Atomic-scale imaging of individual dopant atoms in a buried interface

Nature Materials

Volumn 8, Issue 8, 2009, Pages 654-658

  Shibata, N ^a,b   Findlay, S D ^a   Azuma, S ^a   Mizoguchi, T ^a   Yamamoto, T ^a,c   Ikuhara, Y ^a,c,d  

^a UNIVERSITY OF TOKYO   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c JAPAN FINE CERAMICS CENTER   (Japan)

^d TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ATOMS; CHARACTERIZATION; CRYSTALLINE MATERIALS; DOPING (ADDITIVES); GRAIN BOUNDARIES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INTERFACES (MATERIALS); SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM;

ABERRATION-CORRECTED; ATOMIC SCALE IMAGING; CONVENTIONAL APPROACH; CRYSTALLINE INTERFACES; FOCUSED ELECTRON BEAMS; FUNCTIONAL PROPERTIES; HIGH ANGLE GRAIN BOUNDARIES; INTERFACIAL PROPERTY;

CRYSTAL ATOMIC STRUCTURE;

EID: 69249202282     PISSN: 14761122     EISSN: 14764660     Source Type: Journal    
DOI: 10.1038/nmat2486     Document Type: Article

References (25)

1. Hammerl, G. et al. Enhanced supercurrent density in polycrystalline YBa2Cu3O7- at 77 K from calcium doping of grain boundaries. Nature 407, 162-164 (2000).
2. Sorba, L. et al. Tuning AlAs-GaAs band discontinuities and the role of Si-induced local interface dipoles. Phys. Rev. B. 43, 2450-2453 (1991).
3. Shibata, N. et al. Observation of rare-earth segregation in silicon nitride ceramics at subnanometre dimensions. Nature 428, 730-733 (2004).
4. Buban, J. P. et al. Grain boundary strengthening in alumina by rare earth impurities. Science 311, 212-215 (2006).
5. Sato, Y. et al. Role of Pr segregation in acceptor-state formation at ZnO grain boundaries. Phys. Rev. Lett. 97, 106802 (2006).
6. Luzzi, D. E., Yan, M., .ob, M. & Vitek, V. Atomic structure of a grain boundary in a metallic alloy: Combined electron microscope and theoretical study. Phys. Rev. Lett. 67, 1894-1897 (1991).
7. Muller, D. A. & Mills, M. J. Electron microscopy: Probing the atomic structure and chemistry of grain boundaries, interfaces and defects. Mater. Sci. Eng. A 260, 12-28 (1999).
8. Williams, D. B. & Carter, C. B. Transmission Electron Microscopy: A Text Book for Materials Science. Imaging III (Plenum, 1996).
9. Pennycook, S. J. & Jesson, D. E. High-resolution Z-contrast imaging of crystals. Ultramicroscopy 37, 14-38 (1991).
10. Voyles, P. M. et al. Atomic-scale imaging of individual dopant atoms and clusters in highly n-type bulk Si. Nature 416, 826-829 (2002).
11. Chisholm, M. F., Maiti, A., Pennycook, S. J. & Pantelides, S. T. Atomic configurations and energetics of arsenic impurities in a silicon grain boundary. Phys. Rev. Lett. 81, 132-135 (1998).
12. Yan, Y. et al. Impurity-induced structural transformation of a MgO grain boundary. Phys. Rev. Lett. 81, 3675-3678 (1998).
13. Winkelman, G. B. et al. Three-dimensional organization of rare-earth atoms at grain boundaries in silicon nitride. Appl. Phys. Lett. 87, 061911 (2005).
14. Xin, H. L., Intaraprasonk, V. & Muller, D. A. Depth sectioning of individual dopant atoms with aberration-corrected scanning transmission electron microscopy. Appl. Phys. Lett. 92, 013125 (2008).
15. van Benthem, K. et al. Three-dimensional imaging of individual hafnium atoms inside a semiconductor device. Appl. Phys. Lett. 87, 034104 (2005).
16. Matsunaga, K. et al. Direct measurements of grain boundary sliding in yttrium-doped alumina bicrystals. Appl. Phys. Lett. 82, 1179-1181 (2003).
17. Fabris, S. & Elsässer, C. 6 13 (1014) twin in --Al2O3V A model for a general grain boundary. Phys. Rev. B 64, 245117 (2001).
18. Sutton, A. P. & Balluffi, R. W. Interfaces in Crystalline Materials (Oxford Univ. Press, 1995).
19. Allen, L. J., Findlay, S. D., Oxley, M. P. & Rossouw, C. J. Ultramicroscopy 96, 47-63 (2003).
20. Nakamura, K. et al. First-principles study of grain boundary sliding in --Al2O3. Phys. Rev. B 75, 184109 (2007).
21. Höche, T. et al. The structure of special grain boundaries in --Al2O3. J. Phys. Chem. Solids 55, 1067-1082 (1994).
22. Borisevich, A. Y., Lupini, A. R. & Pennycook, S. J. Depth sectioning with the aberration-corrected scanning transmission electron microscope. Proc. Natl Acad. Sci. USA 103, 3044-3048 (2006).
23. Haider, M. et al. Prerequisites for a Cc=Cs- corrected ultrahigh-resolution TEM. Ultramicroscopy 108, 167-178 (2008).
24. Krivanek, O. L. et al. An electron microscope for the aberration-corrected era. Ultramicroscopy 108, 179-195 (2008).
25. Kirfel, A. & Eichhorn, K. Accurate structure analysis with synchrotron radiation. The electron density in Al2O3 and Cu2O. Acta Crystallogr. A 46, 271-284 (1990).