Silicon drift detectors for high resolution room temperature X-ray spectroscopy

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 377, Issue 2-3, 1996, Pages 346-351

  Lechner, Peter ^b   Eckbauer, Stefan ^a   Hartmann, Robert ^a   Krisch, Susanne ^b   Hauff, Dieter ^a   Richter, Rainer ^a   Soltau, Heike ^b   Strüder, Lothar ^a   Fiorini, Carlo ^c   Gatti, Emilio ^c   Longoni, Antonio ^c   Sampietro, Marco ^c  

^a MPI HALBLEITERLABOR   (Germany)

^b KETEK GMBH   (Germany)

^c POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; AMPLIFIERS (ELECTRONIC); COMPUTER SIMULATION; DIGITAL FILTERS; INTEGRATED CIRCUITS; ION IMPLANTATION; LEAKAGE CURRENTS; SILICON SENSORS; VOLTAGE DIVIDERS; X RAY SPECTROSCOPY;

BACK CONTACT; DETECTOR VOLUME; ENERGY RESOLUTION; EQUIPOTENTIAL; FIELD STRIPS; GAUSSIAN SHAPING; SILICON DRIFT DETECTORS;

RADIATION DETECTORS;

EID: 0030214002     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(96)00210-0     Document Type: Article

References (6)

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5. R. Hartmann, these Proceedings (7th Europ. Symp. on Semi-conductor Detectors, Schloss Elmau, Bavaria, Germany, 1995) Nucl. Instr. and Meth. A. 377 (1996) 191.
6. M. Sampietro, A. Geraci, A. Fazzi and P. Lechner, Rev. Sci. Instr. 66 (1995) 5381.