Soft x-ray (2 to 6 keV) spectroscopy using gratings at extreme grazing incidence

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2805, Issue , 1996, Pages 260-266

  Boscolo, Alessio ^a   Poletto, Luca ^a   Tondello, Giuseppe ^a  

^a UNIVERSITY OF PADOVA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CHANNEL ELECTRON MULTIPLIERS; EXTREME GRAZING INCIDENCE; ION ETCHED BLAZE GRATINGS; ROWLAND GEOMETRY; SOFT X RAY SPECTROSCOPY;

EFFICIENCY; ELECTRON MULTIPLIERS; OPTICAL DEVICES; X RAY SPECTROSCOPY;

DIFFRACTION GRATINGS;

EID: 0029747978     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)