Mechanically simple flat-crystal x-ray sourceymonochromator

Applied Optics

Volumn 35, Issue 28, 1996, Pages 5714-5721

  Thoe, Robert ^a  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5344278095     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.005714     Document Type: Article

References (4)

1. E. L. Church, H. A. Jenkinson, and J. M. Zavada, “Relationship between surface scattering and microtopographic features,” Opt. Eng. 18, 125-136 (1979).
2. F. E. Christensen, K. P. Singh, and H. W. Schnopper, “Measurements of surface scattering from mirrored surfaces using a triple axis x-ray spectrometer,” in X-Ray Instrumentation in Astronomy, J. L. Culhane, ed., Proc. SPIE 597, 119-127 (1985).
3. E. P. Burtin, Principles and Practice of X-Ray Spectrometric Analysis (Plenum, New York, 1970), pp. 210-214.
4. J. R. Pierce, Theory and Design of Electron Beams (Van Norstrand, New York, 1949), pp. 168-187.