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Volumn 44, Issue 2, 2000, Pages 277-301

SiC and GaN bipolar power devices

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR SEMICONDUCTOR DEVICES; CARRIER CONCENTRATION; ELECTRIC BREAKDOWN; SEMICONDUCTING GALLIUM COMPOUNDS; SEMICONDUCTOR DEVICE STRUCTURES; SILICON CARBIDE; THERMAL CONDUCTIVITY;

EID: 0034140780     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(99)00235-X     Document Type: Article
Times cited : (87)

References (92)
  • 4
    • 0024749835 scopus 로고
    • Power semiconductor device figure of merit for high frequency applications
    • Baliga B.J. Power semiconductor device figure of merit for high frequency applications. IEEE Electron Device Lett. 10:1989;455-457.
    • (1989) IEEE Electron Device Lett. , vol.10 , pp. 455-457
    • Baliga, B.J.1
  • 5
    • 21344498986 scopus 로고
    • Examination of semiconductors for bipolar power devices
    • Bhalla A., Chow T.P. Examination of semiconductors for bipolar power devices. Inst. Phys. Conf. Ser. 137:1994;621.
    • (1994) Inst. Phys. Conf. Ser. , vol.137 , pp. 621
    • Bhalla, A.1    Chow, T.P.2
  • 7
    • 0028485013 scopus 로고
    • Wide bandgap compound semiconductors for superior high-voltage power devices
    • Chow T.P., Tyagi R. Wide bandgap compound semiconductors for superior high-voltage power devices. IEEE Trans. Electron Devices. 41:1994;1481-1482.
    • (1994) IEEE Trans. Electron Devices , vol.41 , pp. 1481-1482
    • Chow, T.P.1    Tyagi, R.2
  • 8
    • 0013415216 scopus 로고
    • Room-temperature avalanche breakdown voltages of p-n junctions made of Si, Ge, SiC, GaAs, GaP, and InP
    • Kyuregyan A.S., Yurkov S.N. Room-temperature avalanche breakdown voltages of p-n junctions made of Si, Ge, SiC, GaAs, GaP, and InP. Sov. Phys. Semicond. 23:1989;1126-1131.
    • (1989) Sov. Phys. Semicond. , vol.23 , pp. 1126-1131
    • Kyuregyan, A.S.1    Yurkov, S.N.2
  • 11
    • 0001695018 scopus 로고
    • Calculation of avalanche breakdown of silicon p-n junctions
    • Fulop W. Calculation of avalanche breakdown of silicon p-n junctions. Solid-State Electronics. 10:1967;39-43.
    • (1967) Solid-State Electronics , vol.10 , pp. 39-43
    • Fulop, W.1
  • 14
    • 0030409789 scopus 로고    scopus 로고
    • Theoretical prediction of zinc blende phase GaN avalanche photodiode performance based on numerically calculated electron and hole impact ionization rate ratio
    • Kolnik J., Oguzman I.H., Brennan K.F., Wang R., Ruden P.P. Theoretical prediction of zinc blende phase GaN avalanche photodiode performance based on numerically calculated electron and hole impact ionization rate ratio. Mat. Res. Soc. Symp. Proc. 423:1996;45-50.
    • (1996) Mat. Res. Soc. Symp. Proc. , vol.423 , pp. 45-50
    • Kolnik, J.1    Oguzman, I.H.2    Brennan, K.F.3    Wang, R.4    Ruden, P.P.5
  • 18
    • 0031102997 scopus 로고    scopus 로고
    • Positive temperature coefficient of breakdown voltage in 4H-SiC pn junction rectifiers
    • Neudeck P., Fazi C. Positive temperature coefficient of breakdown voltage in 4H-SiC pn junction rectifiers. IEEE Electron Device Letters. 18:1997;96-98.
    • (1997) IEEE Electron Device Letters , vol.18 , pp. 96-98
    • Neudeck, P.1    Fazi, C.2
  • 19
    • 0020748561 scopus 로고
    • Schottky diodes with high breakdown voltages
    • Wilamowski B.M. Schottky diodes with high breakdown voltages. Solid-State Electronics. 26:1983;491-493.
    • (1983) Solid-State Electronics , vol.26 , pp. 491-493
    • Wilamowski, B.M.1
  • 20
    • 0021439721 scopus 로고
    • The pinch rectifier: A low forward drop, high speed power diode
    • Baliga B.J. The pinch rectifier: a low forward drop, high speed power diode. Electron Device Letters. 5:1984;194-196.
    • (1984) Electron Device Letters , vol.5 , pp. 194-196
    • Baliga, B.J.1
  • 21
    • 0023545034 scopus 로고
    • The merged p-i-n/Schottky (MPS) rectifier: A high-voltage, high-speed power diode
    • Baliga BJ, Chang H-R. The merged p-i-n/Schottky (MPS) rectifier: a high-voltage, high-speed power diode. IEEE IEDM Tech Dig 658-61, 1987.
    • (1987) IEEE IEDM Tech Dig , pp. 658-661
    • Baliga, B.J.1    Chang, H.-R.2
  • 22
    • 0011723639 scopus 로고
    • Trench MOS barrier Schottky (TMBS) rectifier
    • Mehrotra M., Baliga B.J. Trench MOS barrier Schottky (TMBS) rectifier. Solid-State Electronics. 38:1995;703-713.
    • (1995) Solid-State Electronics , vol.38 , pp. 703-713
    • Mehrotra, M.1    Baliga, B.J.2
  • 24
    • 5544260832 scopus 로고
    • Planar, high voltage, boron implanted 6H-SiC p-n junction diodes
    • Shenoy P.M., Baliga B.J. Planar, high voltage, boron implanted 6H-SiC p-n junction diodes. Inst. Phys. Conf. Ser. 142:1995;717-720.
    • (1995) Inst. Phys. Conf. Ser. , vol.142 , pp. 717-720
    • Shenoy, P.M.1    Baliga, B.J.2
  • 28
    • 0031270854 scopus 로고    scopus 로고
    • Planar aluminum-implanted 1400 V 4H silicon carbide p-n diodes with low on resistance
    • Peters D., Schorner R., Holzlein K.-H., Friedrichs P. Planar aluminum-implanted 1400 V 4H silicon carbide p-n diodes with low on resistance. Appl. Phys. Lett. 71:1997;2996-2997.
    • (1997) Appl. Phys. Lett. , vol.71 , pp. 2996-2997
    • Peters, D.1    Schorner, R.2    Holzlein, K.-H.3    Friedrichs, P.4
  • 39
    • 0040365673 scopus 로고
    • Current due to recombination via multilevel centers in the space charge layer of a p-n structure
    • Evstropov V.V., Kiselev K.V., Petrovich I.L., Tsarenkov B.V. Current due to recombination via multilevel centers in the space charge layer of a p-n structure. Sov. Phys. Semicond. 18:1984;1156-1159.
    • (1984) Sov. Phys. Semicond. , vol.18 , pp. 1156-1159
    • Evstropov, V.V.1    Kiselev, K.V.2    Petrovich, I.L.3    Tsarenkov, B.V.4
  • 44
    • 0038497151 scopus 로고
    • Space-charge-limited currents in single-crystal silicon carbide
    • Ozarow V., Hysell R.E. Space-charge-limited currents in single-crystal silicon carbide. J. Appl. Phys. 33:1962;3013-3015.
    • (1962) J. Appl. Phys. , vol.33 , pp. 3013-3015
    • Ozarow, V.1    Hysell, R.E.2
  • 45
    • 0037820847 scopus 로고
    • Structure and characteristics of silicon carbide light emitting diodes
    • Patrick L. Structure and characteristics of silicon carbide light emitting diodes. J. Appl. Phys. 28:1957;765-776.
    • (1957) J. Appl. Phys. , vol.28 , pp. 765-776
    • Patrick, L.1
  • 61
    • 0030110518 scopus 로고    scopus 로고
    • A high-current and high-temperature 6H-SiC thyristor
    • Xie K., Zhao J.H. A high-current and high-temperature 6H-SiC thyristor. IEEE Electron Device Letters. 17:1996;142-144.
    • (1996) IEEE Electron Device Letters , vol.17 , pp. 142-144
    • Xie, K.1    Zhao, J.H.2
  • 68
    • 0031675653 scopus 로고    scopus 로고
    • Coimplantation effects on the electrical properties of boron and aluminum acceptors in 4H-SiC
    • Itoh H, Troffer T, Pensl G. Coimplantation effects on the electrical properties of boron and aluminum acceptors in 4H-SiC. Materials Science Forum, vol. 264-8, pt. 2, 1998. p. 685-8.
    • (1998) Materials Science Forum , vol.2648 , pp. 685-688
    • Itoh, H.1    Troffer, T.2    Pensl, G.3
  • 69
    • 21544453299 scopus 로고    scopus 로고
    • Comparison of the annealing behavior of high-dose nitrogen-, aluminum-, and boron-implanted 4H-SiC
    • Seshadri S., Eldridge G.W., Agarwal A.K. Comparison of the annealing behavior of high-dose nitrogen-, aluminum-, and boron-implanted 4H-SiC. Appl. Phys. Lett. 72:1998;2026-2028.
    • (1998) Appl. Phys. Lett. , vol.72 , pp. 2026-2028
    • Seshadri, S.1    Eldridge, G.W.2    Agarwal, A.K.3
  • 71
    • 84992270617 scopus 로고    scopus 로고
    • Cree Research, Inc, Durham, NC, USA
    • Cree Research, Inc, Durham, NC, USA.
  • 72
    • 84992227864 scopus 로고    scopus 로고
    • Nichia Chemical Industries, Tokushima, Japan
    • Nichia Chemical Industries, Tokushima, Japan.
  • 73
    • 84992228735 scopus 로고    scopus 로고
    • APA Optics, Inc, Blaine, MN, USA
    • APA Optics, Inc, Blaine, MN, USA.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.