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Volumn 7, Issue C, 1996, Pages 171-206

Chapter 3 Microbeam and chemical state analysis

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EID: 5344224608     PISSN: 09264345     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S0926-4345(96)80004-6     Document Type: Article
Times cited : (3)

References (62)
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  • 2
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    • Engstrom A., Cosslett V.E., and Pattee H.H. (Eds), Elsevier, Cambridge
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    • (1960) X-Ray Microscopy and X-Ray Micro-analysis
  • 6
    • 0003431955 scopus 로고
    • Sparks C.J., Winick H., and Doniach S. (Eds), Plenum, Amsterdam
    • In: Sparks C.J., Winick H., and Doniach S. (Eds). Synchrotron RadiationResearch (1980), Plenum, Amsterdam
    • (1980) Synchrotron RadiationResearch
  • 7
    • 0039524135 scopus 로고
    • Schmahl G., and Rudolph D. (Eds), Springer, New York
    • In: Schmahl G., and Rudolph D. (Eds). X-Ray Microscopy (1984), Springer, New York
    • (1984) X-Ray Microscopy
  • 8
    • 0003801882 scopus 로고
    • Chen P.C., and Jan G.J. (Eds), Springer, Berlin
    • In: Chen P.C., and Jan G.J. (Eds). X-Ray Microscopy II (1987), Springer, Berlin
    • (1987) X-Ray Microscopy II
  • 9
    • 77957092964 scopus 로고
    • Michette A.G., Morrison G.R., and Buckley C.J. (Eds), Springer, Berlin
    • In: Michette A.G., Morrison G.R., and Buckley C.J. (Eds). X-Ray Microscopy II (1992), Springer, Berlin
    • (1992) X-Ray Microscopy II
  • 22
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    • Hayakawa S., Gohshi Y., Michette A.G., Morrison G.R., and Buckley C.J. (Eds), Springer, Berlin
    • In: Hayakawa S., Gohshi Y., Michette A.G., Morrison G.R., and Buckley C.J. (Eds). X-Ray Microscopy III (1992), Springer, Berlin 364
    • (1992) X-Ray Microscopy III , pp. 364
  • 27
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    • Baryshev V., Kulipanov G., Skrinsky A., Brown G., and Moncton D.E. (Eds), Elsevier, Berlin
    • In: Baryshev V., Kulipanov G., Skrinsky A., Brown G., and Moncton D.E. (Eds). Handbook on Synchrotron Radiation (1991), Elsevier, Berlin
    • (1991) Handbook on Synchrotron Radiation
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    • Legrand F., Erko A., Dhez P., Chevallier P., Engrand C., Aristov V.V., and Erko A.I. (Eds), Institute of Microelectronics Technology Chernogolovka
    • In: Legrand F., Erko A., Dhez P., Chevallier P., Engrand C., Aristov V.V., and Erko A.I. (Eds). X-Ray Microscopy IV (1994), Institute of Microelectronics Technology Chernogolovka 136
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.