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Volumn 63-64, Issue , 1998, Pages 301-310

Minority carrier transient spectroscopy of copper-silicide and nickel-disilicide precipitates in silicon

Author keywords

DLTS; Extended defects; MCTS; Quasi Fermi Level

Indexed keywords

CAPACITANCE; CHARGE CARRIERS; COPPER COMPOUNDS; DEEP LEVEL TRANSIENT SPECTROSCOPY; FERMI LEVEL; NICKEL COMPOUNDS;

EID: 4243942106     PISSN: 10120394     EISSN: None     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/ssp.63-64.301     Document Type: Article
Times cited : (7)

References (13)
  • 8
    • 84902960824 scopus 로고
    • Ph.Thesis, Goettingen
    • F.Riedel, Ph.Thesis, Goettingen ,1994
    • (1994)
    • Riedel, F.1
  • 12
    • 84981870503 scopus 로고
    • T.Figielski, Phys.Stat.Solidi, 6 (1964), p.429, and 9, (1965), p.555
    • (1965) Phys.Stat.Solidi , vol.9 , pp. 555


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.