Determination of slopes of calibration lines in multi element XRF analysis of thin films using polychromatic excitation from Mo, Au, W, and Cr anodes and one standard

Fresenius' Journal of Analytical Chemistry

Volumn 355, Issue 1, 1996, Pages 83-85

  Coetzee, P P ^a   Oosthuizen, N ^a  

^a UNIVERSITY OF JOHANNESBURG   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; THIN FILMS;

ELEMENTARY ANALYSIS; SLOPE; STANDARD CURVE; THEORETICAL STUDY; X RAY FLUORESCENCE SPECTROMETRY;

ALGORITHMS;

EID: 0030366738     PISSN: 09370633     EISSN: None     Source Type: Journal    
DOI: 10.1007/s0021663550083     Document Type: Article

References (7)

1. Giauque RD, Jaklevic JM (1972) Adv X-Ray Spectrom 15: 164-175
2. Coetzee PP, Lieser KH (1985) Fresenius Z Anal Chem 322: 386-390
3. Coetzee PP (1987) S Afr J Chem 40:119-122
4. Coetzee PP (1987) Fresenius Z Anal Chem 328:23-26
5. Coetzee PP (1993) Fresenius J Anal Chem 347:82-86
6. Bertin EP (1970) Principles and practise of X-ray spectrometric analysis. Plenum Press, New York, p 85
7. Jenkins R, Gould PW, Gedcke D (1981) Quantitative X-ray spectrometry. Dekker, New York, p 54