A perfect crystal X-ray analyser with meV energy resolution

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 111, Issue 1-2, 1996, Pages 181-186

  Masciovecchio, C ^a   Bergmann, U ^a   Krisch, M ^a   Ruocco, G ^b   Sette, F ^a   Verbeni, R ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b UNIVERSITY OF L'AQUILA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER CONTROL; CRYSTALS; ELECTRON SCATTERING; ETCHING; FOCUSING; LIGHT REFLECTION; SILICON WAFERS; SUBSTRATES; X RAY ANALYSIS;

BRAGG REFLECTIONS; COMPUTER CONTROLLED GLUEING; CRYSTAL X RAY ENERGY ANALYSER; HIGH ENERGY RESOLUTION X RAY SCATTERING; X RAY ANALYSER;

X RAY APPARATUS;

EID: 0030122910     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(95)01288-5     Document Type: Article

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