Direct Determination Method for Homogeneous Solid Samples in X-Ray Fluorescence Analysis

X-Ray Spectrometry

Volumn 25, Issue 5, 1996, Pages 245-257

  Wang, Yongzhong ^a  

^a WUHAN RESEARCH INSTITUTE OF MATERIALS PROTECTION   (China)

Author keywords

[No Author keywords available]

Indexed keywords

FILM THICKNESS; FLUORESCENCE;

AM GENERALS; BULK SAMPLES; DETERMINATION METHODS; DIRECT DETERMINATION; HOMOGENEOUS SOLIDS; MULTI-LAYERS; SINGLE LAYER; SOLID SAMPLES; THIN-FILMS; X RAY FLUORESCENCE ANALYSIS;

THIN FILMS;

EID: 0343425294     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4539(199609)25:5<245::AID-XRS166>3.0.CO;2-T     Document Type: Article

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