A reexamination of absorption and enhancement effects in X-ray fluorescence trace element analysis

American Mineralogist

Volumn 81, Issue 5-6, 1996, Pages 639-650

  Couture, Rex A ^a   Dymek, Robert F ^a  

^a WASHINGTON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ERRORS; FLUORESCENCE; ORE DEPOSITS; STRONTIUM COMPOUNDS; TRACE ELEMENTS; X RAYS;

COEFFICIENT APPROXIMATION; CONCENTRATION RATIO; ENHANCEMENT EFFECTS; EQUIVALENT WAVELENGTHS; HYDROTHERMAL DEPOSITS; MASS ABSORPTION COEFFICIENT; SECONDARY FLUORESCENCE; TRACE ELEMENT ANALYSIS;

TRACE ANALYSIS;

ABSORPTION; TRACE ELEMENT; XRF;

EID: 0030481179     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am-1996-5-611     Document Type: Article

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