Application of X-ray fluorescence spectrometry in assessment of environmental pollution

Journal of Radioanalytical and Nuclear Chemistry

Volumn 206, Issue 2, 1996, Pages 269-277

  Markowicz, A ^a   Haselberger, N ^a   Dargie, M ^a   Tajani, A ^a   Tchantchane, A ^a,b   Valkovic, V ^a   Danesi, P R ^a  

^a INTERNATIONAL ATOMIC ENERGY AGENCY   (Austria)

^b Centre for Development of Nuclear Techniques   (Algeria)

Author keywords

[No Author keywords available]

Indexed keywords

CONFERENCE PAPER; CONTROLLED STUDY; POLLUTION; X RAY FLUORESCENCE;

EID: 0029846955     PISSN: 02365731     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02039653     Document Type: Conference Paper

References (9)

1. R.E. VAN GRIEKEN, A.A. MARKOWICZ, Handbook of X-ray Spectrometry - Methods and Techniques, Marcel Dekker, New York, 1993.
2. R. VAN GRIEKEN, A. MARKOWICZ, P. VENY, X-ray Spectrom., 20 (1991) 271.
3. G. TÖLG, R. KLOCKENKÄMPER, Spectrochim. Acta, 48B (1993) 111.
4. S. LARSSON, P. ENGSTRÖM, A. RINDBY, B. STOCKLASSA, Adv. X-ray Anal. 33 (1990) 623.
5. A. MARKOWICZ, N. HASELBERGER, Int. J. Radiat. Appl. Instrum. Part A, 43 (1992) 777.
6. P. VAN ESPEN, K. JANSSENS, I. SWENTERS, AXIL X-ray Analysis Software, Canberra Packard, Benelux.
7. CH. STRELI, H. AIGINGER, P. WOBRAUSCHEK, Spectrchim. Acta, 48B (1993) 163.
8. A. MARKOWICZ, N. HASELBERGER, H.S. EL HASSAN, M.S.A. SEWANDO, J. Radioanal. Nucl. Chem., 158 (1992) 409.
9. A. MARKOWICZ, G. BERNASCONI, N. HASELBERGER, M. NAGJ, V. VALKOVIC, Total reflection XRF and X-ray microfluorescence analysis, Int. Conf. on Applications of Radioisotopes and Radiation in Industrial Development (ICARID-94), 7-9 February 1994, Bombay, India.