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Volumn 11, Issue 8, 1996, Pages 537-541

Microanalysis of solid samples by laser ablation and total reflection X-ray fluorescence

Author keywords

Laser ablation; Microanalysis of solids; Total reflection X ray fluorescence

Indexed keywords

BINARY ALLOYS; CERAMIC MATERIALS; HIGH TEMPERATURE SUPERCONDUCTORS; LASER ABLATION; OPTICAL RESOLVING POWER; PULSED LASER APPLICATIONS; X RAY LASERS;

EID: 0030212678     PISSN: 02679477     EISSN: None     Source Type: Journal    
DOI: 10.1039/JA9961100537     Document Type: Article
Times cited : (16)

References (41)
  • 16
    • 85033023801 scopus 로고
    • Diagnostic Techniques for Semiconductor Materials and Devices, eds. Shaffner, T. J., and Schroder, D. K.
    • Hockett, R. S., Baumann, S. M., and Schemmel, E. in Diagnostic Techniques for Semiconductor Materials and Devices, eds. Shaffner, T. J., and Schroder, D. K., ECS Proceedings, 1988, 88-20.
    • (1988) ECS Proceedings , pp. 88-120
    • Hockett, R.S.1    Baumann, S.M.2    Schemmel, E.3
  • 22
    • 85032999655 scopus 로고    scopus 로고
    • Offenlegungsschrift, 1992, DE 40 28 044 A 1
    • Bormann, R., and Schwenke, H., Offenlegungsschrift, 1992, DE 40 28 044 A 1.
    • Bormann, R.1    Schwenke, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.