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Volumn 377, Issue 2-3, 1996, Pages 334-339
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X-ray spectroscopy using MOS CCDs
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRON DEVICE MANUFACTURE;
ELECTRON ENERGY LEVELS;
MOS DEVICES;
PERFORMANCE;
X RAY SPECTROSCOPY;
SIGNAL STRENGTH;
X RAY DETECTORS;
CHARGE COUPLED DEVICES;
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EID: 0030214035
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/0168-9002(95)01407-1 Document Type: Article |
Times cited : (16)
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References (15)
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