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Volumn 376, Issue 1, 1996, Pages 129-138

High-resolution von Hamos crystal X-ray spectrometer

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC PHYSICS; CHARGED PARTICLES; CRYSTALS; ELECTROMAGNETIC WAVE EMISSION; GEOMETRICAL OPTICS; PARTICLE BEAMS; PHOTONS; PLASMA DIAGNOSTICS; TARGETS; X RAY SPECTROSCOPY; X RAYS;

EID: 0030172864     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(96)00262-8     Document Type: Article
Times cited : (139)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.