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Applied Physics A: Materials Science and Processing
Volumn 66, Issue 2, 1998, Pages 123-136
Electrical properties and recombination activity of copper, nickel and cobalt in silicon
Author keywords

[No Author keywords available]
Indexed keywords

BAND STRUCTURE; CHARGE CARRIERS; COBALT; COPPER; CRYSTAL DEFECTS; DIFFUSION IN SOLIDS; ELECTRIC PROPERTIES; NICKEL; PRECIPITATION (CHEMICAL); SILICON SOLAR CELLS; SOLUBILITY;
EID: 0031998838     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390050649     Document Type: Article
Times cited : (275)
References (276)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.