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Spectroscopy Europe

Volumn 8, Issue 5, 1996, Pages 14-20

Characterisation of layered materials with glancing incidence x-ray analysis

(2) Leenaers, A J G a De Boer, D K G a

a PHILIPS RESEARCH LABORATORIES (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5344275076 PISSN: 09660941 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (2)

References (8)

1
- 84990663513
- D.K.G. de Boer, W.W. Van den Hoogenhof and A.J.G. Leenaers, X-ray Spectrom. 24, 91 (1995).
- (1995) X-ray Spectrom. , vol.24 , pp. 91
- De Boer, D.K.G.¹ Van Den Hoogenhof, W.W.² Leenaers, A.J.G.³

2
- 26144449160
- L.G. Parratt, Phys. Rev. 95, 359 (1954).
- (1954) Phys. Rev. , vol.95 , pp. 359
- Parratt, L.G.¹

3
- 13444285568
- D.K.G de Boer, Phys. Rev. B 44, 498 (1991).
- (1991) Phys. Rev. B , vol.44 , pp. 498
- De Boer, D.K.G.¹

4
- 0026258448
- U. Weisbrot, R. Gutschke, J. Knoth and H. Schwenke, Appl. Phys. A53, 449 (1991).
- (1991) Appl. Phys. , vol.A53 , pp. 449
- Weisbrot, U.¹ Gutschke, R.² Knoth, J.³ Schwenke, H.⁴

5
- 0015952814
- H. Aiginger and P. Wobrauschek, Nud. Instr. Meth. 114, 157 (1974).
- (1974) Nud. Instr. Meth. , vol.114 , pp. 157
- Aiginger, H.¹ Wobrauschek, P.²

6
- 0022063265
- A. Iida, K. Sakuarai, A. Yoshinaga and Y. Goshi, Nacl. Instr. Meth. A246, 736 (1986).
- (1986) Nacl. Instr. Meth. , vol.A246 , pp. 736
- Iida, A.¹ Sakuarai, K.² Yoshinaga, A.³ Goshi, Y.⁴

7
- 8344267317
- P.J. van der Zaag et at., J. Appl. Phys. 79(8) (1996).
- J. Appl. Phys. , vol.79 , Issue.8 , pp. 1996
- Van Der Zaag, P.J.¹

8
- 8344245960
- submitted
- A.J.G. Leenaers, J.J.A.M. Vrakking and D.K.G. de Boer, Spectrochim. Acta B, submitted.
- Spectrochim. Acta B
- Leenaers, A.J.G.¹ Vrakking, J.J.A.M.² De Boer, D.K.G.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.