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Volumn 149, Issue 1, 2002, Pages

Physics of copper in silicon

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; DIFFUSION; ELECTROSTATICS; FERMI LEVEL; MASS SPECTROMETRY; NUCLEATION; PARAMAGNETIC RESONANCE; PRECIPITATION (CHEMICAL); SILICON;

EID: 0036222999     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1421348     Document Type: Review
Times cited : (374)

References (208)
  • 77
    • 0008856595 scopus 로고    scopus 로고
    • Ph.D. Thesis, University of Köln, Germany
    • (2000)
    • Flink, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.