The LURE-IMT X-ray fluorescence photon microprobe

Journal of Trace and Microprobe Techniques

Volumn 14, Issue 3, 1996, Pages 517-539

  Chevallier, P ^a,b   Dhez, P ^a   Legrand, F ^a,b   Erko, A ^c,d   Agafonov, Yu ^c   Panchenko, L A ^c   Yakshin, A ^c  

^a UNIVERSITÉ PARIS SACLAY   (France)

^b SORBONNE UNIVERSITÉ   (France)

^c INSTITUTE OF MICROELECTRONICS TECHNOLOGY AND HIGH PURITY MATERIALS   (Russian Federation)

^d HAHN MEITNER INSTITUT   (Germany)

Author keywords

Synchrotron Radiation; Trace element analysis; X ray fluorescence analysis; X ray microprobe

Indexed keywords

EID: 0000899708     PISSN: 07334680     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (38)

1. Chevallier P, Abbas K, Sainfort P (1991) X-Ray Spectrometry 20, 293-295.
2. Chevallier P (1983) Fourth Topical Conference on Atomic Processes in High Temperature Plasmas, Princeton, August 1983.
3. Chevallier P (1987) Journal de Physique, Colloque C9, supp 12, 48, 39-47.
4. Jaklevic JM (1976) Proceedings of the Energy Research and Development Administration: X and γ Ray Symposium, Conf 760539, Ann Arbor, Michigan, May 1976.
5. Castaing R, Slodzian G (1962) J. Microscopy 1, 395-410.
6. Michiels F, Van Hoolst W, van Espen P, Adams F (1990) J. Am. Soc. Mass. Spectrom. 1, 37-52.
7. Denoyer E, Van Grieken R, Adams F, Natush D (1982) Anal. Chem. 54,26-32 A.
8. Adams F, Mauney T (1986) Adv. Mass Spectrom. 10, 507-524.
9. Goldstein SI, Newbury DE, Echlin P, Joy DC, Fiori C, Lifshin E (1984) Scanning electron microscopy and X-ray microanalysis, Plenum Press, New York.
10. Vis RD (1990) Fres. Z. Anal. Chem. 337, 622-630.
11. Horowitz P, Howell JA (1972) Science 178, 608-611.
12. Sparks CJ Jr, Raman S, Yakel HL, Gentry RV, Krause MO (1977) Phys. Rev. Lett. 38, 205-208.
13. Sparks CJ Jr (1980) In: Synchrotron Radiation Research, H Winick and S Doniach eds., Plenum Press, New York, Ch 14, pp.459-512.
14. Gordon BM, Jones KW (1985) Nuclear Instruments and Methods B10/11, 293-298.
15. Chen JR, Chao ECT, Minkin A, Back JM, Jones KW, Rivers ML, Sutton SR (1990) Nuclear Instruments and Methods B49, 533-543.
16. van Langevelde F, Bowen DK, Tras HJ, Vis RD, Huizing A, de Boer KDG (1990) Nuclear Instruments and Methods A292, 719-727.
17. Kirkpatrick P, Baez AV (1948) J. Opt. Soc. Am. 38, 766-774.
18. Underwood JH, Thompson AC, Wu Y, Giauque RD (1988) Nuclear Instruments and Methods A226, 296-297.
19. Wolter H (1952) Ann. Phys., 6th Ser, 10, 286-297.
20. Goshi Y, Aoki S, Iida A, Yamaji H, Sahuri K (1988) Adv. X-ray Anal. 31, 495-500..
21. Engström P, Larsson S, Rindby A, Buttkewitz A, Garbe S, Gaul G, Knöchel A, Lechtenberg F (1991) Nuclear Instruments and Methods A302, 547-552.
22. Bilderback DH, Huffman SA, Thiel DJ (1994) Science 263, 201-203.
23. Aristov VV, Gaponov SV, Genkin VM, Gorbatov YA, Erko AI, Martynov W, Matveeva LA, Salaschenko NN (1986) JETPh Lett. 44, 265-270.
24. Aristov VV (1988) X-ray microscopy II. D Sayre, M Howwells, J Kirz, H Rarback eds., Springer series in optical sciences, Springer-Verlag, pp. 108-111.
25. Erko AI (1990) J. X-Ray Sc. Techn. 2, 297-302.
26. Aristov W, Snigirev AA, Basov YA, Nikulin YA (1986) AIP Conf. Proc. V147, 253-256.
27. Aristov VV, Erko AI, Firsov AA, Gaponov SV, Salaschenko NN, Zabelin AV, Rybakov BV, Stepanov EP (1990) 2nd European conference in X-ray synchrotron radiation research: conference proceedings. 1 vol 25, A Balena, E Bernieri, S Mobilio eds., SIF, Bologna, pp. 275-279.
28. Chevallier P, Dhez P, Erko A, Khzmalian E, Khan-Malek C, Freund A, Panchenko L, Redkin S, Zinenko V, Vidai B (1992) Proceedings of the IIIrd international conference on X-ray microscopy, London 3-7 Sept. 1990. AG Michette, GR Morrison, CJ Buckley eds.,Springer-Verlag, pp.217-219.
29. Aristov W, Erko AI (1991) X-Ray Optics. "Nauka", Moscow.
30. Erko AI, Chevallier P, Dhez P, Vidai B, Legrand F (1992) Proceedings of the XIIIth international congress on X-Ray optics and microanalysis: Manchester, 1992. Inst. Phys. Conf. Ser. 130, 617-620.
31. Mirone A, Idir M, Dhez P, Soullié G, Erko A (1994) Optics Com. 111, 191-198.
32. Erko AI, Agafonov Yu, Panchenko LA, Yuakshin A, Chevallier P, Dhez P, Legrand F (1994) Optics Com. 106, 146-150.
33. Chevallier P, Dhez P, Legrand F, Idir M, Soullié G, Mirone A, Erko A, Snigirev A, Snigireva I, Suvorov A, Freund A, Engström P, Als Nielsen J, Grübel A (1995) Nuclear Instruments and Methods A354, 584-587.
34. Roshchupkin DV, Brunel M, de Bergevin F, Erko AI (1992) Nuclear Instruments and Methods B72, 471-476.
35. Mosbah M, Clocchiatti R, Michaud V, Piccot D, Chevallier P, Legrand F, Als Nilsen G, Grübel G (1995) 4th international conference on nuclear microprobe technology and application, Shangai, China 10-14 October 1994. Nuclear Instruments and Methods B104, 481-488.
36. Czamanske GK, Sisson TW, Campbell JL, Teesdale WJ (1993) American Mineralogist 78, 893-902.
37. Chen JR, Chao ECT, Back JM, Minkin JA, Rivers ML, Sutton S, Cygan GL, Grossman JN, Reed J (1993) Nuclear Instruments and Methods B75, 576-581.
38. Maurette M, Jehanno C, Robin E, Hammer C (1987) Nature 328, 699-702.