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Volumn 83, Issue 3, 1996, Pages 54-55

PVD processes - X-ray fluorescence (XRF)

Author keywords

[No Author keywords available]

Indexed keywords


EID: 3042953459     PISSN: 03603164     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article
Times cited : (1)

References (2)
  • 1
    • 3042928051 scopus 로고
    • X-ray Spectrometry
    • ASM Metals Handbook, Ninth ed. American Society for Metals
    • D. E. Leyden, "X-ray Spectrometry," Materials Characterization, 10, 82, ASM Metals Handbook, Ninth ed. American Society for Metals (1986).
    • (1986) Materials Characterization , vol.10 , pp. 82
    • Leyden, D.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.