Practical XRF Calibration Procedures for Major and Trace Elements

X-Ray Spectrometry

Volumn 25, Issue 4, 1996, Pages 179-189

  Rousseau, Richard M ^a   Willis, James P ^b   Duncan, Andrew R ^b  

^a GEOLOGICAL SURVEY OF CANADA   (Canada)

^b UNIVERSITY OF CAPE TOWN   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

TRACE ELEMENTS;

ANALYTE CONCENTRATION; ANALYTES; CALIBRATION CURVES; CALIBRATION PROCEDURE; EMPIRICAL CALIBRATION; MAJOR AND TRACE ELEMENTS; MATRIX COMPOSITION; MATRIX TYPES; SIMPLE++; XRF ANALYSIS;

CALIBRATION;

EID: 0030538877     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4539(199607)25:4<179::AID-XRS162>3.0.CO;2-Y     Document Type: Article

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3. R. M. Rousseau, X-Ray Spectrom. 13, 125 (1984).
4. Operation Manual of the X40 Software Package, Version 4.0, for the Philips PW1404 XRF Spectrometer, Philips, Almelor, The Netherlands (1994).
5. W. K. de Jongh, X-Ray Spectrom. 2, 151 (1973).
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