Glancing incident MeV ion beams for total reflection PIXE (TPIXE) and RBS surface analysis

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 113, Issue 1-4, 1996, Pages 373-377

  Van Kan, J A ^a   Vis, R D ^a  

^a VU UNIVERSITY AMSTERDAM   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; COPPER; GOLD; ION BEAMS; MATHEMATICAL MODELS; PROTONS; REFLECTION; RUTHERFORD BACKSCATTERING SPECTROSCOPY; X RAYS;

ATOMIC LAYER DEPTH RESOLUTION; INCIDENT ANGLES; ION SURFACE INTERACTION POTENTIAL; PROTON BEAMS; SURFACE BARRIER DETECTORS; TOTAL REFLECTION PARTICLE INDUCED X RAY EMISSION;

SURFACES;

EID: 0030166170     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)01355-5     Document Type: Article

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