메뉴 건너뛰기




Volumn 7, Issue C, 1996, Pages 79-169

Chapter 2 X-ray fluorescence analysis

Author keywords

[No Author keywords available]

Indexed keywords


EID: 5344249926     PISSN: 09264345     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S0926-4345(96)80003-4     Document Type: Article
Times cited : (3)

References (66)
  • 1
    • 0002318784 scopus 로고
    • Chap. 14. Winick H., and Doniach S. (Eds), Plenum Press, Cambridge
    • Chap. 14. Sparks Jr. C.J. Synchrotron Radiation Research. In: Winick H., and Doniach S. (Eds) (1980), Plenum Press, Cambridge 459
    • (1980) Synchrotron Radiation Research , pp. 459
    • Sparks Jr., C.J.1
  • 3
    • 0001271780 scopus 로고
    • Chap. 9. Ebashi S., Koch M., and Rubenstein E. (Eds), North-Holland, Amsterdam
    • Chap. 9. Iida A., and Gohshi Y. Handbook on Synchrotron Radiation. In: Ebashi S., Koch M., and Rubenstein E. (Eds) (1991), North-Holland, Amsterdam 307
    • (1991) Handbook on Synchrotron Radiation , pp. 307
    • Iida, A.1    Gohshi, Y.2
  • 13
    • 0346531729 scopus 로고
    • Boumans P.W.J.M., Wobrauschek P., and Aiginger H. (Eds). Vienna, May 1990
    • In: Boumans P.W.J.M., Wobrauschek P., and Aiginger H. (Eds). Proceedings of the Third Workshop on TXRF. Vienna, May 1990. Spectrochim. Acta, PartB (1991) 1313-1436
    • (1991) Spectrochim. Acta, PartB , pp. 1313-1436
  • 14
    • 77957090189 scopus 로고
    • Boumans P.W.J.M., and Prange A. (Eds). Geesthacht, May 1992
    • In: Boumans P.W.J.M., and Prange A. (Eds). Spectrochim. Acta, Part B. Geesthacht, May 1992. Proceedings of the Fourth Workshop onTXRF (1993) 107-299
    • (1993) Proceedings of the Fourth Workshop onTXRF , pp. 107-299
  • 29
    • 0242612494 scopus 로고
    • Chap. 2. Winick H., and Doniach S. (Eds), Plenum Press, Tsukuba
    • Chap. 2. Winick H. Synchrotron Radiation Research. In: Winick H., and Doniach S. (Eds) (1980), Plenum Press, Tsukuba 11
    • (1980) Synchrotron Radiation Research , pp. 11
    • Winick, H.1
  • 30
    • 84918624152 scopus 로고
    • Chap. 9. Kurosaki K., and Konishi F. (Eds), Kodansha, New York
    • Chap. 9. Saisho H., and Hashimoto H. Trace Analysis (in Japanese). In: Kurosaki K., and Konishi F. (Eds) (1988), Kodansha, New York 245
    • (1988) Trace Analysis (in Japanese) , pp. 245
    • Saisho, H.1    Hashimoto, H.2
  • 33
    • 0004024649 scopus 로고
    • X-Ray Absorption Coefficients of the Elements (Li to Bi, U)
    • KEK, Livermore, CA
    • Sasaki S. X-Ray Absorption Coefficients of the Elements (Li to Bi, U). KEK Report 90-16, November 1990, M/D (1990), KEK, Livermore, CA
    • (1990) KEK Report 90-16, November 1990, M/D
    • Sasaki, S.1
  • 61
    • 77957042411 scopus 로고
    • Proceedings of the International Conference on Materials and Process Characterization for VLSI, 1991(ICMPC '91)
    • Shanghai. Zong X.F., Wang Y.Y., and Gu X.Y. (Eds)
    • Shanghai. Hashimoto H., Nishioji H., and Saisho H. Proceedings of the International Conference on Materials and Process Characterization for VLSI, 1991(ICMPC '91). In: Zong X.F., Wang Y.Y., and Gu X.Y. (Eds). National Microanalysis Center for Microelectronic Materials & Devices (October 1991) 592
    • (1991) National Microanalysis Center for Microelectronic Materials & Devices , pp. 592
    • Hashimoto, H.1    Nishioji, H.2    Saisho, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.