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Volumn 377, Issue 2-3, 1996, Pages 334-339

X-ray spectroscopy using MOS CCDs

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DEVICE MANUFACTURE; ELECTRON ENERGY LEVELS; MOS DEVICES; PERFORMANCE; X RAY SPECTROSCOPY;

EID: 0030214035     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(95)01407-1     Document Type: Article
Times cited : (16)

References (15)
  • 1
    • 0037692285 scopus 로고
    • A. Wells et al., Proc. SPIE 1549 (1991) 357.
    • (1991) Proc. SPIE , vol.1549 , pp. 357
    • Wells, A.1
  • 9
    • 24244436917 scopus 로고
    • 7th Europ. symp. on semiconductor detectors, Schloss Elmau, Bavaria, Germany
    • these Proceedings
    • M. van den Berg et al., these Proceedings (7th Europ. Symp. on Semiconductor Detectors, Schloss Elmau, Bavaria, Germany, 1995) Nucl. Instr. and Meth. A 377 (1996) 312.
    • (1995) Nucl. Instr. and Meth. A , vol.377 , pp. 312
    • Van Den Berg, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.