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Volumn 306, Issue 5702, 2004, Pages 1768-1770
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Interface structure and atomic bonding characteristics in silicon nitride ceramics
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL BONDS;
IMAGE PROCESSING;
INTERFACES (MATERIALS);
MECHANICAL PROPERTIES;
OPTICAL RESOLVING POWER;
OXYGEN;
SILICON NITRIDE;
ATOM SIZE;
ATOMIC BONDING;
INTERFACE STRUCTURE;
INTERGRANULAR PHASE;
CERAMIC MATERIALS;
SILICON NITRIDE;
CERAMICS;
ARTICLE;
ATOMIC PARTICLE;
CERAMICS;
CHEMICAL BOND;
ELECTRONICS;
PARTICLE SIZE;
PRIORITY JOURNAL;
SCANNING ELECTRON MICROSCOPY;
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EID: 10044280330
PISSN: 00368075
EISSN: None
Source Type: Journal
DOI: 10.1126/science.1104173 Document Type: Article |
Times cited : (218)
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References (27)
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