Algorithm for fitting XRF, SEM and PIXE X-ray spectra backgrounds

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 109-110, Issue , 1996, Pages 209-213

  Kneen, M A ^a   Annegarn, H J ^a  

^a UNIVERSITY OF THE WITWATERSRAND   (South Africa)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ATMOSPHERIC AEROSOLS; FLUORESCENCE; POLYNOMIALS; SCANNING ELECTRON MICROSCOPY; SPECTRUM ANALYSIS; X RAY SPECTROMETERS;

PARTICLE INDUCED X RAY EMISSION (PIXE); X RAY FLUORESCENCE (XRF);

X RAY ANALYSIS;

EID: 4243224597     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)00908-6     Document Type: Article

References (3)

1. M. Cross and A.O. Moscardini, Learning the art of Mathematical Modelling (Ellis Horwood, Chichester, 1985).
2. I. Pitas and A.N. Venetsanopoulos, Nonlinear Digital filters. Principles and Applications (Kluwer, Dordrecht, 1991).
3. C.L. Dym and E.S. Ivey, Principles of Mathematical Modeling (Academic Press, New York, 1980).