An expert system for qualitative interpretation of wavelength-dispersive X-ray fluorescence spectra

Chemometrics and Intelligent Laboratory Systems

Volumn 32, Issue 1, 1996, Pages 83-93

  Chu, Jizheng ^a   Hu, Shangxu ^a   Tao, Guangyi ^b  

^a ZHEJIANG UNIVERSITY   (China)

^b SHANGHAI INSTITUTE OF CERAMICS   (China)

Author keywords

Data interpretation; Expert system; X ray fluorescence spectra

Indexed keywords

ARTICLE; CHEMOMETRICS; DATA ANALYSIS; EXPERT SYSTEM; PRIORITY JOURNAL; X RAY FLUORESCENCE;

EID: 0029869835     PISSN: 01697439     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-7439(95)00065-8     Document Type: Article

References (6)

1. Ju. Jordanov, Ts. Tsanov, R. Stefanov and N. Jordanov, X-ray Spectrom., 16(6) (1987) 255-259.
2. K. Janssens and P. Van Espen, Anal. Acta, 184 (1986) 117-132.
3. K. Janssens, W. Dorrine and P. Van Espen, Chemom. Intell. Lab. Syst., 4 (1988) 147-161.
4. J. Chu, S. Hu and G. Tao, Chemom. Intell. Lab. Syst., 32 (1996) 73-82.
5. SCICAS (Shanghai Institute of Ceramics, Academia Sinica), Library of the commonly used characteristic lines, private communication, 1990.
6. J. Durkin, Expert Syst., 7(2) (1990) 70-80.