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Volumn 376, Issue 1, 1996, Pages 129-138
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High-resolution von Hamos crystal X-ray spectrometer
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC PHYSICS;
CHARGED PARTICLES;
CRYSTALS;
ELECTROMAGNETIC WAVE EMISSION;
GEOMETRICAL OPTICS;
PARTICLE BEAMS;
PHOTONS;
PLASMA DIAGNOSTICS;
TARGETS;
X RAY SPECTROSCOPY;
X RAYS;
LOW Z ELEMENTS;
VON HAMOS BRAGG CRYSTAL XRAY SPECTROMETER;
X RAY EMISSION;
X RAY SPECTRA;
Z TARGETS;
X RAY SPECTROMETERS;
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EID: 0030172864
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/0168-9002(96)00262-8 Document Type: Article |
Times cited : (139)
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References (19)
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