Low-noise electronics for high-resolution CdZnTe and CdTe X-ray detection systems

Journal De Physique. IV : JP

Volumn 6, Issue 4, 1996, Pages

  Niemela A ^a,b  

^a Oxford Instruments Analytical Oy   (Finland)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM TELLURIDE; CADMIUM ZINC TELLURIDE; ENERGY RESOLUTION; FANO FACTOR; LOW NOISE ELECTRONICS; X RAY DETECTION SYSTEM;

DETECTORS; ELECTRIC CHARGE; ELECTRIC CURRENT COLLECTORS; LEAKAGE CURRENTS; SEMICONDUCTING CADMIUM COMPOUNDS; SEMICONDUCTOR DEVICE STRUCTURES; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE; TEMPERATURE; X RAYS;

ELECTRONIC EQUIPMENT;

EID: 5244221843     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:1996469     Document Type: Article

References (6)

1. P.F. Manfredi and V. Speziali, "High Density Monolithic Front-End Systems for Detectors without Charge Multiplication", Nuclear Instr. and Meth. in Physics Research, A279, pp. 152-168, 1989.
2. K. Kandiah and F.B. Whiting, "Limits of Resolution of Charge Sensitive Detector Systems", Nuclear Instr. and Meth. in Physics Research, A326, pp. 49-62, 1993.
3. A. Niemelä and H. Sipilä, "Evaluation of CdZnTe Detectors for Soft X-Ray Applications", IEEE Transactions on Nuclear Science, Vol. 41, No. 4, pp. 1054-1057, August 1994.
4. A. Niemelä and H. Sipilä, "Performance of a Cooled CdZnTe X-Ray Detector", IEEE Nuclear Science Symposium, Oct. 30 - Nov. 5, 1994, Norfolk, VA.
5. A. Niemelä, H. Sipilä and V.I. Ivanov, "Improving CdZnTe X-Ray Detector Performance by Cooling and Rise Time Discrimination", 7th European Symposium on Semiconductor Detectors, May 7-10, 1995, Schloss Elmau, Germany.
6. V. I. Ivanov et al., "Spectrometric Characteristic Improvement of CdTe Detectors", IEEE Nuclear Science Symposium, Oct. 30 - Nov. 5, 1994, Norfolk, VA.