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Physica B: Condensed Matter

Volumn 273-274, Issue , 1999, Pages 424-428

Copper-related defects in silicon

(1) Estreicher, Stefan K a

a TEXAS TECH UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; CRYSTAL DEFECTS; PRECIPITATION (CHEMICAL);

HARTREE-FOCK LEVELS;

SEMICONDUCTING SILICON;

EID: 0033345582 PISSN: 09214526 EISSN: None Source Type: Journal
DOI: 10.1016/S0921-4526(99)00496-2 Document Type: Article

Times cited : (7)

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