilibrium quantum transport properties of a silver atomic switch
-
DOI 10.1021/nl0711054
-
Z. Wang, T. Kadohira, T. Tada, and S. Watanabe, Nano Lett. 7, 2688 (2007). 10.1021/nl0711054 (Pubitemid 47522423)
-
(2007)
Nano Letters
, vol.7
, Issue.9
, pp. 2688-2692
-
-
Wang, Z.1
Kadohira, T.2
Tada, T.3
Watanabe, S.4
-
60
-
-
54149106160
-
-
10.1063/1.2963197
-
Z. Wang, T. Gu, T. Tada, and S. Watanabe, Appl. Phys. Lett. 93, 152106 (2008). 10.1063/1.2963197
-
(2008)
Appl. Phys. Lett.
, vol.93
, pp. 152106
-
-
Wang, Z.1
Gu, T.2
Tada, T.3
Watanabe, S.4
-
61
-
-
4243720937
-
-
10.1103/PhysRevB.63.245407
-
J. Taylor, H. Guo, and J. Wang, Phys. Rev. B 63, 245407 (2001). 10.1103/PhysRevB.63.245407
-
(2001)
Phys. Rev. B
, vol.63
, pp. 245407
-
-
Taylor, J.1
Guo, H.2
Wang, J.3
-
64
-
-
33745197988
-
-
10.1063/1.2213928
-
Th. Seyller, K. V. Emtsev, F. Speck, K.-Y. Gao, and L. Ley, Appl. Phys. Lett. 88, 242103 (2006). 10.1063/1.2213928
-
(2006)
Appl. Phys. Lett.
, vol.88
, pp. 242103
-
-
Seyller, Th.1
Emtsev, K.V.2
Speck, F.3
Gao, K.-Y.4
Ley, L.5
-
65
-
-
53149087407
-
-
10.1007/s11664-008-0525-1
-
K. Ito, T. Onishi, H. Takeda, K. Kohama, S. Tsukimoto, M. Konno, Y. Suzuki, and M. Murakami, J. Electron. Mater. 37, 1674 (2008). 10.1007/s11664-008-0525-1
-
(2008)
J. Electron. Mater.
, vol.37
, pp. 1674
-
-
Ito, K.1
Onishi, T.2
Takeda, H.3
Kohama, K.4
Tsukimoto, S.5
Konno, M.6
Suzuki, Y.7
Murakami, M.8
-
66
-
-
0036680669
-
Formation of low resistivity ohmic contacts to n-type 3C-SiC
-
DOI 10.1016/S0038-1101(02)00013-8, PII S0038110102000138
-
J. Wan, M. A. Capano, and M. R. Melloch, Solid-State Electron. 46, 1227 (2002). 10.1016/S0038-1101(02)00013-8 (Pubitemid 34657079)
-
(2002)
Solid-State Electronics
, vol.46
, Issue.8
, pp. 1227-1230
-
-
Wan, J.1
Capano, M.A.2
Melloch, M.R.3
-
67
-
-
0031515390
-
The Physics of Ohmic Contacts to SiC
-
DOI 10.1002/1521-3951(199707)202:1<581::AID-PSSB581>3.0.CO;2-M, Fundamental Questions and Applications of SiC (Part I)
-
J. Crofton, L. M. Porter, and J. R. Williams, Phys. Status Solidi B 202, 581 (1997). 10.1002/1521-3951(199707)202:1<581::AID-PSSB581>3.0.CO;2-M (Pubitemid 127092929)
-
(1997)
Physica Status Solidi (B) Basic Research
, vol.202
, Issue.1
, pp. 581-604
-
-
Crofton, J.1
Porter, L.M.2
Williams, J.R.3
-
68
-
-
28344451216
-
Ohmic contacts to silicon carbide determined by changes in the surface
-
DOI 10.1063/1.2106005, 161908
-
F. A. Mohammad, Y. Cao, and L. M. Porter, Appl. Phys. Lett. 87, 161908 (2005). 10.1063/1.2106005 (Pubitemid 41717050)
-
(2005)
Applied Physics Letters
, vol.87
, Issue.16
, pp. 1-3
-
-
Mohammad, F.A.1
Cao, Y.2
Porter, L.M.3
-
69
-
-
27144433237
-
-
10.1007/s11664-005-0255-6
-
S. Tsukimoto, T. Sakai, T. Ohishi, K. Ito, and M. Murakami, J. Electron. Mater. 34, 1310 (2005). 10.1007/s11664-005-0255-6
-
(2005)
J. Electron. Mater.
, vol.34
, pp. 1310
-
-
Tsukimoto, S.1
Sakai, T.2
Ohishi, T.3
Ito, K.4
Murakami, M.5
-
70
-
-
0037441125
-
-
10.1016/S0169-4332(02)01195-9
-
B. Pécz, L. Tóth, M. A. di Forte-Poisson, and J. Vacas, Appl. Surf. Sci. 206, 8 (2003). 10.1016/S0169-4332(02)01195-9
-
(2003)
Appl. Surf. Sci.
, vol.206
, pp. 8
-
-
Pécz, B.1
Tóth, L.2
Di Forte-Poisson, M.A.3
Vacas, J.4
-
71
-
-
0009934507
-
-
10.1016/S0921-5093(97)00002-6
-
J. C. Viala, N. Peillon, F. Bosselet, and J. Bouix, Mater. Sci. Eng., A 229, 95 (1997). 10.1016/S0921-5093(97)00002-6
-
(1997)
Mater. Sci. Eng., A
, vol.229
, pp. 95
-
-
Viala, J.C.1
Peillon, N.2
Bosselet, F.3
Bouix, J.4
-
72
-
-
34248587757
-
Analysis of Al/Ti, Al/Ni multiple and triple layer contacts to p-type 4H-SiC
-
DOI 10.1016/j.sse.2007.02.037, PII S0038110107000949
-
M. R. Jennings, A. Pérez-Tomás, M. Davies, D. Walker, L. Zhu, P. Losee, W. Huang, S. Balachandran, O. J. Guy, J. A. Covington, T. P. Chow, and P. A. Mawby, Solid-State Electron. 51, 797 (2007). 10.1016/j.sse.2007.02.037 (Pubitemid 46764373)
-
(2007)
Solid-State Electronics
, vol.51
, Issue.5
, pp. 797-801
-
-
Jennings, M.R.1
Perez-Tomas, A.2
Davies, M.3
Walker, D.4
Zhu, L.5
Losee, P.6
Huang, W.7
Balachandran, S.8
Guy, O.J.9
Covington, J.A.10
Chow, T.P.11
Mawby, P.A.12
-
73
-
-
34249041630
-
Role of interface layers and localized states in TiAl-based Ohmic contacts to p-type 4H-SiC
-
DOI 10.1007/s11664-006-0078-0
-
M. Gao, S. Tsukimoto, S. H. Goss, S. P. Tumakha, T. Onishi, M. Murakami, and L. J. Brillson, J. Electron. Mater. 36, 277 (2007). 10.1007/s11664-006-0078- 0 (Pubitemid 46782207)
-
(2007)
Journal of Electronic Materials
, vol.36
, Issue.4
, pp. 277-284
-
-
Gao, M.1
Tsukimoto, S.2
Goss, S.H.3
Tumakha, S.P.4
Onishi, T.5
Murakami, M.6
Brillson, L.J.7
-
75
-
-
0000217353
-
-
10.1103/PhysRevB.57.2647
-
A. Bauer, J. Kraublich, L. Dressler, P. Kuschnerus, J. Wolf, and K. Goetz, Phys. Rev. B 57, 2647 (1998). 10.1103/PhysRevB.57.2647
-
(1998)
Phys. Rev. B
, vol.57
, pp. 2647
-
-
Bauer, A.1
Kraublich, J.2
Dressler, L.3
Kuschnerus, P.4
Wolf, J.5
Goetz, K.6
-
77
-
-
0023421868
-
2
-
DOI 10.1016/0025-5408(87)90128-0
-
T. Goto and T. Hirai, Mater. Res. Bull. 22, 1195 (1987). 10.1016/0025-5408(87)90128-0 (Pubitemid 17652061)
-
(1987)
Materials Research Bulletin
, vol.22
, Issue.9
, pp. 1195-1201
-
-
Goto, T.1
Hirai, T.2
-
78
-
-
33748300556
-
Role of Pr segregation in acceptor-state formation at ZnO grain boundaries
-
DOI 10.1103/PhysRevLett.97.106802
-
Y. Sato, J. P. Buban, T. Mizoguchi, N. Shibata, M. Yodogawa, T. Yamamoto, and Y. Ikuhara, Phys. Rev. Lett. 97, 106802 (2006). 10.1103/PhysRevLett.97. 106802 (Pubitemid 44330968)
-
(2006)
Physical Review Letters
, vol.97
, Issue.10
, pp. 106802
-
-
Sato, Y.1
Buban, J.P.2
Mizoguchi, T.3
Shibata, N.4
Yodogawa, M.5
Yamamoto, T.6
Ikuhara, Y.7
-
79
-
-
33646871263
-
NiAl (110) Cr (110) interface: A density functional theory study
-
DOI 10.1103/PhysRevB.73.205421
-
W. Liu, J. C. Li, W. T. Zheng, and Q. Jiang, Phys. Rev. B 73, 205421 (2006). 10.1103/PhysRevB.73.205421 (Pubitemid 43782062)
-
(2006)
Physical Review B - Condensed Matter and Materials Physics
, vol.73
, Issue.20
, pp. 205421
-
-
Liu, W.1
Li, J.C.2
Zheng, W.T.3
Jiang, Q.4
-
81
-
-
38049095543
-
-
10.1063/1.2814245
-
Z. Wang, T. Gu, T. Kadohira, T. Tada, and S. Watanabe, J. Chem. Phys. 128, 014704 (2008). 10.1063/1.2814245
-
(2008)
J. Chem. Phys.
, vol.128
, pp. 014704
-
-
Wang, Z.1
Gu, T.2
Kadohira, T.3
Tada, T.4
Watanabe, S.5
-
82
-
-
0034514156
-
3
-
DOI 10.1016/S1359-6454(00)00226-3
-
J. R. Smith and W. Zhang, Acta Mater. 48, 4395 (2000). 10.1016/S1359-6454(00)00226-3 (Pubitemid 32029833)
-
(2000)
Acta Materialia
, vol.48
, Issue.18-19
, pp. 4395-4403
-
-
Smith, J.R.1
Zhang, W.2
-
85
-
-
0035893986
-
-
10.1103/PhysRevB.64.235312
-
G. Profeta, A. Blasetti, S. Picozzi, and A. Continenza, Phys. Rev. B 64, 235312 (2001). 10.1103/PhysRevB.64.235312
-
(2001)
Phys. Rev. B
, vol.64
, pp. 235312
-
-
Profeta, G.1
Blasetti, A.2
Picozzi, S.3
Continenza, A.4
-
86
-
-
33846268073
-
First-principles calculations of Schottky barrier heights of monolayer metal/6H-SiC{0001} interfaces
-
DOI 10.2320/matertrans.47.2690
-
S. Tanaka, T. Tamura, K. Okazaki, S. Ishibashi, and M. Kohyama, Mater. Trans. 47, 2690 (2006). 10.2320/matertrans.47.2690 (Pubitemid 46114641)
-
(2006)
Materials Transactions
, vol.47
, Issue.11
, pp. 2690-2695
-
-
Tanaka, S.1
Tamura, T.2
Okazaki, K.3
Ishibashi, S.4
Kohyama, M.5
-
87
-
-
0001061183
-
-
10.1103/PhysRevB.61.2672
-
M. Kohyama and J. Hoekstra, Phys. Rev. B 61, 2672 (2000). 10.1103/PhysRevB.61.2672
-
(2000)
Phys. Rev. B
, vol.61
, pp. 2672
-
-
Kohyama, M.1
Hoekstra, J.2
-
88
-
-
4143059756
-
-
10.1103/PhysRevLett.63.1168
-
G. P. Das, P. Blöchl, O. K. Andersen, N. E. Christensen, and O. Gunnarsson, Phys. Rev. Lett. 63, 1168 (1989). 10.1103/PhysRevLett.63.1168
-
(1989)
Phys. Rev. Lett.
, vol.63
, pp. 1168
-
-
Das, G.P.1
Blöchl, P.2
Andersen, O.K.3
Christensen, N.E.4
Gunnarsson, O.5
-
90
-
-
0035894198
-
-
10.1103/PhysRevB.64.235308
-
S. Tanaka and M. Kohyama, Phys. Rev. B 64, 235308 (2001). 10.1103/PhysRevB.64.235308
-
(2001)
Phys. Rev. B
, vol.64
, pp. 235308
-
-
Tanaka, S.1
Kohyama, M.2
-
91
-
-
0000590516
-
-
10.1103/PhysRevB.57.2334
-
J. Hoekstra and M. Kohyama, Phys. Rev. B 57, 2334 (1998). 10.1103/PhysRevB.57.2334
-
(1998)
Phys. Rev. B
, vol.57
, pp. 2334
-
-
Hoekstra, J.1
Kohyama, M.2
-
92
-
-
33645926701
-
-
10.1016/j.msea.2006.01.007
-
W. Y. Ching, Y.-N. Xu, P. Rulis, and L. Ouyang, Mater. Sci. Eng., A 422, 147 (2006). 10.1016/j.msea.2006.01.007
-
(2006)
Mater. Sci. Eng., A
, vol.422
, pp. 147
-
-
Ching, W.Y.1
Xu, Y.-N.2
Rulis, P.3
Ouyang, L.4
-
93
-
-
42749103080
-
-
10.1103/PhysRevB.69.144108
-
J.-Y. Wang and Y.-C. Zhou, Phys. Rev. B 69, 144108 (2004). 10.1103/PhysRevB.69.144108
-
(2004)
Phys. Rev. B
, vol.69
, pp. 144108
-
-
Wang, J.-Y.1
Zhou, Y.-C.2
-
94
-
-
67649464349
-
-
10.1063/1.3158615
-
Z. Wang, S. Tsukimoto, M. Saito, and Y. Ikuhara, Appl. Phys. Lett. 94, 252103 (2009). 10.1063/1.3158615
-
(2009)
Appl. Phys. Lett.
, vol.94
, pp. 252103
-
-
Wang, Z.1
Tsukimoto, S.2
Saito, M.3
Ikuhara, Y.4
-
96
-
-
18844470023
-
-
10.4028/www.scientific.net/MSF.338-342.1009
-
L. Kassamakova, R. Kakanakov, I. Kassamakov, N. Nordell, S. Savage, E. Svedberg, and L. Madsen, Mater. Sci. Forum 338-342, 1009 (2000). 10.4028/www.scientific.net/MSF.338-342.1009
-
(2000)
Mater. Sci. Forum
, vol.338-342
, pp. 1009
-
-
Kassamakova, L.1
Kakanakov, R.2
Kassamakov, I.3
Nordell, N.4
Savage, S.5
Svedberg, E.6
Madsen, L.7
-
98
-
-
44849139088
-
-
10.1063/1.2938862
-
S. Li, R. Ahuja, M. W. Barsoum, P. Jena, and B. Johansson, Appl. Phys. Lett. 92, 221907 (2008). 10.1063/1.2938862
-
(2008)
Appl. Phys. Lett.
, vol.92
, pp. 221907
-
-
Li, S.1
Ahuja, R.2
Barsoum, M.W.3
Jena, P.4
Johansson, B.5
-
99
-
-
0037348917
-
-
10.1149/1.1540066
-
W. Lu, W. C. Mitchel, C. A. Thronton, W. E. Collins, G. R. Landis, and S. R. Smith, J. Electrochem. Soc. 150, G177 (2003). 10.1149/1.1540066
-
(2003)
J. Electrochem. Soc.
, vol.150
, pp. 177
-
-
Lu, W.1
Mitchel, W.C.2
Thronton, C.A.3
Collins, W.E.4
Landis, G.R.5
Smith, S.R.6
-
100
-
-
54949155133
-
-
10.1126/science.1165044
-
N. Shibata, A. Goto, S.-Y. Choi, T. Mizoguchi, S. D. Findlay, T. Yamamoto, and Y. Ikuhara, Science 322, 570 (2008). 10.1126/science.1165044
-
(2008)
Science
, vol.322
, pp. 570
-
-
Shibata, N.1
Goto, A.2
Choi, S.-Y.3
Mizoguchi, T.4
Findlay, S.D.5
Yamamoto, T.6
Ikuhara, Y.7
-
101
-
-
69249202282
-
-
10.1038/nmat2486
-
N. Shibata, S. D. Findlay, S. Azuma, T. Mizoguchi, T. Yamamoto, and Y. Ikuhara, Nature Mater. 8, 654 (2009). 10.1038/nmat2486
-
(2009)
Nature Mater.
, vol.8
, pp. 654
-
-
Shibata, N.1
Findlay, S.D.2
Azuma, S.3
Mizoguchi, T.4
Yamamoto, T.5
Ikuhara, Y.6
-
102
-
-
70350116344
-
-
10.2320/matertrans.M2009147
-
J. Wang, T. Liu, and Z. Wang, Mater. Trans. 50, 2115 (2009). 10.2320/matertrans.M2009147
-
(2009)
Mater. Trans.
, vol.50
, pp. 2115
-
-
Wang, J.1
Liu, T.2
Wang, Z.3
-
103
-
-
57649083549
-
-
10.1143/APEX.1.081201
-
M. Okude, A. Ohtomo, T. Kita, and M. Kawasaki, Appl. Phys. Express 1, 081201 (2008). 10.1143/APEX.1.081201
-
(2008)
Appl. Phys. Express
, vol.1
, pp. 081201
-
-
Okude, M.1
Ohtomo, A.2
Kita, T.3
Kawasaki, M.4
|