Atomic spectrometry update-X-ray fluorescence spectrometry

Journal of Analytical Atomic Spectrometry

Volumn 12, Issue 11, 1997, Pages

  Ellis, Andrew T ^a   Potts, Philip J ^b,e   Holmes, Michael ^c   Olivers, Graham J ^c   Streli, Christina ^d   Wobrauschek, Peter ^d  

^a OXFORD INSTRUMENTS PLASMA TECHNOLOGY   (United Kingdom)

^b AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

^c British Ceramic Research Association   (United Kingdom)

^d TU WIEN   (Austria)

^e OPEN UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; FLUORESCENCE; INDUSTRIAL APPLICATIONS; OPTICS; SPECTROMETERS; SPECTRUM ANALYSIS; X RAYS;

CLINICAL APPLICATION; MATRIX CORRECTION; X RAY FLUORESCENCE SPECTROMETRY; X RAY OPTICS;

SPECTROMETRY;

EID: 0031273366     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review

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136. Lepy, M.-C., Ban, G., Beck, L., Dhez, P., Plagnard, J., Stemmler, P. (Comissariat Energie Atomique, Lab. Primaire Rayonnements Ionisants, France). Presented at European Conference on Energy-dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
137. Alves, L. C., Jesus, A. P., Reis, M. A., Nucl. Instrum. Methods Phys. Res., Sect. B, 1996, 109-, 110, 129.
138. Inagaki, Y., KEK Rep., 1996(95-17, Study of the Mass of the Electron Neutrino in Japan), 43.
139. Papp, T., Campbell, J. L., Nucl. Instrum. Methods Phys. Res., Sect. B, 1996, 114(3-4), 225.
140. Rousseau, R. M., Willis, J. P., Duncan, A. R., X-Ray Spectrom., 1996, 25, 179.
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142. Bosch Reig, F., Gimeno Adelantado, J. V., Peris Martinez, V., Yusa Marco, D. J., Bosch Mossi, F., Domenech Carbo, M. T., Spectrochim. Acta, Part B, 1996, 51(6), 569.
143. Bao, S. X., X-Ray Spectrom., 1997, 26, 23.
144. Wolf, S. J., X-Ray Spectrom., 1997, 26, 85.
145. Couture, R. A., Dymek, R. F., Am. Mineral., 1996, 81(5-6), 639.
146. Gruffat, J. J., J. Phys. IV, 1996, 6(C4, Rayons X et Matiere), C4/635.
147. Finkelshtein, A. L., Afonin, V. P., X-Ray Spectrom., 1996, 25, 210.
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153. Steiner, E., Spectra Anal., 1996, 25(188), 24.
154. Luo, L., Guo, C., Ma, G., Ji, A., X-Ray Spectrom., 1997, 26, 15.
155. Dane, A. D., Timmermans, P. A. M., van Sprang, H. A., Buydens, L. M. C., Anal. Chem., 1996, 68(14), 2419.
156. Kerur, B. R., Thontadarya, S. R., Hanumaiah, B., X-Ray Spectrom., 1997, 2, 45.
157. Goergl, R., Wobrauschek, P., Streli, Ch., Aiginger, H., Benedikt, M., J. Trace Microprobe Tech., 1996, 14(3, Micro- and Ultratrace X-Ray Fluorescence Analysis), 589.
158. Mainardi, R. T., Barrea, R. A., X-Ray Spectrom., 1996, 25, 190.
159. Coetzee, P. P., Oosthuizen, N., Fresenius' J. Anal. Chem., 1996, 355(1), 83.
160. Rao, D. V., Cesareo, R., Gigante. G. E., X-Ray Spectrom., 1996, 25(2), 74.
161. Rao, D. V., Cesareo, R., Gigante, G. E., Appl. Phys. A: Mater. Sci. Process., 1996, A62(4), 381.
162. Rao, D. V., Cesareo, R., Gigante, G. E., Can. J. Phys., 1996, 74(5-6), 230.
163. Rao, D. V., Cesareo, R., Gigante, G. E., Nucl. Instrum. Methods Phys. Res., Sect. A, 1996, 108(3), 227.
164. Rao, D. V., Cesareo, R., Gigante, G. E., Appl. Radiat. Isot., 1996, 47(2), 219.
165. Rao, D. V., Cesareo, R., Gigante, G. E., Phys. Scr., 1996, 54(4), 362.
166. Rao, D. V., Cesareo, R., Gigante, G. E., Phys. Scr., 1996, 53(3), 332.
167. Sharma, J. K., Singh, N., Mittal, R., Sood, B. S., Allawadhi, K. L., X-Ray Spectrom., 1996, 25, 239.
168. Rao, et al., Phys. Ret. A, 1993, 22, 401.
169. Allawadhi, K. L., Sood, B. S., Mittal, R., Singh, N., Sharma, J. K., X-Ray Spectrom., 1996, 25, 233.
170. Mittal, R., Sood, B. S., Allawadhi, K. L., Radiat. Phys. Chem., 1996, 48(1), 1.
171. Puri, S., Mehta, D., Singh, N., Trehan, P. N., Phys. Rev. A: At., Mol. Opt. Phys., 1996, 54(1), 617.
172. Horakeri, L. D., Hanumaiah, B., Thontadarya, S. R., X-Ray Spectrom., 1997, 26, 69.
173. Török, I., Papp, T., Palinkas, J., Budnar, M., Muehleisen, A., Kawai, J., Campbell, J. L., Nucl. Instrum. Methods Phys. Res., Sect. B, 1996, 114(1-2), 9.
174. Ertugrul, M., Z. Phys. D: At., Mol. Clusters, 1996, 38(2), 91.
175. Ertugrul, M., Simsek, O., Dogan, O., Turgut, U., J. Radioanal. Nucl. Chem., 1996, 213(1), 37.
176. Ertugrul, M., Nucl. Instrum. Methods Phys. Res., Sect. B, 1996, 119(3), 345.
177. Ertugrul, M., Tirasoglu, E., Kurucu, Y., Erzeneoglu, S., Sahin, Y., Durak, R., Nucl. Instrum. Methods Phys. Res., Sect. B, 1996, 108(1-2), 18-22.
178. Newbury, D. E., Proc. SPIE-Int. Soc. Opt. Eng., 1995, 2640, 22.
179. Stabenow, R., Haase, A., (Anal. X-ray Systems, Rich. Seifert and Co., 22926 Ahrensburg, Germany). Presented at 45th Annual Denver X-ray Conference, Denver, CO, USA, Aug 3 1996.
180. Kanngieber, B., Beckhoff, B., Malzer, W., Arkadiev, V. A., Bjeoumikhov, A. A., Gorny, H.-E. (Dept. Phys., Univ. Bremen, 28334 Bremen, Germany). Presented at 45th Annual Denver X-ray Conference, Denver, CO, USA, Aug 3 1996.
181. Beckhoff, B., Kanngiesser, B., Malzer, W., Proc. SPIE-Int. Soc. Opt. Eng., 1996, 2859, 190.
182. Seely, J. F., Kowalski, M. P., Hunter, W. R., Gutman, G., Appl. Opt., 1996, 35(22), 4408.
183. Montcalm, C., Kearney, P. A., Slaughter, J. M., Sullivan, B. T., Chaker, M., Pepin, H., Falco, C. M, Appl. Opt., 1996, 35(25), 5134.
184. Boscolo, A., Poletto, L., Tondello, G., Proc. SPIE-Int. Soc. Opt. Eng., 1996, 2805(Multilayer and Grazing Incidence X-ray/EUV Optics III), 260.
185. Kunz, C., Voss, J., Fresenius' J. Anal Chem., 1995, 353(5-8), 494.
186. Cheburkin, A. K., Shotyk, W., Fresenius' J. Anal. Chem., 1996, 354(5-6), 688.
187. Ogawa, K., Jpn. Kokai Tokkyo Koho JP 08,247,971 [96,247,971] (Cl. G01N23/223), 27 Sep 1996, Appl. 95/51,654, 13 Mar 1995; 6 pp.
188. Tamura, K., U.S. US 5,541,973 (Cl. 378-45; G01N23/223), 30 Jul 1996, JP Appl. 94/65,308, 1 Apr 1994; 8 pp.
189. Zhu, J., Le, A., Gu, Y., Faming Zhuanli Shenqing Gongkai Shuomingshu CN 1,110,405 (Cl. G01N23/223), 18 Oct 1995, Appl. 94,112,117, 12 Apr 1994: 16pp.
190. Rindby, A., (Dept. Phys., Chalmers Univ. Technol./Univ. Goeteborg, 412 96 Goeteborg, Sweden). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
191. Rindby, A., Voglis, P., Attaelmanan, A., X-Ray Spectrom., 1996, 25(1), 39.
192. Vekemans, B., Janssens, K., Vincze, L., Adams, F., Hertogen, J. (Dept. Chem., Univ. Antwerp, 2610 Antwerp, Belgium). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
193. Lu, R.-r., Le, A.-q., Gu, Y.-m., Wu, G.-d., Zhu, J.-q., Nucl. Instrum. Methods Phys. Res., Sect. B, 1995, 104(1-4), 595.
194. Jambers, W., Van Grieken, R., Anal. Eur., 1996, 25.
195. Adams, F., Adriaens, A., Aerts, A., De Raedt, I., Janssens, K., Schalm, O., J. Anal. At. Spectrom., 1997, 12(3), 257.
196. Hoover, R.B., Doty, F.P. (eds.). Hard X-ray/gamma ray and neutron optics, sensors and applications, The International Society for Optical Engineering, Bellingham, WA, USA, vol. 2859.
197. Kumakhov, M. A., Proc. SPIE-Int. Soc. Opt. Eng., 1996, 2859, 116.
198. Arkadiev, V. A., Bzhaumikhov, A. A., Proc. SPIE-Int. Soc. Opt. Eng., 1996, 2859, 131.
199. Nakazawa, H., Bunseki, 1996(11), 927.
200. Wedell, R., Phys. Bl., 1996, 52(11), 1134.
201. Arkadiev, V. A., Bzhaumikhov, A. A., Gorny, H.-E., Langhoff, N., Schmalz, J., Proc. SPIE-Int. Soc. Opt. Eng., 1996, 2859(Hard X-Ray/Gamma-Ray and Neutron Optics, Sensors, and Applications), 220.
202. Arkadiev, V. A., Beckhoff, B., Bzhaumikhov, A. A., Gorny, H.-E., Kanngiesser, Proc. SPIE-Int. Soc. Opt. Eng., 1996, 2859, 123.
203. Wang, L., Rath, B. K., Gibson, W. M., Kimball, J. C., MacDonald, C. A., Proc. SPIE-Int. Soc. Opt. Eng., 1996, 2859(Hard X-Ray/Gamma-Ray and Neutron Optics, Sensors, and Applications), 170.
204. Wang, L., Rath, B. K., Gibson, W. M., Kimball, J. C., MacDonald, C. A., J. Appl. Phys., 1996, 80(7), 3628.
205. Franco, E. D., Ryon, R. W., Vincze, L., Janssens, K., (ARACOR, Sunnyvale, CA 94086, USA). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
206. Vince, et al., X-ray Spectrom., 1995, 24, 27.
207. Janssens, K., Vekemans, B., Vincze, L., Adams, F., Rindby, A., Spectrochim. Acta, Part B, 1996, 51B(13), 1661.
208. Yamamoto, N., Rev. Sci. Instrum., 1996, 67(9), 3051.
209. Arkadiev, V. A., Bjeoumikhov, A. A., Gorny, H. E., Schiekel, M., Wedell, R., J. Trace Microprobe Tech., 1996, 14(1), 131.
210. Scherbakov, A. S., Nikitina, S. V., Ibraimov, N. S., Proc. SPIE-Int. Soc. Opt. Eng., 1996, 2859, 242.
211. Downing, R. G., Gibson, W. M., MacDonald, C. A., Proc. SPIE-Int. Soc. Opt. Eng., 1996, 2859, 150.
212. Nikitin, A. N., Ibraimov, N. S., Nikitina, S. V., Proc. SPIE-Int. Soc. Opt. Eng., 1996, 2859, 263.
213. Ding, X., Liang, W., Yan, Y., Hejishu, 1996, 19(3), 164.
214. Arkadiev, V. A., Bzhaumikhov, A. A., Proc. SPIE-Int. Soc. Opt. Eng., 1996, 2859(Hard X-Ray/Gamma-Ray and Neutron Optics, Sensors, and Applications), 162.
215. Havrilla, G. J., Carpenter, D. A. (Los Alamos Natl. Lab., Los Alamos, NM 87545, USA). Presented at FACSS XXIII, Kansas City, MO, USA, September 29-October 4, 1996.
216. Gao, N., Ponomarev, I., Xiao, Q. F., Gibson, W. M., Carpenter, D. A., Proc. SPIE-Int. Soc. Opt. Eng., 1996, 2859, 140.
217. Gao, N., Ponomarev, I. Yu., Xiao, Q. F., Gibson, W. M., Carpenter, D. A., Appl. Phys. Lett., 1996, 69(11), 1529.
218. Kuczumow, A., Larsson, S., Rindby, A., X-Ray Spectrom., 1996, 25, 147.
219. Holynska, B., Najman, J., Ostachowicz, B., Ostachowicz, J., Trabska, J., Wegrzynek, D., J. Trace Microprobe Tech., 1996, 14(1), 119.
220. Owens, S. M., Ullrich, J. B., Ponomarev, I. Yu., Carter, D. C., Sisk, R. C., Ho, J. X., Gibson, W. M., Proc. SPIE-Int. Soc. Opt. Eng., 1996, 2859(Hard X-Ray/Gamma-Ray and Neutron Optics, Sensors, and Applications), 200.
221. Janssens, K., Vekemans, B., Adams, F., van Espen, P., Mutsaers, P., Nucl. Instrum. Methods Phys. Res., Sect. B, 1996, 109-110, 179.
222. Janssens, K., Aerts, A., Deraedt, I., Vekemans, B., Vincze, L., Adams, F. (Dept. Chem., Univ. Antwerp, 2610 Antwerp, Belgium). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29. 1996.
223. Pahl, R., Bilderback, D. H., Proc. SPIE-Int. Soc. Opt. Eng., 1996, 2805(Multilayer and Grazing Incidence X-ray/EUV Optics III), 202.
224. Vincze, L., Janssens, K., Engstroem, P., Rindby, A., Larsson, S. (Dept. Chem., Univ. Antwerp, Antwerp, Belgium). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
225. Iida, A., Hirano, K., Nucl. Instrum. Methods Phys. Res., Sect. B, 1996, 114(1-2), 149.
226. Chevallier, P., Dhez, P., Legrand, F., Erko, A., Agafonov, Yu., Panchenko, L. A., Yakshin, A., J. Trace Microprobe Tech., 1996, 14(3, Micro- and Ultratrace X-Ray Fluorescence Analysis), 517.
227. Chevallier, P., Dhez, P., Erko, A., Firsov, A., Legrand, F., Populus, P., Nucl. Instrum. Methods Phys. Res., Sect. B, 1996, 113(1-4, Accelerators in Applied Research and Technology), 122.
228. Erko, A., Schaefers, F., Gudat, W., Abrosimov, N. V., Rossolenko, S. N., Alex, V., Groth, S., Schroeder, W., Nucl. Instrum. Methods Phys. Res., Sect. A, 1996, 374(3), 408.
229. Verbeni, R., Sette, F., Krisch, M. H., Bergmann, U., Gorges, B., Halcoussis, C., Martel, K., Masciovecchio, C., Ribois, J. F. et al., J. Synchrotron Radiat., 1996, 3(2), 62.
230. Hyakawa, S., Gohshi, Y., X-sen Bunseki no Shinpo, 1996, 27, 21.
231. Haller, M., Knoechel, A., J. Trace Microprobe Tech., 1996, 14(3, Micro- and Ultratrace X-Ray Fluorescence Analysis), 461.
232. Lechtenberg, F., Garbe, S., Bauch, J., Dingwell, D. B., Freitag, J., Haller, M., Hansteen, T. H., Ippach, P., Knoechel, A., J. Trace Microprobe Tech., 1996, 14(3, Micro- and Ultratrace X-Ray Fluorescence Analysis), 561.
233. Janssens, K. (Univ. Antwerpen, Antwerpen, Netherlands). Presented at Analytica 96, Munich, Germany, April 23-26, 1996.
234. Saisho, H., Gohshi, Y., Applications of synchrotron radiation to materials analysis. Analytical Spectroscopy Library, Elsevier Science, Amsterdam, Netherlands, 1996, 0 444 88857 8, 512.
235. Hayakawa, S., Gohshi, Y., Anal. Spectrosc. Libr., 1996, 7(Applications of Synchrotron Radiation to Materials Analysis), 171.
236. Saisho, H., Hashimoto, H., Anal. Spectrosc. Libr., 1996, 7(Applications of Synchrotron Radiation to Materials Analysis), 79.
237. Fernandez, J. E., J. Trace Microprobe Tech., 1996, 14(3, Micro-and Ultratrace X-Ray Fluorescence Analysis), 489.
238. Shao, H. R., Xu, Q., Nucl. Instrum. Methods Phys. Res., Sect. B, 1995, B104(1-4), 201.
239. Manceau, A., Boisset, M.-C., Sarret, G., Hazemann, J.-L., Mench, M., Cambier, P., Prost, R., Environ. Sci. Technol., 1996, 30(5), 1540.
240. Trounova, V. A., Bobrov, V. A., Zolotarev, K. V., Pampura, V. D., X-Ray Spectrom., 1996, 25(2), 55.
241. Figueiredo, M. O., Basto, M. J., Ramos, M. T., Melo, Z., Chevallier, P. (Centro Crist. Mineralogica, 1000 Lisboa, Portugal). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
242. Schulze, D. G., McCay-Buis, T., Sutton, S. R., Huber, D. M., Phytopathology, 1995, 85(9), 990.
243. Maroney, M. J., Gu, Z., Choudhury, S. B., Allan, C. B., (Univ. Massachusetts, Amherst, MA 01003, USA). Presented at 4th International Symposium on Metal Ions in Biology + Medicine, Barcelona, Spain, May 19-22, 1996.
244. Anderson, P., Dowker, S. E. P., Elliott, J. C., Thomas, C. R., J. Trace Microprobe Tech., 1996, 14(3, Micro- and Ultratrace X-ray Fluorescence Analysis), 541.
245. Kwiatek, W. M., Drewniak, T., Lekka, M., Wajdowicz, A., Nucl. Instrum. Methods Phys. Res., Sect. B, 1996, 109-110, 284.
246. Homma-Takeda, S., Ishido, M., Kumagai, Y., Takeneka, Y., Shimojo, N., (Dept. Environ. Med., Inst. Community Med., Univ. Tsukuba, Ibaraki 305, Japan). Presented at 4th International Symposium on Metal Ions in Biology+ Medicine, Barcelona, Spain, May 19-22, 1996.
247. Clausen, B. S., (Haldor Topsoe Res. Lab., Lyngby, Germany). Presented at Analytica 96, Munich, Germany, April 23-26, 1996.
248. Fay, M. J., Proctor, A., Hoffmann, D. P., Houalla, M., Hercules, D. M., Mikrochim. Acta, 1996, 122(3-4), 311.
249. Janssens, K., Aerts, A., Vincze, L., Adams, F., Yang, C., Utui, R., Malmqvist, K., Jones, K. W., Radtke, M., et al., Nucl. Instrum. Methods Phys. Res., Sect. B, 1996, 109-110, 690.
250. Mommsen, H., Beier, Th., Dittmann, H., Heimermann, D., Hein, A., Rosenberg, A., Boghardt, M., Hanebutt-Benz, E.-M., Halbey, H., Archaeometry, 1996, 38(2), 347.
251. Wegrzynek, D., Holynska, B., (Fac. Phys. and Nuclear Tech., Univ. Mining and Metallurgy, 30 059 Krakow, Poland). Presented at 6th Conference on TXRF, Edinhoven and Dortmund, Germany, 10 June 1996.
252. de Boer, D. K. G., Phys. Rev. B: Condens. Matter, 1996, 53(10), 6048.
253. Ino, S., J. Phys. Soc. Jpn., 1996, 65(10), 3248.
254. Sakurai, K., SR Kagaku Gijutsu Joho, 1996, 6(2), 2.
255. Brunel, M., J. Phys. IV, 1996, 6(C4, Rayons X et Matiere), C4/321.
256. Kump, P., Necemer, M., Veber, M. (J. Stefan Inst., 1001 Ljubljana, Slovenia). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
257. Prange, A., Knoth, J., Schneider, H., Schwenke, H. (GKSS-Res. Center, P.O. Box 1160, D-21494, Geesthacht, Germany). Presented at International Schools and Conference on X-ray Analytical Methods, Sydney, Australia, January 18-25, 1996.
258. Prange, A., Knoth, J., Schneider, H., Schwenke, H. (GKSS-Res. Center, P.O. Box 1160, D-21494, Geesthacht, Germany). Presented at 6th Conference on TXRF, Eindhoven and Dortmund, Germany.
259. Cheburkin, A. K., Shotyk, W., X-Ray Spectrom., 1996, 25, 175.
260. Schwenke, H., Knoth, J., Guenther, R., Wiener, G., Bormann, R., Mater. Res. Soc. Symp. Proc., 1996, 405(Surface/Interface and Stress Effects in Electronic Material Nanostructures), 407.
261. Guenther, R., Wiener, G., Knoth, J., Schwenke, H., Bormann, R., Rev. Sci. Instrum., 1996, 67(6), 2332.
262. Dudchik Y. I., Komarov, F. F., Konstantinov, Y. A., Proc. SPIE-Int. Soc. Opt. Eng., 1996, 2859, 298.
263. Pettersson, R. P., Boman, J., Nucl. Instrum. Methods Phys. Res., Sect. A, 1996, A371(3), 553.
264. Torboli, A., Lab. 2000, 1995, 9(7), 48.
265. Tamura, T., Nakano, A., Ogata, K., Suenaga, K., Jpn. Kokai Tokkyo Koho JP 08,184,572 [96,184,572] (Cl. GOIN23/08), 16 Jul 1996, Appl. 95/12, 4 Jan 1995; 6 pp.
266. Terada, S., Jpn. Kokai Tokkyo Koho JP 08,136,479 [96,136,479] (Cl. G01N23/223), 31 May 1996, Appl. 94/273,976, 8 Nov 1994; 5 pp.
267. Serebryakov, A. S., Shirokoborod, O. Y., Blyakher, E. V., PCT Int. App. WO 96 37,770 (Cl. G01N23/223), 28 Nov 1996, US Appl. 452,408, 26 May 1995; 51 pp.
268. Pianetta, P. (Stanford Synchrotron Radiation Lab., Stanford, USA). Presented at 45th Annual Denver X-ray Conference, Denver, CO, USA, Aug 3 1996.
269. Fischer-Colbrie, A. (Hewlett-Packard Lab., Palo Alto, USA). Presented at 6th Conference on TXRF, Edinhoven and Dortmund, Germany, 10 June 1996.
270. Garbe, S., Wobrauschek, P., Knoechel, A. (Materials Dept., Riso Natl. Lab., 4000 Roskilde, Denmark). Presented at 45th Annual Denver X-ray Conference, Denver, CO, USA, Aug 3 1996.
271. Goergl, R., Kregsamer, P., Streli, C., Wobrauschek, P., Aiginger, H. (Atominstitut Oesterreichischen Univ., 1020 Wien, Austria). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
272. Streli, C., Wobrauschek, P., Bauer, V., Goergl, R., Kregsamer, P., Pianetta, P., Ryon, R. (Atominstitut Oesterreichischen Univ., 1020 Wien, Austria). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
273. Wobrauschek, P., Kregsamer, P., Goergl, R., Streli, C., Pahlke, S., Fabry, L., Garbe, S., Haller, M., Knoechel, A., Radtke, M. (Atominstitut Oesterreichischen Univ., 1020 Wien, Austria). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
274. Yoshitaka, N., Suemoto, H., Jpn. Kokai Tokkyo Koho JP 08,159,935 [96,159,935](C1. G01N1/28), 21 Jun 1996, Appl. 94/307,256, 12 Dec 1994; 5 pp.
275. Pan, J. X., Wu, Y. R., Xiao, Y. A., Chao, Z. Y., Hong, R., Liu, Y. W., Wu, Q., Guangpuxue Yu Guangpu Fenxi, 1996, 16(4), 75.
276. Laderman, S. S., Fischer-Colbrie, A., Shimazaki, A., Miyazaki, K., Brennan, S., Takaura, N., Pianetta, P., Kortright, J. B., Silicon wafer trace impurity analysis using synchrotron radiation. Semicond. Charact., [Int. Workshop], AIP Press, Woodbury, NY, USA, 1996, 273-277.
277. Klockenkämper, R., von Bohlen, A., X-Ray Spectrum., 1996, 25, 156.
278. Klockenkämper, R. (Inst. Spektrochem. und Angewandte Spektroskopie, 44139 Dortmund, Germany). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
279. Van Grieken, R. (Dept. Chem., Univ. Antwerp (UIA), 2610 Antwerp, Belgium). Presented at 6th Conference on TXRF, Edinhoven and Dortmund, Germany, 10 June 1996.
280. Valkovic, V., Dargie, M., Jaksic, M., Markowicz, A., Tajani, A., Valkovic, O., Nucl. Instrum. Methods Phys. Res., Sect. B, 1996, 113(1-4), 363.
281. Ebert, M., Dahmen, J., Ortner, H. M., Hoffmann, P., GIT Fachz. Lab., 1996, 40(10), 982.
282. Holynska, B., Ostachowicz, B., Wegrzynek, D., Spectrochim. Acta, Part B, 1996, 51, 769.
283. Barreiros, M. A., Carvalho, M. L., Costa, M. M., Marques, M. I., Ramos, M. T. (Dpto. Fisica, Fac. Ciencias, Univ. Lisboa, 1699 Lisboa Codex, Portugal). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
284. Pasti, F., Torboli, A., Zanetti, C., Ugazio, G. (Ital Structures, 38066 Riva del Garda TN, Italy). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
285. Kump, P., Necemer, M., Snajder, J., Spectrochim. Acta, Part B, 1996, 51(5), 499.
286. Holynska, B. (Fac. Phys. and Nuclear Tech., Univ. Mining and Metallurgy, 30-059 Krakow, Poland). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
287. von Czarnowski, D., Denkhaus, E., Lemke, K. (Dept. Instrumental Anal. Chem., Gerhard-Mercator Univ. Duisburg, Duisburg, Germany). Presented at 6th Conference on TXRF, Eindhoven and Dortmund, Germany, 10 June 1996.
288. Lahatra Razafindramisa, F., Andriambololona, R., Brunel, M., van Grieken, R., J. Phys. IV, 1996, 6(C4, Rayons X et Matiere), C4/833.
289. Viksna, A., Selin, E., J. Trace Microprobe Tech., 1996, 14(4), 763.
290. Pasti, F., Torboli, A., Zanetti, C., Marchi, M., J. Phys. IV, 1996, 6(C4, Rayons X et Matiere), C4/627.
291. Bredendiek-Kamper, S., von Bohlen, A., Klockenkämper, R., Quentmeier, A., Klockow, D., J. Anal. At. Spectrom., 1996, 11(8), 537.
292. Gohshi, Y. (Dept. Applied Chem., Univ. Tokyo, Tokyo, Japan). Presented at European Conference on Energy-dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
293. Gohshi, Y. (Dept. Appl. Chem., Fac. Eng., Univ. Tokyo, Japan). Presented at International Schools and Conference on X-Ray Analytical Methods, Sydney, Australia, January 18-25, 1996.
294. Fabry, L., Pahlke, S., Kotz, L., X-sen Bunseki no Shinpo, 1996, 27, 345.
295. Fabry, L., Pahlke, S., Kotz, L., (Burghausen, Germany). Presented at Analytica 96, Munich, Germany, April 23-26, 1996.
296. Fabry, L., Pahlke, S., Kotz, L., Fresenius' J. Anal. Chem., 1996, 354(3), 266.
297. Diebold, A. C., J. Vac. Sci. Technol., A, 1996, 14(3, Pt. 2), 1919.
298. Carney, G. F., Briehl, B., Lu, S., Anderson, T. A., Evans, K. L., Proc.-Inst. Environ. Sci., 1996, 42nd(Contamination Control; Symposium on Minienvironments, 1996), 152.
299. Frost, M. R., Harrington, W. L., Downey, D. F., Walther, S. R., J. Vac. Sci. Technol., B, 1996, 14(1), 329.
300. Lavoie, M. A., Adams, E. D., Miles, G. L., J. Vac. Sci. Technol., A, 1996, 14(3, Pt. 2), 1924.
301. Sanchez, H. J., Perez, C. A., Perez, R. D., Rubio, M., Radiat. Phys. Chem., 1996, 48(3), 325.
302. Leenaers, A. J. G., de Boer, D. K. G., Spectrosc. Eur., 1996, 8(5), 14.
303. Claes, M., Van Grieken, R., (Dept. Chem., Univ. Antwerp, 2610 Antwerpen, Belgium). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
304. de Bokx, P. K., Kok, C., Bailleul, A., Wiener, G., Urbach, H. P. (Philips Res. Lab., 5656 AA Eindhoven, Netherlands). Presented at 6th Conference on TXRF, Eindhoven and Dortmund, Germany, 10 June 1996.
305. Shibata, N., Okubo, S., Yonemitsu, K., Appl. Surf. Sci., 1996, 100-101 (Proceedings of the 13th International Vacuum Congress and the 9th International Conference on solid surfaces. 1995), 69.
306. Tsuji, K., Wagatsuma, K., Jpn. J. Appl. Phys., Part 2, 1996, 35(11B), L 1535.
307. Tsuji, K., Hirokawa, K., Appl. Surf. Sci., 1996, 103(4), 451.
308. Tsuji, K., Hirokawa, K., Surf. Interface Anal., 1996, 24(4), 286.
309. van Kan, J. A., Vis, R. D., Nucl. Instrum. Methods Phys. Res., Sect. B, 1996, 113(1-4), 373.
310. Kaimoto, A., Jpn. Kokai Tokkyo Koho JP 07,280,753 [95,280,753] (Cl. G01N23/225), 27 Oct 1995, Appl. 94/67,295, 5 Apr 1994; 4 pp.
311. Martino, L. S., Wrobel, J., Cho, E., Sandier, J., Hydrocarbon Contam. Soils, 1995, 5, 77.
312. Schneider, J. F., Hahn, L. M., Lee, J. K., Bohm, A. (Argonne Natl. Lab., Argonne, IL 60439, USA). Presented at Pittsburgh Conference (PITTCON '96), Chicago, IL, USA, March 3-8, 1996.
313. Hewitt, A. D., Rapid screening of metals using portable high-resolution X-ray fluorescence spectrometers, Report, AD-A299293, 1996, 20pp.
314. Castellano, A., Cesareo, R., Marabelli, M. (Dipt. Sci. Materiali, Univ. Lecce, Lecce, Italy). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
315. Brubaker, K. L., O'Neill, H. J., Rueda, J., Schneider, J. F., Zimmerman, R. E. (Centre Environ. Restoration Systems, Argonne Natl. Lab., Argonne, IL 60439, USA). Presented at Pittsburgh Conference (PITTCON '96), Chicago, IL, USA, March 3-8, 1996.
316. Dost, A. A., Ann. Occup. Hyg., 1996, 40(5), 589.
317. Yokhin, B. (Jordan Valley AR Inc., Israel). Presented at Pittsburgh Conference (PITTCON '96), Chicago, IL, USA, March 3-8, 1997.
318. Cesareo, R., Gigante, G. E., Castellano, A., Rosales, M. A., Aliphat, M., De La Fuente, F., Meitin, J. J., Mendoza, A., Iwanczyk, J. S., Pantazis, J. A., J. Trace Microprobe Tech., 1996, 14(4), 711.
319. Janssens, K., Balis, A., Van Hour, N., Leland, D. (Dept. Chem., Univ. Antwerp, 2600 Antwerp, Belgium). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
320. Cesareo, R., Gigante, G. E., Canegallo, P., Castellano, A., Iwanczyk, J. S., Dabrowski, A., Nucl. Instrum. Methods Phys. Res., Sect. A, 1996, 380(1,2), 440.
321. Cesareo, R., Gigante, G. E. (Ist. Matematica e Fisica, Univ. Sassari, Sassari, Italy). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
322. Potts, P. J., Webb, P. C., Williams-Thorpe, O. (Dept. Earth Sci., Open Univ., Milton Keynes, UK MK7 6AA). Presented at Eighth Biennial National Atomic Spectroscopy Symposium, Univ.East Anglia, UK, July 17-19, 1996.
323. Duane, M. J., Facchetti, S., Pigozzi, G., Sci. Total Environ., 1996, 177(1-3), 195.
324. Ding, C., Zou, E., Chen, Z., Sun, Z., Yu, B., Kuangye (Beijing), 1996, 5(2), 82.
325. Warren, P. L. (Wilton Res. Centre, ICI, Middlesbrough, UK TS90 8JE). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
326. So, J. C., Kim, B. E., Kim, M. K., RIST Yongu Nonmun, 1996, 10(3), 329.
327. Hasegawa, K., Kato, H., Hosei Daigaku Ion Bimu Kogaku Kenkyusho Hokoku, 1994, 15, 16.
328. Watson, J. S., X-Ray Spectrom., 1996, 25, 173.
329. Hilbig, M., Michaelsen, M., Ger. Offen. DE 4,428,920 (Cl. G01N23/223), 22 Feb 1996, Appl. 4,428,920, 16 Aug 1994; 4 pp.
330. Inoe, M., Kono, H., Kurosaki, K., Jpn. Kokai Tokkyo Koho JP 07,311,131 [95,311,131] (Cl. G01N1/36), 28 Nov 1995, Appl. 94/128,132, 17 May 1994; 5 pp.
331. Kawauchi, A., Ishida, M., Saitoh, I., Spectrosc. Lett., 1996, 29(6), 979.
332. Kimura, J., Yamada, Y., Ganko, 1996, 91(2), 62.
333. Sulkowski, M., Sulkowski, M., Hirner, A. V., X-Ray Spectrom., 1996, 25(2), 83.
334. Masi, A. N., Olsina, R. A., X-Ray Spectrom., 1996, 25, 221.
335. Liu, Q. H., Chen, Y. P., Guangpuxue Yu Guangpu Fenxi, 1995, 15(6), 99.
336. Logunova, S. A., Lobanov, F. I., Markin, V. A., Zavod. Lab., 1996, 62(9), 24.
337. Etoubleau, J., Cambon, P., Fouquet, Y., Henry, K., Moal, S., J. Phys. IV, 1996, 6(C4, Rayons X et Matiere), C4/843.
338. Khuder, A., Maslov, L. P., Kutvitskii, V. A., Vysokochist. Veshchestva, 1996(1), 121.
339. de Carvalho, M. S., Massena Ferreira, E. M., Mantovano, J. L. (Inst. Engenharia Nucl., Brazil). Presented at Pittsburgh Conference (PITTCON '96), Chicago, IL, USA, March 3-8, 1996.
340. Stix, J., Gorton, M. P., Fontaine, E., Geostand. Newsl., 1996, 20(1), 87.
341. Enzweiler, J., Webb, P. C., Chem. Geol., 1996, 130, 195.
342. Borkhodoev, V. Ya., J. Anal. Chem. (Engl. Transl.), 1996, 51(2), 209.
343. Borkhodoev, V. Ya, Zh. Anal Khim., 1996, 51(2), 226.
344. Kimura, J., Yoshida, T., Ishikawa, K., Ganko, 1996, 91(3), 102.
345. Morrison, J. L., Richardson, J. M., Geostand. Newsl., 1996, 20(1), 65.
346. Srivastava, S. C., Bhaisare, S. R., Wagh, D. N., Iyer, C. P. S., Bull. Mater. Sci., 1996, 19(2), 331.
347. Park, Y. J., Kim, J. S., Choi, K. S., Suh, M. Y., Anal. Sci. Technol., 1996, 9(1), 20.
348. Vazquez, C., de Leyt, D., Custo, G., An. Asoc. Quim. Argent., 1995, 83(3-4), 109.
349. Zhao, D. Z., Mei, Y. F., Geostand. Newsl., 1996, 20(1), 41.
350. Wang, C. S., Yan, M. C., Zhang, W. H., Chi, Q. H., Gu, T. X., Geostand. Newsl., 1996, 20(1), 57.
351. Thompson, M., Potts, P. J., Webb, P. C., Geostand, Newsl., 1996, 20(2), 295.
352. Fatoki, O. S., Landsberger, S.. Int. J. Environ. Stud., 1996, 50(2), 139.
353. Morgenstern, P., Seidel. H., Soil Environ., 1995, 5(Contaminated Soil 95, Vol. 1), 529.
354. Watts, K. D., Gehrke, R. J., Radioact. Radiochem., 1996, 7, 28.
355. Engel, B., Lalor, G. C., Vutchkov, M. K., Environ. Geochem. Health, 1996, 18(3), 105.
356. Johnson, A. H. M., Lalor, G. C., Preston, J., Robotham, H., Thompson, C., Vutchkov, M. K., Environ. Geochem. Health, 1996, 18(3), 113.
357. Somogyi, A., Braun, M., (Isotope Lab., Kossuth Univ., 4010 Debrecen, Hungary). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
358. Pyle, S. M., Nocerino, J. M., Deming, S. N., Palasota, J. A., Palasota, J. M., Miller, E. L., Hillman, D. C., Kuharic, C. A., Cole, W. H., Fitzpatrick, P. M., Watson, M. A., Nichols, K. D., Environ. Sci. Technol., 1996, 30(1), 204.
359. Wang, E. Y., Willis, R. D., Buckley, T. J., Rhoads, G. G., Lioy, P. J., Appl. Occup. Environ. Hyg., 1996, 11(3), 199.
360. Bhat, C. K., Bhat, C. L., Lodha, G. S., Koul, D. K., Environ. Monit. Assess., 1996, 41(1), 77.
361. Haupt, O., Schaefer, C., Strauss, S., Dannecker, W., Fresenius' J. Anal. Chem., 1996, 355(3-4), 375.
362. Schaefer, C., Haupt, O., Cannecker, W., Fresenius' J. Anal. Chem., 1996, 355(3-4), 379.
363. Ando, H., Inoue, Y., Inoue, T., Satoh, S., Kawasakishi Kogai Kenkyusho Nenpo, 1996, 22, 23.
364. de Chateaubourg, P., J. Phys. IV, 1996, 6(C4, Rayons X et Matiere), C4/667.
365. Bernasconi, G., Dargie, M., Haselberger, N., Markowicz, A., Tajanai, A., Valkovic, V. (Agency's Lab. Seibersdorf, Intl. Atomic Energy Agency, 1400 Vienna, Austria). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
366. Stankiewicz, W. K., Mzyk, Z. A., Roter, B. M., Mikrochim. Acta, 1996, 123(1-4), 137.
367. Smagunova, A. N., Karpova, O. M., Deriglazova, E. S., Chesnokova, S. G., Kozlov, V. A., Zavod. Lab., 1995, 61(12), 18.
368. Abou-Leila, H., Al-Houty, L., Samman, H. El, Qatar Univ. Sci. J., 1994, 14(2) 229.
369. Djupström Fridell, M., Selin Lindgren, E., Simpson, D. (Environ. Phys., Chalmers Univ. Technol./Univ. Goeteborg, 412 96 Goeteborg, Sweden). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
370. Cercasov, V., Pantelica, A., Salagean, M., Schreiber, H., J. Radioanal. Nucl. Chem., 1996, 204(1), 173.
371. Orlić, I., Tang, S. M., Wu, X.-k. (Dept. Phys., Natl. Univ. Singapore, Singapore 0511, Singapore). Presented at International Schools and Conference on X-Ray Analytical Methods, Sydney, Australia, January 18-25, 1996.
372. Araújo, M.F., Valério, P. (Quim., ITN, Estrada Nacl. 10, 2685 Sacavem, Portugal). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
373. Rathbun, J. E., Huellmantel, L. L., Tracy, M., Smith, V. E., Ahlgren, K., J. Great Lakes Res., 1996, 22(3), 523.
374. Yamazaki, H., Mitani, A., Gohda, S., Kinki Daigaku Rikogakubu Kenkyu Hokoku, 1995, 31, 103.
375. Osán, J., Török, S., (KFKI Atomic Energy Res. Inst., 1525 Budapest, Hungary). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
376. Piorek, S., Piorek, E., Zepeck, R., (Metorex Inc., Langhorne, PA 19047, USA). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
377. Dondi, M., Ercolani, G., Fabbri, B., Churchman, G. J. (Ed.), Fitzpatrick, R. W. (Ed.), Eggleton, R. A. (Ed.), Concentration of pollutant elements (F, S, Cl) in the clays used by the Italian brick industry. Clays Controlling Environ., Proc. Int. Clay Conf., 10th 1993, Commonwealth Scientific and Industrial Research Organization, East Melbourne, Australia, 1995, 79-83.
378. Haupt, O., Linnow, K., Harmel, R., Schaefer, C., Dannecker, W., X-Ray Spectrom., 1997, 26, 79.
379. Vijayan, V., Behera, S. N., Ramamurthy, V. S., Puri, S., Shahi, J. S., Singh, N., X-Ray Spectrom., 1997, 26, 65.
380. Ertugrul, M., Kobya, M., Dogan, O., J. Radioanal. Nucl. Chem., 1996, 203(1), 119.
381. Garivait, S., Quisefit, J. P., Analusis, 1995, 23(10), 501.
382. Russell, P. A., James, R., J. Anal. At. Spectrom., 1997, 12(1), 25.
383. Resce, J. L., Overcamp, T. J., Bickford, D. F., Jurgensen, A. R., Ceram. Trans., 1995, 61 (Environmental Issues and Waste Management Technologies in the Ceramic and. Nuclear Industries), 585.
384. Markowicz, A., Haselberger, N., Dargie, M., Tajani, A., Tchantchane, A., Valkovic, V., Danesi, P. R., J. Radioanal. Nucl. Chem., 1996, 206(2), 269.
385. Oberdoerfer, M., Mater. Landesumweltamt Nordrhein Westfalen, 1996, 26(Normierung und Konventionen in der Abfallanal.: Aufgaben und Ziele), 39.
386. Dean, J. R., Garden, L. M., Armstrong, J., Cresser, M. S., Cave, M., Watkins, P., J Anal. At. Spectrom., 1997, 12(2), 19R.
387. Wei, C. L., Fan, Q. M., Liu, Y. W., Li. D. L., X-Ray Spectrom., 1996, 25(3), 138.
388. Carter, G. F., ACS Symp. Ser., 1996, 625(Archaeological Chemistry), 94.
389. Lutz, J., Pernicka, E., Archaeometry, 1996, 38(2), 313.
390. Daraban, L., Cosma, C., Fiat, T., J. Radioanal. Nucl. Chem., 1995, 201(5), 447.
391. Al-Kofahi, M. M., Al-Tarawneh, K. F., Shobaki, J. M., X-Ray Spectrom., 1997, 26, 10.
392. Bachmann, H. G., NATO ASI Ser., Ser. E:, 1995, 280, 303.
393. Yu, K. N., Miao, J. M., Archaeometry, 1996, 38(2), 257.
394. Yu, K. N., Miao, J. M., X-Ray Spectrom., 1996, 25, 281.
395. Olcese, G., Monogr. Mater. Soc., 1995, 2(Ceramics Cultural Heritage), 541.
396. Ramous, E., Angler, M., Magrini, M., Persiani, C., Monogr. Mater. Soc., 1995, 2(Ceramics Cultural Heritage), 343.
397. Antunes, J. L., Figueiredo, M. O., Pessoa, J. C., Fortes, M. A., Monogr. Mater. Soc., 1995, 2(Ceramics Cultural Heritage), 653.
398. Figueroa, R., Caro, D., Vargas, A., Gordon, A., Poblete, V., J. Radioanal. Nucl. Chem., 1995, 198(2), 311.
399. Dondi, M., Ercolani, G., Fiori. C., Ceramurgia, 1995, 25(6), 323.
400. Orlando, A., Olmi, F., Vaggelli, G., Bacci, M., Analyst (Cambridge, UK, 1996, 121(4), 553.
401. Calliari, I., Magrini, M., Zambon, A., Martini, R. (D.I.M.E.G. Univ. Padua, 35141 Padova, Italy). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
402. Adriaens, A., Mikrochim. Acta, 1996, 124(1-2), 89.
403. Twilley, J., Monogr. Mater. Soc., 1995, 2(Ceramics Cultural Heritage), 161.
404. Matsuda, S., Aoki, S., Hozon Kagaku, 1996, 35, 1.
405. Filomena Guerra, M. (CNRS, Centre Recherches Ernest Babelon, 45650 Orleans Cedex 2, France). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
406. Cicardi, C., Milazzo, M. (Ist. Fisica Generale Applicata, Univ. Studi, 20133 Milano, Italy). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
407. Hugon, P., Reyer, D. D., Texier, A., Burck, J.-J., J. Phys. IV, 1996, 6(C4, Rayons X et Matiere), C4/809.
408. Dupouy, J.-M., J. Phys. IV, 1996, 6(C4, Rayons X et Matiere), C4/791.
409. Nir-El, Y., Broshi, M., Archaeometry, 1996, 38(1), 97.
410. Massonnet, G., Comparison of X-ray fluorescence and X-ray diffraction techniques for the forensic analysis of automobile paint. Adv. Forensic Sci., Proc. Meet. Int. Assoc. Forensic Sci., 13th, Verlag, Berlin, Germany, 1995, 321-326.
411. Hampp, N., Can. Pat. Appl. CA 2,161,613 (Cl. C09D11/00), 17 Jun 1996, DE Appl. 4,445,004, 16 Dec 1994; 33 pp.
412. Mangala, M. J., Patel, J. P., J. Trace Microprobe Tech., 1996, 14(4), 703.
413. Khazbak, A. E., Egypt. J. Anal. Chem., 1995, 4(1), 33.
414. Ashry, H. A., Khazbak, A. E., Soliman, F. A. S., Ibrahim, M. A., Appl. Radiat, Isot., 1995, 46(8), 735.
415. Bao, S. X., Fenxi Huaxue, 1996, 24(5), 619.
416. Talanova, V. N., Smirnova, I. S., Zavod. Lab., 1995, 61(12), 21.
417. Wang, H. C., Tai, K.-p., Kuangye (Taipei), 1995, 39(2), 111.
418. Yin, X. W., Hao, G. Z., Fenxi Shiyanshi, 1996, 15(1), 80.
419. Kobya, M., Ertugrul, M., Dogan, O., Simsek, O., Instrum. Sci. Technol., 1996, 24(4), 277.
420. Smirnova, I. S., Talanova, V. N., Zavod. Lab., 1996, 62(2), 23.
421. Aust. Stand., 1996, 64.
422. Rozova, O. F., Perkina, I. M., Skribko, N. N., Loran, A. V., Popova, N. V., Smagunova, A. N., Zavod. Lab., 1996, 62(6), 17.
423. Thornton, G., Welbourn, B. C., Iron Steelmaker, 1996, 23(9), 67.
424. Almonfrey, F. C., dos Santos, I., Pereira, A. M. T., Campanha Filho, E. A., Metal Mater., 1996, 52(450), 142.
425. Prekina, I. M., Rozova, O. F., Loran, A. V., Teplitskaya, G. A., Smagunova, A. N., Zavod. Lab., 1995, 61(12), 26.
426. Fu, J. H., Gu, M. T., Chang, G. W., Lihua Jianyan, Huaxue Fence, 1996, 32(5), 301.
427. Sharma, I. G., Bose, D. K., Joseph, D., Lai, M., X-Ray Spectrom., 1996, 25, 205.
428. West, H. M., Burton, R. P., Giles, H. L., Proc. Chem. Conf., 1995 (47th), 70.
429. Samways, N. L., Iron Steel Eng., 1996, 73(9), 169.
430. Kierzek, J., Kierzek, A., Malozewska-Bucko, B., Nukleonika, 1995, 40(3), 133.
431. Rakita, K. A., Mamaenko, M. V., Metelev, A. Yu., Zh. Anal. Khim., 1996, 51(3), 332.
432. Anzelmo, J. A., Buman, A. I., Yellepeddi, R., Bonvin, D., (ARL, Dearborn, MI 48120, USA). Presented at Pittsburgh Conference (PITTCON '96), Chicago, IL, USA, March 3-8, 1996.
433. Ning, D. L., Zhao, Y., Lihua Jianvan, Huaxue Fence, 1995, 31(5), 287.
434. Yantsh, P., Zavod. Lab., 1996, 62(10), 63.
435. Ohkochi, H., Feramu, 1996, 1(10), 753.
436. Hurst, J. A., Anal. Chim. Acta. 1996, 334, 331.
437. Belyaeva, E. E., Belozerov, V. G., Mashin, N. I., Rudnevskii, N. K., Zavod. Lab., 1996, 62(9), 26.
438. Krafcik, J. S., Brooks, J. A., Compositional mapping of large samples using X-ray fluorescence. Dev. Mater. Charact. Technol., Symp., ASM Intl., Materials Park, OH, USA, 1996, 111-118.
439. Ohls, K., Flock, J., Anal. Eur., 1995, 6, 23.
440. Kawauchi, A., Ishida, M., Saitoh, I., Spectrosc. Lett., 1996, 29(2), 345.
441. Wakisaka, T., Morita, N., Tanaka, S., Nakahara, T., Bunseki Kagaku, 1996, 45(11), 1025.
442. Wakisaka, T., Morita, N., Tanaka, S., Nakahara, T., Bunseki Kagaku, 1996, 45(11), 1019.
443. Hepp, N. M., J. AOAC Int., 1996, 79(5), 1189.
444. Anderson, D. L., Cunningham. W. C., J. AOAC Int., 1996, 79(5), 1141.
445. Kim, Y. M., Jeong, C. Y., Lim, C. H., Song, T. Y., Lee, D. S., Anal. Sci. Technol., 1996, 9(4), 382.
446. Arikan, P., Zararsiz, A., Efe, N., Appl. Spectrosc. Rev., 1996, 31(1-2), 167.
447. Ikavalko, E., Laitinen, T., Parkka, M., Yliruokanen, I., Int. J. Environ. Anal. Chem., 1995, 61(3), 207.
448. Balogun, F. A., Nwankpa, A., Ibitoye, F. I., Adesanmi, C. A., Tubosun, I. A., Owolabi, S. A., J. Radioanal. Nucl. Chem., 1996, 213(1), 21.
449. Olajire, A. A., Oderinde, R. A., Nafta (Zagreb), 1996, 47(9), 259.
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455. Brill, M., Metall (Heidelberg), 1996, 50(7/8), 504.
456. Brill, M., Metall (Heidelberg), 1996, 50(10), 662.
457. Wakisaka, T., Morita, N., Wakasa, M., Terada, S., Nishihagi, K., Taniguchi, K., Bunseki Kagaku, 1996, 45(10), 933.
458. Figi, R., Lienemann, P., Richner, P., Toxicol. Environ. Chem., 1995, 52(1-4), 35.
459. Bertucci, M., Zydowicz, Ph., J. Phys. IV, 1996, 6(C4,Rayons X et Matiere), C4/853.
460. Krishna, G. R., Ravindra, H. R., Gopalan, B., Syamsundar, S., J. Radioanal. Nucl. Chem., 1996, 204(2), 295.
461. Kump, P., Necemer, M., Smodis, B., Jacimovic, R., Appl. Spectrosc., 1996, 50(11), 1373.
462. Ivanova, T. M., Lependina, O. L., Dyumaev, K. M., Zh. Prikl. Spektrosk., 1996, 63(4), 686.
463. Yellepeddi, R., Kohler, A., ZKG Int., 1996, 49(9), 522.
464. Germaneau, B., Signes-Frehel, M., van der Vlist, F., J. Phys. IV, 1996, 6(C4, Rayons X et Mauere), C4/641.
465. Anon., Cim., Betons, Platres, Chaux, 1996, 821, 262.
466. Hayumbu, P., Zaman, M. B., Chigali, P. C., Munsanje, S., Mulenga, P., Int. J. BioChemiPhysics, 1995, 4(1+2), 2.
467. Magnusson, B. (Central Anal. Lab., Eka Chemicals, 445 80 Bohus, Sweden). Presented at The 15th Nordic Atomic Spectroscopy and Trace Element Conference, Ebeltoft, Denmark, June 2-6, 1996.
468. Batchelor, J.D., Jones, B.T. (Dept. Chem., Wake Forest Univ., Winston Salem, NC, USA). Presented at FACSS XXIII, Kansas City, MO, USA, September 29-October 4, 1996.
469. Hu, H., Hashimoto, D., Besser, M., Arch. Environ. Health, 1996, 51(1), 52.
470. Hu, H., Aro, A., Payton, M., Korrick, S., Sparrow, D., Weiss, S. T., JAMA, J. Am. Med. Assoc., 1996, 275(15), 1171.
471. Kim, R., Hu, H., Rotnitzky, A., Bellinger, D., Needleman, H., Arch. Environ. Health, 1996, 51(5), 375.
472. Hernandez-Avila, M., Gonzalez-Cossio, T., Palazuelos, E., Romieu, I., Aro, A., Fishbein, E., Peterson, K. E., Hu, H., Environ. Health Perspect., 1996, 104(10), 1076.
473. Todd, A. C., Wetmur, J. G., Moline, J. M., Godbold, J. H., Levin, S. M., Landrigan, P. J., Environ. Health Perspect. Suppl., 1996, 104(Suppl. 1), 141.
474. Zhou, X., Liu, Y., Ye, J., Chang, F., Guangdong Weiliang Yuansu Kexue, 1995, 2(5), 48.
475. Raghavaiah, C. V., Rao, M. V. S. C., Murthy, G. S. K., Varaprasad, N. V. S., Rao, P. V. R., Sastry, D. L., X-Ray Spectrom., 1996, 25(3), 123.
476. Man, C. K., Zheng, Y. H., Mak, P. K., Sci. Total Environ., 1996, 191(3), 291.
477. Hong, N. T., Leermakers, M., Boman, J., (Dept. Hum. Ecol., Vrije Univ. Brussels, 1090 Brussels, Belgium). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
478. MacLean, D. S., Robertson, J. D., Moody, E., Stalker, D. J., Jay, M., Int. J. Pharm., 1996, 131(2), 243.
479. Bradley, D. A., Ng, K. H., Green, S., Mountford, P. J., Shukri, A., Evans, J., Radiat. Phys. Chem., 1996, 47(5), 745.
480. Hong, N. T., Ha, H. V., X-Ray Spectrom., 1996, 25(1) 3.
481. Brito, J., Carvalho, M. L. (Centro Fisica Atomica, Univ. Lisboa, 1699 Lisboa Codex, Portugal). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
482. Subramanian, K. S., Spectrochim. Acta, Part B, 1996, 51(3), 291.
483. Rubio, M., Proc. Int. Sch. Phys. Enrico Fermi, 1996, 128t(Biomedical Applications of Sychrotron Rdiation), 313.
484. Sutcliffe, J. F., Phys. Med. Biol., 1996, 41(5), 791.
485. Smith, D. R., McNeill, F., Toxicol. Met., 1996, 737.
486. Wielopolski, L. (Med. Dept., Brookhaven Natl. Lab., Upton, NY 11973, USA). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
487. Nakamura, Y., Ohnuki, N., Mori, K., Ito, K., Nakamura, H., Kenkyu Nenpo-Tokyo-toritsu Eisei Kenkyusho, 1995, 46, 72.
488. Feldstein, H., Cohen, Y., Shenberg, C., Klein, A., Kojler, M., Maenhaut, W., Cafmeyer, J., Cornelis, R. (Soreq NRC, Yavne 81800, Israel). Presented at International Schools and Conference on X-Ray Analytical Methods, Sydney, Australia, January 18-25, 1996.
489. Frank, A., Madej, A., Galgan, V., Petersson, L. R., Sci. Total Environ., 1996, 181, 73.
490. Osán, J., Toeroek, Sz., Toeroek, K., Nemeth, L., Labar, J. L., X-Ray Spectrom., 1996, 25, 167.
491. Belakova, M., Havranek, E., Bumbalova, A., J. Radioanal. Nucl. Chem., 1995, 201(5), 431.
492. Joseph, D., Lal, M., Souza, T. J. D., J. Nucl. Agric. Biol., 1995, 24(3), 137.
493. Harangozo, M., Kralovic, J., J. Radioanal. Nucl. Chem., 1996, 213(3), 207.
494. Richardson, D. H. S., Shore, M., Hartree, R., Richardson, R. M., Sci. Total Environ., 1996, 176, 97.
495. Joseph, D., Srinivasan, V. T., Lal, M., Sainis, J. K., J. Nucl. Agric. Biol., 1996, 25(3), 139.
496. Parreira, P. S., Nascimento Fo, V. F., J. Nucl. Agric. Biol., 1995, 24(2), 83.
497. Schnug, E., Haneklaus, S., Commun. Soil Sci. Plant Anal., 1996, 27(5-8), 1707.
498. Boman, J., Larsson, C., Olsson, M., Raitio, H., X-Ray Spectrom., 1996, 25(2), 89.
499. Latimer, S. D., Devall, M. S., Tomas, C., Ellgaard, E. G., Kumar, S. D., Thien, L. B., J. Environ. Qual., 1996, 25(6), 1411.
500. Mendoza, A., Meltin, J. J., Benitez, F., Travieso, L., de la Fuente, F., Cesareo, R. (Natl. Center Scientific Res. (CNIC), Havana, Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
501. Kies, L., Fast, T., Wolfstein, K., Hoberg, M., Adv. Limnol., 1996, 47,93.
502. El Moll, A., Heimburger, R., Lagarde, F., Leroy, M. J. F., Maier, E., Fresenius' J. Anal. Chem., 1996, 354(5-6), 550.
503. Castilla Y Cortazar, M. I., Llopis Cosin, J. V., Agrochimica, 1995, 39(5-6), 233.
504. Klosowski, J., Endler, I., Leonhardt, A., Schalfer, D., Fresenius' J. Anal. Chem., 1995, 353(5-8), 702.
505. Zyryanov, V. G., Moskalenko, N. I., Strekalovskii, V. N., Zh. Anal. Khim., 1995, 50(12), 1307.
506. Del Monte Tamba, M. G., Lo Piccolo, E., Luperi, N., Novaro, E., Proc. Chem. Conf., 1993, 45, 73.
507. Yanaki, N., CEW, Chem. Eng. World, 1996, 31(7), 77.
508. Mattox, D. M., Plat. Surf. Finish., 1996, 83(3), 54.
509. Sui, S. S., Wei, J., Fenxi Kexue Xuebao, 1995, 11(4), 44.
510. Sieber, I., Schoepke, A., Selle, B., Fresenius' J. Anal. Chem., 1995, 353(5-8), 639.
511. Ebel, H., Svagera, R., Mantler, M., Ebel, M. F., X-Ray Spectrom., 1997, 26, 28.
512. Ebel, H., Svagera, R., Hager, Ch., Ebel, M. F., Eisenmenger-Sittner, Ch., Wernisch, J., Manlier, M. (Inst. Angewandte und Technische Phys., Tech. Univ. Wien, 1040 Vienna, Austria). Presented at 45th Annual Denver X-ray Conference, Denver, CO, USA, Aug 3 1996.
513. Gries, W. H., Surf. Interface Anal., 1996, 24(7), 431.
514. Lehto, S., Lappalainen, R., Viirola, H., Niinisto, L., Fresenius' J. Anal. Chem., 1996, 355(2), 129.
515. Trushin, O. S., Bochkarev, V. F., Mul, V. V., Naumov, V. V., Zavod. Lab., 1995, 61(8), 20.
516. Broil, N., Dontenwill, V., Zeh, E., J. Phys. IV, 1996, 6(C4, Rayons X et Matiere), C4/659.
517. Makarov, L. L., Suglobov, D. N., Batrakov, Yu. F., Mashirov, L. G., Tupilsyn, I. I., Radiokhimiya, 1996, 38(3), 218.
518. Sugiura, C., J. Phys. Soc. Jpn., 1996, 65(3), 800.
519. Sugiura, C., J. Phys. Soc. Jpn., 1996, 65(7), 2170.
520. Sugiura, C., Yorikawa, H., Muramatsu, S., J. Phys. Soc. Jpn., 1996, 65(9), 2940.
521. Dupont, S., Gheorghiu, A., Senemaud, C., Mariot, J.-M., Hague, C. F., Lippens, P.-E., Olivier-Fourcade, J., Jumas, J.-C., J. Phys: Condens. Matter, 1996, 8(43), 8421.
522. Laihai, R., Leiro, J. A., Kokko, K., Mansikka, K., J. Phys: Condens. Matter, 1996, 8(36), 6791.
523. Folkmann, F., Nucl. Instrum. Methods Phys. Res., Sect. B, 1996, 109-110, 39.
524. Rebohle, L., Lehnert, U., Zschornack, G., X-Ray Spectrom., 1996, 25, 295.
525. Kallithrakas-Kontos, N., Spectrochim. Acta, Part B, 1996, 51B(13), 1655.
526. Kallithrakas-Kontos, N., Moshohoritou, R. (Tech. Univ. Crete, 73100 Chania, Greece). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
527. Leiro, J. A., Heinonen, M. (Dept. Applied Phys., Univ. Turku, 20500 Turku, Finland). Presented at European Conference on Energy Dispersive X-ray Spectrometry, Lisboa, Portugal, June 23-29, 1996.
528. Li. X. L., Zhang, R. F., Guangpuxue Yu Guangpu Fenxi, 1996, 16(3), 119.
529. Kekre, P. A., Joshi, K. P., Mishra, A., Chaturvedi, K. K., X-Ray Spectrom., 1996, 25, 163.
530. Shima, K., Inagaki, Y., Maezawa, H., Yasumi, S., KEK Rep., 1996, 95-17 (Study of the Mass of the Electron Neutrino in Japan), 47.