X-ray scattering and x-ray fluorescence from materials with rough interfaces

Physical Review B - Condensed Matter and Materials Physics

Volumn 53, Issue 10, 1996, Pages 6048-6064

  de Boer, Dick K G ^a  

^a PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001334179     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.53.6048     Document Type: Article

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