Effect of the critical current density and the junction size on the leakage current of Nb/Al-AlOx/Nb superconducting tunnel junctions for radiation detection

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 35, Issue 5 SUPPL. A, 1996, Pages 2633-2637

  Joosse, Koen ^a   Nakagawa, Hiroshi ^a   Akoh, Hiroshi ^a   Takada, Susumu ^a   Maehata, Keisuke ^b   Ishibashi, Kenji ^b  

^a ELECTROTECHNICAL LABORATORY   (Japan)

^b KYUSHU UNIVERSITY   (Japan)

Author keywords

Leakage current; Superconducting tunnel junction; X ray detection

Indexed keywords

CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CURRENT VOLTAGE CHARACTERISTICS; ELECTRODES; ELECTRON TUNNELING; FABRICATION; JOSEPHSON JUNCTION DEVICES; LEAKAGE CURRENTS; MORPHOLOGY; OPTIMIZATION; RADIATION DETECTORS; SURFACES;

JUNCTION SIZE; SUPERCONDUCTING TUNNEL JUNCTIONS; SURFACE MORPHOLOGY ANALYSIS;

TUNNEL JUNCTIONS;

EID: 0030142120     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.2633     Document Type: Article

References (15)

1. Proc. Workshop on X-ray Detection by Superconducting Tunnel Junctions, Naples 12-14 Dec. 1990, eds. A. Barone, R. Cristiano and S. Pagano (World Scientific, Singapore, 1991).
2. N. Rando, A. Peacock, C. Foden, A. van Dordrecht, J. Lumley and C. Pereira: J. Appl. Phys. 73 (1993) 5098.
3. G. W. Fraser: Proc. Workshop on X-ray Detection by Superconducting Tunnel Junctions, Naples 12-14 Dec. 1990, eds. A. Barone, R. Cristiano and S. Pagano (World Scientific, Singapore, 1991) p. 1.
4. C. A. Mears, S. E. Labov, M. Frank, M. A. Lindeman, L. H. Hiller, H. Netel and A. T. Barfknecht: presented at 6th Conf. Low Temperature Detectors, Beatenberg, Switzerland, 1995, to be published in Nucl. Instrum. & Methods.
5. C. A. Mears, S. E. Labov, M. Frank, M. A. Lindeman, L. H. Hiller, H. Netel and A. T. Barfknecht: presented at 6th Conf. Low Temperature Detectors, Beatenberg, Switzerland, 1995, to be published in Nucl. Instrum. & Methods.
6. A. Matsumura, T. Takahashi and M. Kurakado: J. Appl. Phys. 76 (1994) 4761.
7. P. Verhoeve, N. Rando, P. Videler, A. Peacock, A. van Dordrecht, D. J. Goldie, J. M. Lumley, J. Hewlett, M. Wallis and R. Venn: Proc. SPIE Conf., San Diego, 1994.
8. D. J. Goldie, P. L. Brink, C. Patel, N. E. Booth and G. L. Salmon: Appl. Phys, Lett. 64 (1994) 3169.
9. N. Rando, P. Videler, A. Peacock, A. van Dordrecht, P. Verhoeve, R. Venn, A. C. Wright and J. Lumley: J. Appl. Phys. 77 (1995) 4099.
10. H. Nakagawa, G. Pepe, H. Akoh, L. Frunzio, R. Cristiano, E. Esposito, S. Pagano, G. Peluso, A. Barone and S. Takada: Jpn. J. Appl. Phys. 32 (1993) 4535.
11. A. W. Kleinsasser, R. E. Miller, W. H. Mallison and G. B. Arnold: Phys. Rev. Lett. 72 (1994) 1738.
12. E. C. G. Kirk, M. G. Blamire, R. E. Somekh, J. E. Evetts, D. Van Vechten and M. N. Lovellette: IEEE Trans. Magn. 27 (1991) 3137.
13. H. Nakagawa, K. Nakaya, I. Kurosawa, S. Takada and H. Hayakawa: Jpn. J. Appl. Phys. 25 (1986) L70.
14. K. Joosse, H. Nakagawa, H. Akoh, S. Takada, K. Maehata and K. Ishibashi: Appl. Phys. Lett. 68 (1996) 702.
15. J. Halbritter: Appl. Phys. A 43 (1987) 1.