Mapping X-Ray Absorption Fine Structure in the Quantum Efficiency of an X-ray Charge-Coupled Device

X-Ray Spectrometry

Volumn 25, Issue 1, 1996, Pages 33-38

  Owens, Alan ^a   Fraser, G W ^a   Keay, Adam ^a   Wells, Alan ^a   McCarthy, Kieran J ^b   Hill, S F ^c   Hughes, E A ^c   Smith, A D ^c   Suller, Vic ^c   Surman, M ^c  

^a UNIVERSITY OF LEICESTER   (United Kingdom)

^b LABORATORIO NACIONAL DE FUSIÓN   (Spain)

^c DRAL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; SILICON DETECTORS; SYNCHROTRON RADIATION; X RAY ABSORPTION; X RAY DETECTORS;

A-RINGS; ENERGY RANGES; HIGH RESOLUTION; NEAR EDGE STRUCTURE; ORDERS OF MAGNITUDE; RING CURRENTS; SPECTROSCOPIC MEASUREMENTS; SPECTROSCOPIC RESPONSE; SYNCHROTRON RADIATION SOURCE; X RAY ABSORPTION FINE STRUCTURES;

CHARGE COUPLED DEVICES;

EID: 0030553671     PISSN: 00498246     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-4539(199601)25:1<33::AID-XRS135>3.0.CO;2-C     Document Type: Article

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