Reflectance of a wideband multilayer x-ray mirror at normal and grazing incidences

Applied Optics

Volumn 35, Issue 22, 1996, Pages 4408-4412

  Seely, J F ^a   Kowalski, M P ^a   Hunter, W R ^b   Gutman, G ^c  

^a NAVAL RESEARCH LABORATORY   (United States)

^b ISFAC   (United States)

^c Osmic Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001536312     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.35.004408     Document Type: Article

References (17)

1. S. Heavens and H. M. Liddell, “Staggered broad-band reflecting multilayers,” Appl. Opt. 5, 373-376 (1966).
2. D. J. Nagel, J. V. Gilfrich, and T. W. Barbee, Jr., “Bragg dif-fractors with graded-thickness multilayers,” Nucl. Instrum. Methods 195, 63-65 (1982).
3. J. F. Meekins, R. G. Cruddace, and H. Gursky, “Optimization of layered synthetic microstructures for narrowband reflectivity at soft x-ray and EUV wavelengths,” Appl. Opt. 25, 2757-2763 (1986).
4. J. F. Meekins, R. G. Cruddace, and H. Gursky, “Optimization of layered synthetic microstructures for broadband reflectivity at soft x-ray and EUV wavelengths,” Appl. Opt. 26, 990-994 (1987).
5. E. Gu, G. V. Marr, and M. A. Player, “Optimization of reflectivity of periodic and quasiperiodic multilayer films at soft x-ray wavelengths,” Opt. Commun. 77, 99-106 (1990).
6. F. Mezei, “Novel polarized neutron devices: supermirror and spin component amplifier,” Commun. Phys. 1, 81 (1976).
7. J. Wood, “Status of supermirror research at OSMC,” in Neutron Optical Devices and Applications, C. F. Majkrzak and J. L. Wood, ed., Proc. SPIE 1738, 22 (1992).
8. P. Vernon, D. G. Stearns, and R. S. Rosen, “Chirped multilayer coatings for increased x-ray throughput,” Opt. Lett. 18, 672-674 (1993).
9. K. D. Joensen, P. Hoghoj, F. Christenson, P. Gorenstein, J. Susini, E. Ziegler, A. Freund, and J. Wood, “Multilayered supermirror structures for hard x-ray synchrotron and astrophysics instrumentation,” in Multilayer and Grazing Incidence X-Ray/EUV Optics II, R. B. Hoover and A. B. Walker, ed., Proc. SPIE 2011, 360-372 (1993).
10. 4C multilayer x-ray mirrors,” in X-Ray Multilayers in Diffractometers, Monochromators, and Spectrometers, F. E. Christensen, ed., Proc. SPIE 984, 64-74 (1988).
11. 4C multilayers,” J. Vac. Sci. Technol. A 7, 2914-2918 (1989).
12. 4C multilayer mirrors in the 34-50 Ä wavelength region,” Appl. Opt. 32, 3541-3543 (1993).
13. W. R. Hunter, R. T. Williams, J. C. Rife, J. P. Kirkland, and M. N. Kabler, “A grating/crystal monochromator for the spectral range 5 eV to 5 keV,” Nucl. Instrum. Methods 195, 141-153 (1982).
14. W. R. Hunter and J. C. Rife, “An ultrahigh vacuum reflecto-meter/goniometer for use with synchrotron radiation,” Nucl. Instrum. Methods A 246, 465-468 (1986).
15. J. C. Rife, H. R. Sadeghi, and W. R. Hunter, “Upgrades and recent performance of the grating/crystal monochromator,” Rev. Sci. Instrum. 60, 2064-2067 (1989).
16. P. Kowalski, R. G. Cruddace, J. F. Seely, J. C. Rife, and W. R. Hunter, “Uncertainties in reflectance measurements made on the NRL beamline X24C,” NRL Memorandum Rep. 7620-95-7738 (Naval Research Laboratory, Washington, D.C., 1995).
17. B. L. Henke, E. M. Gullikson, and J. C. Davis, “X-ray interactions: photoabsorption, scattering, transmission, and reflection at E=50-30, 000 eV, Z= 1-92,” At. Data Nucl. Data Tables 54, 181-342 (1993).