A high resolution, 6 channels, silicon drift detector array with integrated JFET's designed for XAFS spectroscopy: First X-ray fluorescence excitation spectra recorded at the ESRF

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 382, Issue 3, 1996, Pages 524-532

  Gauthier, Ch ^a   Goulon, J ^a   Moguiline, E ^a   Rogalev, A ^a   Lechner, P ^b   Struder L ^b   Fiorini, C ^c   Longoni, A ^c   Sampietro, M ^c   Besch, H ^d   Pfitzner, R ^d   Schenk, H ^d   Tafelmeier, U ^d   Walenta, A ^d   Misiakos, K ^e   Kavadias, S ^e   Loukas, D ^e  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b MPI HALBLEITERLABOR   (Germany)

^c POLITECNICO DI MILANO   (Italy)

^d UNIVERSITY OF SIEGEN   (Germany)

^e INSTITUTE OF MICROELECTRONICS   (Greece)

Author keywords

Silicon drift detectors; X ray absorption fine structures; X ray energy resolved detectors; X ray fluorescence

Indexed keywords

CERIUM; FLUORESCENCE; JUNCTION GATE FIELD EFFECT TRANSISTORS; RADIATION COUNTERS; SILICON SENSORS; X RAY SPECTROSCOPY;

SILICON DRIFT DIODE (SDD); X RAY ABSORPTION FINE STRUCTURES (XFAS); X RAY ENERGY RESOLVED DETECTORS; X RAY FLUORESCENCE EXCITATION SPECTROSCOPY;

RADIATION DETECTORS;

EID: 0030284266     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-9002(96)00814-5     Document Type: Article

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