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Volumn 88, Issue 2, 2013, Pages 171-211

Surface science, MEMS and NEMS: Progress and opportunities for surface science research performed on, or by, microdevices

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITIVE DISPLACEMENT DETECTION; ELECTRO-MECHANICAL ACTUATIONS; HIGH SURFACE-TO-VOLUME RATIO; MECHANICAL FUNCTIONALITY; MINIATURE MECHANICAL COMPONENTS; NANO ELECTROMECHANICAL SYSTEMS; NANO-DEVICE FABRICATION; SURFACE SCIENCE STUDIES;

EID: 84877058176     PISSN: 00796816     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.progsurf.2013.03.001     Document Type: Review
Times cited : (107)

References (164)
  • 1
    • 0002982888 scopus 로고
    • There's plenty of room at the bottom
    • R. Feynman There's plenty of room at the bottom Eng. Sci. 23 1960 22 36
    • (1960) Eng. Sci. , vol.23 , pp. 22-36
    • Feynman, R.1
  • 2
    • 78249257581 scopus 로고    scopus 로고
    • 'Penty of room' - Fifty years after the Feynman lecture
    • V.T. Yadugiri, and R. Malhotra 'Penty of room' - fifty years after the Feynman lecture Curr. Sci. 99 2010 900 907
    • (2010) Curr. Sci. , vol.99 , pp. 900-907
    • Yadugiri, V.T.1    Malhotra, R.2
  • 3
    • 0033693245 scopus 로고    scopus 로고
    • IC-Compatible polysilicon surface micromachining
    • J.J. Sniegowski, and M.P. de Boer IC-Compatible polysilicon surface micromachining Annu. Rev. Mater. Sci. 30 2000 299 333
    • (2000) Annu. Rev. Mater. Sci. , vol.30 , pp. 299-333
    • Sniegowski, J.J.1    De Boer, M.P.2
  • 4
    • 0037051006 scopus 로고    scopus 로고
    • Surface science and the atomic-scale origins of friction: What once was old is new again
    • J. Krim Surface science and the atomic-scale origins of friction: what once was old is new again Surf. Sci. 500 2002 741 758
    • (2002) Surf. Sci. , vol.500 , pp. 741-758
    • Krim, J.1
  • 5
    • 78650567591 scopus 로고    scopus 로고
    • J J Thomson and the discovery of the electron
    • I. Falconer J J Thomson and the discovery of the electron Phys. Educ. 32 1997 226
    • (1997) Phys. Educ. , vol.32 , pp. 226
    • Falconer, I.1
  • 6
    • 0000431143 scopus 로고
    • Early applications of vacuum form Aristotle to Langmuir
    • T.E. Madey Early applications of vacuum form Aristotle to Langmuir J. Vac. Sci. Technol. A 2 1984 110 117
    • (1984) J. Vac. Sci. Technol. A , vol.2 , pp. 110-117
    • Madey, T.E.1
  • 7
    • 4244111185 scopus 로고
    • Tunneling through a controllable vacuum gap
    • G. Binnig, H. Rohrer, and C. Gerber Tunneling through a controllable vacuum gap Appl. Phys. Lett. 40 1982 178 180
    • (1982) Appl. Phys. Lett. , vol.40 , pp. 178-180
    • Binnig, G.1    Rohrer, H.2    Gerber, C.3
  • 10
    • 84870827396 scopus 로고    scopus 로고
    • Molecular dynamics simulations of alkylsilane monolayers on silica nanoasperities: Impact of surface curvature on monolayer structure and pathways for energy dissipation in tribological contacts
    • B.W. Ewers, and J.D. Batteas Molecular dynamics simulations of alkylsilane monolayers on silica nanoasperities: impact of surface curvature on monolayer structure and pathways for energy dissipation in tribological contacts J. Phys. Chem. C 116 2012 25165 25177
    • (2012) J. Phys. Chem. C , vol.116 , pp. 25165-25177
    • Ewers, B.W.1    Batteas, J.D.2
  • 12
    • 65249188718 scopus 로고    scopus 로고
    • Disorder in alkylsilane monolayers assembled on surfaces with nanoscopic curvature
    • R.L. Jones, N.C. Pearsall, and J.D. Batteas Disorder in alkylsilane monolayers assembled on surfaces with nanoscopic curvature J. Phys. Chem. C 113 2009 4507 4514
    • (2009) J. Phys. Chem. C , vol.113 , pp. 4507-4514
    • Jones, R.L.1    Pearsall, N.C.2    Batteas, J.D.3
  • 13
    • 0033897055 scopus 로고    scopus 로고
    • Materials issues in microelectromechanical systems (MEMS)
    • S.M. Spearing Materials issues in microelectromechanical systems (MEMS) Acta Mater. 48 2000 179 196
    • (2000) Acta Mater. , vol.48 , pp. 179-196
    • Spearing, S.M.1
  • 15
    • 0141883074 scopus 로고    scopus 로고
    • Surface micromachining: A brief introduction
    • M. Mehregany, and C.A. Zorman Surface micromachining: a brief introduction MRS Bull. 26 2001 289 290
    • (2001) MRS Bull. , vol.26 , pp. 289-290
    • Mehregany, M.1    Zorman, C.A.2
  • 16
    • 0347603968 scopus 로고    scopus 로고
    • Applications of LIGA technology to precision manufacturing of high-aspect-ratio micro-components and -systems: A review
    • C.K. Malek, and V. Salle Applications of LIGA technology to precision manufacturing of high-aspect-ratio micro-components and -systems: a review Microelectron. J. 35 2004 131 143
    • (2004) Microelectron. J. , vol.35 , pp. 131-143
    • Malek, C.K.1    Salle, V.2
  • 19
    • 0029325709 scopus 로고
    • Effects of elevated temperature treatments in microstructure release procedures
    • T. Abe, W.C. Messner, and M.L. Reed Effects of elevated temperature treatments in microstructure release procedures J. Microelectromech. Syst. 4 1995 66 75
    • (1995) J. Microelectromech. Syst. , vol.4 , pp. 66-75
    • Abe, T.1    Messner, W.C.2    Reed, M.L.3
  • 23
    • 0030705026 scopus 로고    scopus 로고
    • Applications for surface-micromachined polysilicon thermal actuators and arrays
    • J.H. Comtois, and V.M. Bright Applications for surface-micromachined polysilicon thermal actuators and arrays Sens. Actuators A 58 1997 19 25
    • (1997) Sens. Actuators A , vol.58 , pp. 19-25
    • Comtois, J.H.1    Bright, V.M.2
  • 24
    • 84864688369 scopus 로고    scopus 로고
    • Electro-thermal MEMS switch with latching mechanisms: Design and characterization
    • J.J. Khazaai, and H.W. Qu Electro-thermal MEMS switch with latching mechanisms: design and characterization IEEE Sens. J. 12 2012 2830 2838
    • (2012) IEEE Sens. J. , vol.12 , pp. 2830-2838
    • Khazaai, J.J.1    Qu, H.W.2
  • 25
    • 49749083134 scopus 로고    scopus 로고
    • Tribological degradation of fluorocarbon coated silicon microdevice surfaces in normal and sliding contact
    • D.A. Hook, J.S. Timpe, M.T. Dugger, and J. Krim Tribological degradation of fluorocarbon coated silicon microdevice surfaces in normal and sliding contact J. Appl. Phys. 104 2008 034303
    • (2008) J. Appl. Phys. , vol.104 , pp. 034303
    • Hook, D.A.1    Timpe, J.S.2    Dugger, M.T.3    Krim, J.4
  • 26
    • 77952673357 scopus 로고    scopus 로고
    • A nano- to macroscale tribological study of PFTS and TCP lubricants for Si MEMS applications
    • B.P. Miller, N.D. Theodore, M.J. Brukman, K.J. Wahl, and J. Krim A nano- to macroscale tribological study of PFTS and TCP lubricants for Si MEMS applications Tribol. Lett. 38 2011 69 78
    • (2011) Tribol. Lett. , vol.38 , pp. 69-78
    • Miller, B.P.1    Theodore, N.D.2    Brukman, M.J.3    Wahl, K.J.4    Krim, J.5
  • 28
    • 70349678704 scopus 로고    scopus 로고
    • Sliding friction measurements of molecularly thin ethanol and pentanol films: How friction and spreading impact lubricity
    • B.P. Miller, and J. Krim Sliding friction measurements of molecularly thin ethanol and pentanol films: how friction and spreading impact lubricity J. Low Temp. Phys. 157 2009 252 267
    • (2009) J. Low Temp. Phys. , vol.157 , pp. 252-267
    • Miller, B.P.1    Krim, J.2
  • 30
  • 31
    • 26444523574 scopus 로고    scopus 로고
    • Thermal budget limits of quarter micrometer foundry CMOS for post processing MEMS devices
    • H. Takeuchi, A. Wung, X. Sun, R.T. Howe, and T.J. King Thermal budget limits of quarter micrometer foundry CMOS for post processing MEMS devices IEEE Trans. Electron Devices 52 2005 2081 2086
    • (2005) IEEE Trans. Electron Devices , vol.52 , pp. 2081-2086
    • Takeuchi, H.1    Wung, A.2    Sun, X.3    Howe, R.T.4    King, T.J.5
  • 32
    • 0034514764 scopus 로고    scopus 로고
    • RF MEMS from a device perspective
    • J.J. Yao RF MEMS from a device perspective J. Micromech. Microeng. 10 2000 R9 R38
    • (2000) J. Micromech. Microeng. , vol.10
    • Yao, J.J.1
  • 33
    • 0346972939 scopus 로고    scopus 로고
    • A switched high-T-c superconductor microstrip resonator using a MEM switch
    • J. Noel, Y. Hijazi, Y.A. Vlasov, and G.L. Larkins A switched high-T-c superconductor microstrip resonator using a MEM switch Supercond. Sci. Technol. 16 2003 1438 1441
    • (2003) Supercond. Sci. Technol. , vol.16 , pp. 1438-1441
    • Noel, J.1    Hijazi, Y.2    Vlasov, Y.A.3    Larkins, G.L.4
  • 34
    • 22044433018 scopus 로고    scopus 로고
    • Highly-selective electronically-tunable cryogenic filters using monolithic, discretely-switchable MEMS capacitor arrays
    • E.M. Prophet, J. Musolf, B.F. Zuck, S. Jimenez, K.E. Kihlstrom, and B.M.A. Willemsen Highly-selective electronically-tunable cryogenic filters using monolithic, discretely-switchable MEMS capacitor arrays IEEE Trans. Appl. Supercond. 15 2005 956 959
    • (2005) IEEE Trans. Appl. Supercond. , vol.15 , pp. 956-959
    • Prophet, E.M.1    Musolf, J.2    Zuck, B.F.3    Jimenez, S.4    Kihlstrom, K.E.5    Willemsen, B.M.A.6
  • 35
    • 34748865043 scopus 로고    scopus 로고
    • Surface roughness, asperity contact and gold RFMEMS switch behavior
    • O. Rezvanian, M.A. Zikry, C. Brown, and J. Krim Surface roughness, asperity contact and gold RFMEMS switch behavior J. Micromech. Microeng. 17 2007 2006 2015
    • (2007) J. Micromech. Microeng. , vol.17 , pp. 2006-2015
    • Rezvanian, O.1    Zikry, M.A.2    Brown, C.3    Krim, J.4
  • 36
    • 16544382979 scopus 로고    scopus 로고
    • Review of radio frequency microelectromechanical systems technology
    • S. Lucyszyn Review of radio frequency microelectromechanical systems technology IEEE Proc.: Sci. Meas. Technol. 151 2004 93 103
    • (2004) IEEE Proc.: Sci. Meas. Technol. , vol.151 , pp. 93-103
    • Lucyszyn, S.1
  • 39
    • 35348854382 scopus 로고    scopus 로고
    • Contact resistance study of noble metals and alloy films using a scanning probe microscope test station
    • L. Chen, H. Lee, Z.J. Guo, N.E. McGruer, K.W. Gilbert, S. Mall, K.D. Leedy, and G.G. Adams Contact resistance study of noble metals and alloy films using a scanning probe microscope test station J. Appl. Phys. 102 2007 074910
    • (2007) J. Appl. Phys. , vol.102 , pp. 074910
    • Chen, L.1    Lee, H.2    Guo, Z.J.3    McGruer, N.E.4    Gilbert, K.W.5    Mall, S.6    Leedy, K.D.7    Adams, G.G.8
  • 40
    • 84859295185 scopus 로고    scopus 로고
    • Impact of adsorbed organic monolayers on vacuum electron tunneling contributions to electrical resistance at an asperity contact
    • D. Berman, M.J. Walker, C.D. Nordquist, and J. Krim Impact of adsorbed organic monolayers on vacuum electron tunneling contributions to electrical resistance at an asperity contact J. Appl. Phys. 110 2011 114307
    • (2011) J. Appl. Phys. , vol.110 , pp. 114307
    • Berman, D.1    Walker, M.J.2    Nordquist, C.D.3    Krim, J.4
  • 43
    • 34147138241 scopus 로고    scopus 로고
    • Electrical contact resistance degradation of a hot-switched simulated metal MEMS contact
    • D.J. Dickrell, and M.T. Dugger Electrical contact resistance degradation of a hot-switched simulated metal MEMS contact IEEE Trans. Compon. Packag. Technol. 30 2007 75 80
    • (2007) IEEE Trans. Compon. Packag. Technol. , vol.30 , pp. 75-80
    • Dickrell, D.J.1    Dugger, M.T.2
  • 44
    • 42549152122 scopus 로고    scopus 로고
    • Modeling, simulation and measurement of the dynamic performance of an ohmic contact, electrostatically actuated RF MEMS switch
    • Z.J. Guo, N.E. McGruer, and G.G. Adams Modeling, simulation and measurement of the dynamic performance of an ohmic contact, electrostatically actuated RF MEMS switch J. Micromech. Microeng. 17 2007 1899 1909
    • (2007) J. Micromech. Microeng. , vol.17 , pp. 1899-1909
    • Guo, Z.J.1    McGruer, N.E.2    Adams, G.G.3
  • 47
    • 0035894080 scopus 로고    scopus 로고
    • Measuring nanomechanical properties of a dynamic contact using an indenter probe and quartz crystal microbalance
    • B. Borovsky, J. Krim, S.A. Syed Asif, and K.J. Wahl Measuring nanomechanical properties of a dynamic contact using an indenter probe and quartz crystal microbalance J. Appl. Phys. 90 2001 6391 6396
    • (2001) J. Appl. Phys. , vol.90 , pp. 6391-6396
    • Borovsky, B.1    Krim, J.2    Syed Asif, S.A.3    Wahl, K.J.4
  • 48
    • 70450230497 scopus 로고    scopus 로고
    • Tribo-induced melting transition at a sliding asperity contact
    • B. Dawson, S. Lee, and J. Krim Tribo-induced melting transition at a sliding asperity contact Phys. Rev. Lett. 103 2009 205502
    • (2009) Phys. Rev. Lett. , vol.103 , pp. 205502
    • Dawson, B.1    Lee, S.2    Krim, J.3
  • 49
    • 84864996533 scopus 로고    scopus 로고
    • Friction and energy dissipation mechanisms in adsorbed molecules and molecularly thin films
    • J. Krim Friction and energy dissipation mechanisms in adsorbed molecules and molecularly thin films Adv. Phys. 61 2012 155 323
    • (2012) Adv. Phys. , vol.61 , pp. 155-323
    • Krim, J.1
  • 52
  • 54
    • 77955230194 scopus 로고    scopus 로고
    • Status review of the science and technology of ultrananocrystalline diamond (UNCD) films and applications to multifunctional devices
    • O. Auciello, and A.V. Sumant Status review of the science and technology of ultrananocrystalline diamond (UNCD) films and applications to multifunctional devices Diam. Relat. Mater. 19 2010 699 718
    • (2010) Diam. Relat. Mater. , vol.19 , pp. 699-718
    • Auciello, O.1    Sumant, A.V.2
  • 56
    • 0242368168 scopus 로고    scopus 로고
    • The effects of film structure and surface hydrogen on the properties of amorphous carbon films
    • G.T. Gao, P.T. Mikulski, G.M. Chateauneuf, and J.A. Harrison The effects of film structure and surface hydrogen on the properties of amorphous carbon films J. Phys. Chem. B 107 2003 11082 11090
    • (2003) J. Phys. Chem. B , vol.107 , pp. 11082-11090
    • Gao, G.T.1    Mikulski, P.T.2    Chateauneuf, G.M.3    Harrison, J.A.4
  • 58
    • 77952274807 scopus 로고    scopus 로고
    • Ultrananocrystalline and nanocrystalline diamond thin films for MEMS/NEMS applications
    • A.V. Sumant, O. Auciello, R.W. Carpick, S. Srinivasan, and J.E. Butler Ultrananocrystalline and nanocrystalline diamond thin films for MEMS/NEMS applications MRS Bull. 35 2010 281 288
    • (2010) MRS Bull. , vol.35 , pp. 281-288
    • Sumant, A.V.1    Auciello, O.2    Carpick, R.W.3    Srinivasan, S.4    Butler, J.E.5
  • 60
    • 34047127366 scopus 로고    scopus 로고
    • Piezoelectric/ultrananocrystalline diamond heterostructures for high-performance multifunctional micro/nanoelectromechanical systems
    • S. Sudarsan, J. Hiller, B. Kabius, and O. Auciello Piezoelectric/ ultrananocrystalline diamond heterostructures for high-performance multifunctional micro/nanoelectromechanical systems Appl. Phys. Lett. 90 2007 134101
    • (2007) Appl. Phys. Lett. , vol.90 , pp. 134101
    • Sudarsan, S.1    Hiller, J.2    Kabius, B.3    Auciello, O.4
  • 61
    • 78650269301 scopus 로고    scopus 로고
    • Suspended single-crystal diamond nanowires for high-performance nanoelectromechanical switches
    • M.Y. Liao, S. Hishita, E. Watanabe, S. Koizumi, and Y. Koide Suspended single-crystal diamond nanowires for high-performance nanoelectromechanical switches Adv. Mater. 22 2010 5393 5397
    • (2010) Adv. Mater. , vol.22 , pp. 5393-5397
    • Liao, M.Y.1    Hishita, S.2    Watanabe, E.3    Koizumi, S.4    Koide, Y.5
  • 64
    • 5044240171 scopus 로고
    • Folded Stern-Gerlach experiment as a means for detecting nuclear magnetic resonance in individual nuclei
    • J.A. Sidles Folded Stern-Gerlach experiment as a means for detecting nuclear magnetic resonance in individual nuclei Phys. Rev. Lett. 68 1992 1124 1127
    • (1992) Phys. Rev. Lett. , vol.68 , pp. 1124-1127
    • Sidles, J.A.1
  • 65
    • 79959655390 scopus 로고    scopus 로고
    • Switching individual molecules by light and electrons: From isomerisation to chirality fip
    • K. Morgenstern Switching individual molecules by light and electrons: from isomerisation to chirality fip Prog. Surf. Sci. 86 2011 115 161
    • (2011) Prog. Surf. Sci. , vol.86 , pp. 115-161
    • Morgenstern, K.1
  • 70
    • 84863600648 scopus 로고    scopus 로고
    • Impact of oxygen and argon plasma exposure on the roughness of gold film surfaces
    • D. Berman, and J. Krim Impact of oxygen and argon plasma exposure on the roughness of gold film surfaces Thin Solid Films 520 2012 6201 6206
    • (2012) Thin Solid Films , vol.520 , pp. 6201-6206
    • Berman, D.1    Krim, J.2
  • 72
    • 0347691909 scopus 로고
    • Surfactant-induced layer-by-layer growth of Ag on Ag (111): Origins and side effects
    • J. Vrijmoeth, H.A. van der Vegt, J.A. Meyer, E. Vlieg, and R.J. Behm Surfactant-induced layer-by-layer growth of Ag on Ag (111): origins and side effects Phys. Rev. Lett. 72 1994 3843 3846
    • (1994) Phys. Rev. Lett. , vol.72 , pp. 3843-3846
    • Vrijmoeth, J.1    Van Der Vegt, H.A.2    Meyer, J.A.3    Vlieg, E.4    Behm, R.J.5
  • 73
    • 3843097927 scopus 로고
    • Stable growth and kinetic roughening in electrochemical deposition
    • A. Iwamoto, T. Yoshinobu, and H. Iwasaki Stable growth and kinetic roughening in electrochemical deposition Phys. Rev. Lett. 72 1994 4025 4028
    • (1994) Phys. Rev. Lett. , vol.72 , pp. 4025-4028
    • Iwamoto, A.1    Yoshinobu, T.2    Iwasaki, H.3
  • 74
    • 0000884236 scopus 로고
    • Experimental observations of self-affine scaling and kinetic roughening at sub-micron lengthscales
    • J. Krim, and G. Palasantzas Experimental observations of self-affine scaling and kinetic roughening at sub-micron lengthscales Int. J. Mod. Phys. 9 1995 599 632
    • (1995) Int. J. Mod. Phys. , vol.9 , pp. 599-632
    • Krim, J.1    Palasantzas, G.2
  • 75
    • 0031097281 scopus 로고    scopus 로고
    • Origins of scale invariance in growth processes
    • J. Krug Origins of scale invariance in growth processes Adv. Phys. 46 1997 139 282
    • (1997) Adv. Phys. , vol.46 , pp. 139-282
    • Krug, J.1
  • 76
    • 70349664323 scopus 로고    scopus 로고
    • Quantum size effects in the growth, coarsening and properties of ultra-thin metal films and related nanostructures
    • M.M. Özer, Cai-Zhuang Wangr, Zhenyu Zhang, and H.H. Weitering Quantum size effects in the growth, coarsening and properties of ultra-thin metal films and related nanostructures J. Low Temp. Phys. 157 2009 221 251
    • (2009) J. Low Temp. Phys. , vol.157 , pp. 221-251
    • Özer, M.M.1    Wangr, C.-Z.2    Zhang, Z.3    Weitering, H.H.4
  • 79
    • 77956666533 scopus 로고    scopus 로고
    • Spatially correlated microstructure and superconductivity in polycrystalline boron-doped diamond
    • F. Dahlem, P. Achatz, O.A. Williams, D. Araujo, and H. Courtois Spatially correlated microstructure and superconductivity in polycrystalline boron-doped diamond Phys. Rev. B 82 2010 033306
    • (2010) Phys. Rev. B , vol.82 , pp. 033306
    • Dahlem, F.1    Achatz, P.2    Williams, O.A.3    Araujo, D.4    Courtois, H.5
  • 81
    • 33745245281 scopus 로고    scopus 로고
    • Thermal transport and grain boundary conductance in ultrananocrystalline diamond thin films
    • M.A. Angadi, T. Watanabe, A. Bodapati, X. Xiao, and O. Auciello Thermal transport and grain boundary conductance in ultrananocrystalline diamond thin films J. Appl. Phys. 99 2006 114301
    • (2006) J. Appl. Phys. , vol.99 , pp. 114301
    • Angadi, M.A.1    Watanabe, T.2    Bodapati, A.3    Xiao, X.4    Auciello, O.5
  • 82
    • 3943070464 scopus 로고    scopus 로고
    • Critical review: Adhesion in surface micromechanical structures
    • R. Maboudian, and R.T. Howe Critical review: adhesion in surface micromechanical structures J. Vac. Sci. Technol. B 15 1997 1 20
    • (1997) J. Vac. Sci. Technol. B , vol.15 , pp. 1-20
    • Maboudian, R.1    Howe, R.T.2
  • 85
    • 0033742679 scopus 로고    scopus 로고
    • Self-assembled monolayers as anti-stiction coatings for MEMS: Characteristics and recent developments
    • R. Maboudian, W.R. Ashurst, and C. Carraro Self-assembled monolayers as anti-stiction coatings for MEMS: characteristics and recent developments Sensors and Actuators 82 2000 219 223
    • (2000) Sensors and Actuators , vol.82 , pp. 219-223
    • Maboudian, R.1    Ashurst, W.R.2    Carraro, C.3
  • 86
    • 27544493520 scopus 로고    scopus 로고
    • AFM study of perfluoroalkylsilane and alkylsilane self-assembled monolayers for anti-stiction in MEMS/NEMS
    • B. Bhushana, T. Kasai, G. Kulik, L. Barbieri, and P. Hoffmann AFM study of perfluoroalkylsilane and alkylsilane self-assembled monolayers for anti-stiction in MEMS/NEMS Ultramicroscopy 105 2005 176 188
    • (2005) Ultramicroscopy , vol.105 , pp. 176-188
    • Bhushana, B.1    Kasai, T.2    Kulik, G.3    Barbieri, L.4    Hoffmann, P.5
  • 87
    • 23444453674 scopus 로고    scopus 로고
    • Nanotribological characterization of self-assembled monolayers deposited on silicon and aluminium substrates
    • N.S. Tambe, and B. Bhushan Nanotribological characterization of self-assembled monolayers deposited on silicon and aluminium substrates Nanotechnology 16 2005 1549
    • (2005) Nanotechnology , vol.16 , pp. 1549
    • Tambe, N.S.1    Bhushan, B.2
  • 89
    • 77956589796 scopus 로고    scopus 로고
    • Structure and order of phosphonic acid-based self-assembled monolayers on Si(1 0 0)
    • M. Dubey, T. Weidner, L.J. Gamble, and D.G. Castner Structure and order of phosphonic acid-based self-assembled monolayers on Si(1 0 0) Langmuir 26 2010 14747 14754
    • (2010) Langmuir , vol.26 , pp. 14747-14754
    • Dubey, M.1    Weidner, T.2    Gamble, L.J.3    Castner, D.G.4
  • 90
    • 14844291357 scopus 로고    scopus 로고
    • Self-assembled Silane monolayers: Fabrication with nanoscale uniformity
    • M. Wang, K.M. Liechti, Q. Wang, and J.M. White Self-assembled Silane monolayers: fabrication with nanoscale uniformity Langmuir 21 2005 1848 1857
    • (2005) Langmuir , vol.21 , pp. 1848-1857
    • Wang, M.1    Liechti, K.M.2    Wang, Q.3    White, J.M.4
  • 91
    • 37549006357 scopus 로고    scopus 로고
    • Microscale friction phenomena in oscillatory sliding contacts
    • S.J. Timpe, K. Komvopoulos, and M.T. Dugger Microscale friction phenomena in oscillatory sliding contacts J. Appl. Phys. 102 2007 123503
    • (2007) J. Appl. Phys. , vol.102 , pp. 123503
    • Timpe, S.J.1    Komvopoulos, K.2    Dugger, M.T.3
  • 93
    • 36649021770 scopus 로고    scopus 로고
    • Molar volume and adsorption isotherm dependence of capillary forces in nanoasperity contacts
    • D.B. Asay, and S.H. Kim Molar volume and adsorption isotherm dependence of capillary forces in nanoasperity contacts Langmuir 23 2007 12174 12178
    • (2007) Langmuir , vol.23 , pp. 12174-12178
    • Asay, D.B.1    Kim, S.H.2
  • 94
    • 38349157268 scopus 로고    scopus 로고
    • Macro- to nanoscale wear prevention via molecular adsorption
    • D.B. Asay, M.T. Dugger, J.A. Ohlhausen, and S.H. Kim Macro- to nanoscale wear prevention via molecular adsorption Langmuir 24 2008 155 159
    • (2008) Langmuir , vol.24 , pp. 155-159
    • Asay, D.B.1    Dugger, M.T.2    Ohlhausen, J.A.3    Kim, S.H.4
  • 95
    • 71549119526 scopus 로고    scopus 로고
    • Experimental and density functional theory study of the tribochemical wear behavior of SiO2 in humid and alcohol vapor environments
    • A.L. Barnette, D.B. Asay, D. Kim, B.D. Guyer, H. Lim, M.J. Janik, and S.H. Kim Experimental and density functional theory study of the tribochemical wear behavior of SiO2 in humid and alcohol vapor environments Langmuir 25 2009 13052 13061
    • (2009) Langmuir , vol.25 , pp. 13052-13061
    • Barnette, A.L.1    Asay, D.B.2    Kim, D.3    Guyer, B.D.4    Lim, H.5    Janik, M.J.6    Kim, S.H.7
  • 96
    • 78049271390 scopus 로고    scopus 로고
    • Intercalation of 3-Phenyl-1-proponal into OTS SAMs on Silica nanoasperities to create self-repairing interfaces for MEMS lubrication
    • R.L. Jones, B.L. Harrod, and J.D. Batteas Intercalation of 3-Phenyl-1-proponal into OTS SAMs on Silica nanoasperities to create self-repairing interfaces for MEMS lubrication Langmuir 26 2010 16355 16361
    • (2010) Langmuir , vol.26 , pp. 16355-16361
    • Jones, R.L.1    Harrod, B.L.2    Batteas, J.D.3
  • 97
    • 84867440942 scopus 로고    scopus 로고
    • Surface-enhanced raman spectroscopy to probe photoreaction pathways and kinetics of isolated reactants on surfaces: Flat versus curved substrates
    • Y.B. Zheng, J.L. Payton, T.B. Song, B.K. Pathem, X.Y. Zhao, H. Ma, Y. Yang, L. Jensen, A.K.Y. Jen, and P.S. Weiss Surface-enhanced raman spectroscopy to probe photoreaction pathways and kinetics of isolated reactants on surfaces: flat versus curved substrates Nano Lett. 12 2012 5362 5368
    • (2012) Nano Lett. , vol.12 , pp. 5362-5368
    • Zheng, Y.B.1    Payton, J.L.2    Song, T.B.3    Pathem, B.K.4    Zhao, X.Y.5    Ma, H.6    Yang, Y.7    Jensen, L.8    Jen, A.K.Y.9    Weiss, P.S.10
  • 98
    • 84861344592 scopus 로고    scopus 로고
    • Ripple topography and roughness evolution on surface of polycrystalline gold and silver thin films under low energy Ar-ion beam sputtering
    • P. Gailly, C. Petermann, P. Tihon, and K. Fleury-Frenette Ripple topography and roughness evolution on surface of polycrystalline gold and silver thin films under low energy Ar-ion beam sputtering Appl. Surf. Sci. 258 2012 7717 7725
    • (2012) Appl. Surf. Sci. , vol.258 , pp. 7717-7725
    • Gailly, P.1    Petermann, C.2    Tihon, P.3    Fleury-Frenette, K.4
  • 99
    • 0018986498 scopus 로고
    • Influence of ion-bombardment and intermediate layers on the adherence of gold to oxide substrates
    • J. Salem, and F. Sequeda Influence of ion-bombardment and intermediate layers on the adherence of gold to oxide substrates J. Vac. Sci. Technol. 18 1981 149
    • (1981) J. Vac. Sci. Technol. , vol.18 , pp. 149
    • Salem, J.1    Sequeda, F.2
  • 100
    • 0343658422 scopus 로고
    • Study of cones developed by ion-bombardment of gold
    • I.H. Wilson Study of cones developed by ion-bombardment of gold J. Mater. Sci. 6 1971 1362
    • (1971) J. Mater. Sci. , vol.6 , pp. 1362
    • Wilson, I.H.1
  • 101
    • 0001256298 scopus 로고
    • Uses of ultraviolet ozone for hydrocarbon removal - Applications to surfaces of complex composition or geometry
    • N.S. McIntyre, R.D. Davidson, T. Walzak, R. Williston, M. Westcott, and A. Pekarsky Uses of ultraviolet ozone for hydrocarbon removal - applications to surfaces of complex composition or geometry J. Vac. Sci. Technol. A 9 1991 1355 1359
    • (1991) J. Vac. Sci. Technol. A , vol.9 , pp. 1355-1359
    • McIntyre, N.S.1    Davidson, R.D.2    Walzak, T.3    Williston, R.4    Westcott, M.5    Pekarsky, A.6
  • 102
    • 78651335232 scopus 로고
    • Removing sulfur from gold using ultraviolet ozone cleaning
    • C.G. Worley, and R.W. Linton Removing sulfur from gold using ultraviolet ozone cleaning J. Vac. Sci. Technol. A 13 1995 2281 2284
    • (1995) J. Vac. Sci. Technol. A , vol.13 , pp. 2281-2284
    • Worley, C.G.1    Linton, R.W.2
  • 103
    • 77952407468 scopus 로고    scopus 로고
    • Impact of in situ oxygen plasma cleaning on the resistance of Ru and Au-Ru based rf microelectromechanical system contacts in vacuum
    • M. Walker, C. Nordquist, D. Czaplewski, G. Patrizi, N. McGruer, and J. Krim Impact of in situ oxygen plasma cleaning on the resistance of Ru and Au-Ru based rf microelectromechanical system contacts in vacuum J. Appl. Phys. 107 2010 084509
    • (2010) J. Appl. Phys. , vol.107 , pp. 084509
    • Walker, M.1    Nordquist, C.2    Czaplewski, D.3    Patrizi, G.4    McGruer, N.5    Krim, J.6
  • 104
    • 78649673539 scopus 로고    scopus 로고
    • Evaluation of oxygen plasma and UV ozone methods for cleaning of occluded areas in MEMS devices
    • D.A. Hook, J.A. Ohlhausen, J. Krim, and M.T. Dugger Evaluation of oxygen plasma and UV ozone methods for cleaning of occluded areas in MEMS devices J. Microelectromech Syst. 19 2010 1292 1298
    • (2010) J. Microelectromech Syst. , vol.19 , pp. 1292-1298
    • Hook, D.A.1    Ohlhausen, J.A.2    Krim, J.3    Dugger, M.T.4
  • 105
    • 81855198941 scopus 로고    scopus 로고
    • Electrical contact resistance and device lifetime measurements of Au-RuO2-based RF MEMS exposed to hydrocarbons in vacuum and nitrogen environments
    • M.J. Walker, D. Berman, C. Nordquist, and J. Krim Electrical contact resistance and device lifetime measurements of Au-RuO2-based RF MEMS exposed to hydrocarbons in vacuum and nitrogen environments Tribol. Lett. 44 2011 305 314
    • (2011) Tribol. Lett. , vol.44 , pp. 305-314
    • Walker, M.J.1    Berman, D.2    Nordquist, C.3    Krim, J.4
  • 107
    • 0001626306 scopus 로고    scopus 로고
    • The atomic-scale origins of friction
    • J. Krim The atomic-scale origins of friction Langmuir 12 1996 4564 4566
    • (1996) Langmuir , vol.12 , pp. 4564-4566
    • Krim, J.1
  • 108
    • 33746096592 scopus 로고
    • Oxidation of gold by ultraviolet light and ozone at 25 C
    • D.E. King Oxidation of gold by ultraviolet light and ozone at 25 C J. Vac. Sci. Technol. A 13 1995 1247 1253
    • (1995) J. Vac. Sci. Technol. A , vol.13 , pp. 1247-1253
    • King, D.E.1
  • 109
    • 0000416997 scopus 로고
    • Micromechanical fracture strength of silicon
    • F. Ericson, and J.Å. Schweitz Micromechanical fracture strength of silicon J. Appl. Phys. 68 1990 5840 5844
    • (1990) J. Appl. Phys. , vol.68 , pp. 5840-5844
    • Ericson, F.1    Schweitz, J.A.2
  • 110
    • 34147173353 scopus 로고    scopus 로고
    • Strength distributions in polycrystalline silicon MEMS
    • B.L. Boyce, J.M. Grazier, T.E. Buchheit, and M.J. Shaw Strength distributions in polycrystalline silicon MEMS J. MEMS 16 2007 179 190
    • (2007) J. MEMS , vol.16 , pp. 179-190
    • Boyce, B.L.1    Grazier, J.M.2    Buchheit, T.E.3    Shaw, M.J.4
  • 111
    • 80053905101 scopus 로고    scopus 로고
    • Nanomechanical displacement detection using coherent transport in graphene nanoriboon resonators
    • A. Isacsson Nanomechanical displacement detection using coherent transport in graphene nanoriboon resonators Phys. Rev. B 84 2011 125452
    • (2011) Phys. Rev. B , vol.84 , pp. 125452
    • Isacsson, A.1
  • 112
    • 79953655122 scopus 로고    scopus 로고
    • Single-walled carbon nanotube electromechanical switching behavior with shoulder slip
    • P. Ryan, Y.-C. Wu, S. Somu, G. Adams, and N. McGruer Single-walled carbon nanotube electromechanical switching behavior with shoulder slip J. Micromech. Microeng. 21 2011 045028
    • (2011) J. Micromech. Microeng. , vol.21 , pp. 045028
    • Ryan, P.1    Wu, Y.-C.2    Somu, S.3    Adams, G.4    McGruer, N.5
  • 114
    • 35348959520 scopus 로고    scopus 로고
    • The Leiden MEMS tribometer: Real time dynamic friction loop measurements with an on-chip tribometer
    • W.M. van Spengen, and J.W. Frenken The Leiden MEMS tribometer: real time dynamic friction loop measurements with an on-chip tribometer Tribol. Lett. 28 2007 149 156
    • (2007) Tribol. Lett. , vol.28 , pp. 149-156
    • Van Spengen, W.M.1    Frenken, J.W.2
  • 116
    • 84864996533 scopus 로고    scopus 로고
    • Friction and energy dissipation mechnisms in adsorbed molecules and moleculary thin films
    • J. Krim Friction and energy dissipation mechnisms in adsorbed molecules and moleculary thin films Adv. Phys. 61 2012 155 323
    • (2012) Adv. Phys. , vol.61 , pp. 155-323
    • Krim, J.1
  • 120
    • 77955657921 scopus 로고    scopus 로고
    • Membrane-based actuation for high-speed single molecule force spectroscopy studies using AFM
    • K. Sarangapani, H. Torun, O. Finkler, C. Zhu, and L. Degertekin Membrane-based actuation for high-speed single molecule force spectroscopy studies using AFM Eur. Biophys. J. 39 2010 1219 1227
    • (2010) Eur. Biophys. J. , vol.39 , pp. 1219-1227
    • Sarangapani, K.1    Torun, H.2    Finkler, O.3    Zhu, C.4    Degertekin, L.5
  • 122
    • 0010095975 scopus 로고    scopus 로고
    • Atomic force microscopy using an integrated comb-shape electrostatic actuator for high-speed feedback motion
    • T. Akiyama, U. Staufer, and N.F. de Rooij Atomic force microscopy using an integrated comb-shape electrostatic actuator for high-speed feedback motion Appl. Phys. Lett. 76 2000 3139 3141
    • (2000) Appl. Phys. Lett. , vol.76 , pp. 3139-3141
    • Akiyama, T.1    Staufer, U.2    De Rooij, N.F.3
  • 123
    • 4344616892 scopus 로고    scopus 로고
    • Development of three-dimensional electrostatic stages for scanning probe microscope
    • Y. Ando Development of three-dimensional electrostatic stages for scanning probe microscope Sens. Actuators A 114 2004 285 291
    • (2004) Sens. Actuators A , vol.114 , pp. 285-291
    • Ando, Y.1
  • 125
    • 78650282509 scopus 로고    scopus 로고
    • Comment on MEMS-based high speed scanning probe microscopy
    • F.L. Degertekin, and H. Torun Comment on MEMS-based high speed scanning probe microscopy Rev. Sci. Instrum. 81 2010 117101
    • (2010) Rev. Sci. Instrum. , vol.81 , pp. 117101
    • Degertekin, F.L.1    Torun, H.2
  • 127
    • 70349679079 scopus 로고    scopus 로고
    • In situ studies of interfacial contact evolution via a two-axis deflecting cantilever microinstrument
    • F. Liu, I. Laboriante, B. Bush, C.S. Roper, C. Carraro, and R. Maboudian In situ studies of interfacial contact evolution via a two-axis deflecting cantilever microinstrument Appl. Phys. Lett. 95 2009 131902
    • (2009) Appl. Phys. Lett. , vol.95 , pp. 131902
    • Liu, F.1    Laboriante, I.2    Bush, B.3    Roper, C.S.4    Carraro, C.5    Maboudian, R.6
  • 128
    • 0036565114 scopus 로고    scopus 로고
    • Heat transfer analysis and optimization of two-beam microelectromechanical thermal actuators
    • R. Hickey, M. Kujath, and T. Hubbard Heat transfer analysis and optimization of two-beam microelectromechanical thermal actuators J. Vac. Sci. Technol. A 20 2002 971 974
    • (2002) J. Vac. Sci. Technol. A , vol.20 , pp. 971-974
    • Hickey, R.1    Kujath, M.2    Hubbard, T.3
  • 129
    • 0037185494 scopus 로고    scopus 로고
    • Measurement of the Casimir force between parallel metallic surfaces
    • G. Bressi, G. Carugno, R. Onofrio, and G. Ruoso Measurement of the Casimir force between parallel metallic surfaces Phys. Rev. Lett. 88 2002 041804
    • (2002) Phys. Rev. Lett. , vol.88 , pp. 041804
    • Bressi, G.1    Carugno, G.2    Onofrio, R.3    Ruoso, G.4
  • 130
    • 48249119556 scopus 로고    scopus 로고
    • Measurement of the Casimir force between a gold sphere and a silicon surface with nanoscale trench arrays
    • H.B. Chan, Y. Bao, J. Zou, R.A. Cirelli, F. Klemens, W.M. Mansfield, and C.S. Pai Measurement of the Casimir force between a gold sphere and a silicon surface with nanoscale trench arrays Phys. Rev. Lett. 101 2008 030401
    • (2008) Phys. Rev. Lett. , vol.101 , pp. 030401
    • Chan, H.B.1    Bao, Y.2    Zou, J.3    Cirelli, R.A.4    Klemens, F.5    Mansfield, W.M.6    Pai, C.S.7
  • 131
    • 55049094546 scopus 로고    scopus 로고
    • Casimir interaction of dielectric gratings
    • A. Lambrecht, and V.N. Marachevsky Casimir interaction of dielectric gratings Phys. Rev. Lett. 101 2008 160403
    • (2008) Phys. Rev. Lett. , vol.101 , pp. 160403
    • Lambrecht, A.1    Marachevsky, V.N.2
  • 132
    • 82955167834 scopus 로고    scopus 로고
    • Presence of electromagnetic fluctuations in micromechanics
    • J. Chevrier Presence of electromagnetic fluctuations in micromechanics C.R. Phys. 12 9-10 2011 898 907
    • (2011) C.R. Phys. , vol.12 , Issue.910 , pp. 898-907
    • Chevrier, J.1
  • 135
    • 0001286178 scopus 로고
    • On the attraction between two perfectly conducting plates
    • H.B.G. Casimir On the attraction between two perfectly conducting plates Proc. R. Netherlands Acad. Arts Sci. 51 1948 793 795
    • (1948) Proc. R. Netherlands Acad. Arts Sci. , vol.51 , pp. 793-795
    • Casimir, H.B.G.1
  • 136
    • 14944365228 scopus 로고    scopus 로고
    • Fundamental studies of Au contacts in MEMS RF switches
    • S.T. Patton, and J.S. Zabinski Fundamental studies of Au contacts in MEMS RF switches Tribol. Lett. 18 2005 215 230
    • (2005) Tribol. Lett. , vol.18 , pp. 215-230
    • Patton, S.T.1    Zabinski, J.S.2
  • 137
    • 0027665905 scopus 로고
    • Triboscopy: A new quantitative tool for microtribology
    • M. Belin Triboscopy: a new quantitative tool for microtribology Wear 168 1993 7 12
    • (1993) Wear , vol.168 , pp. 7-12
    • Belin, M.1
  • 138
    • 0035444056 scopus 로고    scopus 로고
    • The fretting sliding transition as a criterion for electrical contact performance
    • S. Hannel, S. Fouvry, P. Kapsa, and L. Vincent The fretting sliding transition as a criterion for electrical contact performance Wear 249 2001 761 770
    • (2001) Wear , vol.249 , pp. 761-770
    • Hannel, S.1    Fouvry, S.2    Kapsa, P.3    Vincent, L.4
  • 139
  • 140
    • 58149327374 scopus 로고    scopus 로고
    • Investigation of the electrical contact behaviors in Au-to-Au thin-film contacts for RF MEMS switches
    • H. Kwon, S.S. Jang, Y.H. Park, T.S. Kim, Y.D. Kim, H.J. Nam, and Y.C. Joo Investigation of the electrical contact behaviors in Au-to-Au thin-film contacts for RF MEMS switches J. Micromech. Microeng. 18 2008 105010
    • (2008) J. Micromech. Microeng. , vol.18 , pp. 105010
    • Kwon, H.1    Jang, S.S.2    Park, Y.H.3    Kim, T.S.4    Kim, Y.D.5    Nam, H.J.6    Joo, Y.C.7
  • 143
    • 33747423324 scopus 로고    scopus 로고
    • The effects of surface contamination on resistance degradation of hot-switched low-force MEMS electrical contacts
    • D.J. Dickrell, and M.T. Dugger The effects of surface contamination on resistance degradation of hot-switched low-force MEMS electrical contacts Electr. Contacts Proc. Fifty-First IEEE Holm Conf 2005 255 258
    • (2005) Electr. Contacts Proc. Fifty-First IEEE Holm Conf , pp. 255-258
    • Dickrell, D.J.1    Dugger, M.T.2
  • 144
    • 34547562292 scopus 로고    scopus 로고
    • Lubrication of microelectromechanical systems radio frequency switch contacts using self-assembled monolayers
    • S.T. Patton, K.C. Eapen, J.S. Zabinski, J.H. Sanders, and A.A. Voevodin Lubrication of microelectromechanical systems radio frequency switch contacts using self-assembled monolayers J. Appl. Phys. 102 2007 024903
    • (2007) J. Appl. Phys. , vol.102 , pp. 024903
    • Patton, S.T.1    Eapen, K.C.2    Zabinski, J.S.3    Sanders, J.H.4    Voevodin, A.A.5
  • 145
    • 78449238630 scopus 로고    scopus 로고
    • Voltage saturation in electrical contacts via viscoplastic creep
    • D.G. Bansal, and J.L. Streator Voltage saturation in electrical contacts via viscoplastic creep Acta Mater. 59 2011 726 737
    • (2011) Acta Mater. , vol.59 , pp. 726-737
    • Bansal, D.G.1    Streator, J.L.2
  • 146
    • 48849094840 scopus 로고    scopus 로고
    • The role of creep in the time-dependent resistance of ohmic gold contacts in radio frequency micro-electromechanical system devices
    • O. Rezvanian, C. Brown, M.A. Zikry, A.I. Kingon, J. Krim, D.L. Irving, and D.W. Brenner The role of creep in the time-dependent resistance of ohmic gold contacts in radio frequency micro-electromechanical system devices J. Appl. Phys. 104 2008 024513
    • (2008) J. Appl. Phys. , vol.104 , pp. 024513
    • Rezvanian, O.1    Brown, C.2    Zikry, M.A.3    Kingon, A.I.4    Krim, J.5    Irving, D.L.6    Brenner, D.W.7
  • 147
    • 61849183146 scopus 로고    scopus 로고
    • Temperature dependence of asperity contact and contact resistance in gold RF MEMS switches
    • C. Brown, O. Rezvanian, M.A. Zikry, and J. Krim Temperature dependence of asperity contact and contact resistance in gold RF MEMS switches J. Microelectromech. Syst. 19 2009 025006
    • (2009) J. Microelectromech. Syst. , vol.19 , pp. 025006
    • Brown, C.1    Rezvanian, O.2    Zikry, M.A.3    Krim, J.4
  • 149
    • 0001557067 scopus 로고
    • The size effect and the non-local Boltzmann transport equation in orifice and disk geometry
    • G. Wexler The size effect and the non-local Boltzmann transport equation in orifice and disk geometry Proc. Phys. Soc. 89 1966 927 941
    • (1966) Proc. Phys. Soc. , vol.89 , pp. 927-941
    • Wexler, G.1
  • 150
    • 0000629675 scopus 로고    scopus 로고
    • Electron transport through a circular constriction
    • B. Nikolic, and P.B. Allen Electron transport through a circular constriction Phys. Rev. B 60 1999 3963 3969
    • (1999) Phys. Rev. B , vol.60 , pp. 3963-3969
    • Nikolic, B.1    Allen, P.B.2
  • 152
    • 17444425312 scopus 로고    scopus 로고
    • Analytical current-voltage relationships for electron tunneling across rough interfaces
    • L. Kogut, and K. Komvopoulos Analytical current-voltage relationships for electron tunneling across rough interfaces J. Appl. Phys. 97 2005 073701
    • (2005) J. Appl. Phys. , vol.97 , pp. 073701
    • Kogut, L.1    Komvopoulos, K.2
  • 153
    • 0742320701 scopus 로고    scopus 로고
    • Electrical contact resistance theory for conductive rough surfaces separated by a thin insulating film
    • L. Kogut, and K. Komvopoulos Electrical contact resistance theory for conductive rough surfaces separated by a thin insulating film J. Appl. Phys. 95 2004 576 585
    • (2004) J. Appl. Phys. , vol.95 , pp. 576-585
    • Kogut, L.1    Komvopoulos, K.2
  • 154
    • 66249111155 scopus 로고    scopus 로고
    • Nanomechanical switches for power saving in CMOS applications
    • U34
    • D.A. Czaplewski, G.M. Kraus, and C.D. Nordquist Nanomechanical switches for power saving in CMOS applications Electron. Lett. 45 2009 550 U34
    • (2009) Electron. Lett. , vol.45 , pp. 550
    • Czaplewski, D.A.1    Kraus, G.M.2    Nordquist, C.D.3
  • 156
    • 67649986201 scopus 로고    scopus 로고
    • Well-aligned and suspended single-walled carbon nanotube film: Directed self assembly, patterning, and characterization
    • M. Lu, M.W. Jang, G. Haugstad, S.A. Campbell, and T. Cui Well-aligned and suspended single-walled carbon nanotube film: directed self assembly, patterning, and characterization Appl. Phys. Lett. 94 2009 261903
    • (2009) Appl. Phys. Lett. , vol.94 , pp. 261903
    • Lu, M.1    Jang, M.W.2    Haugstad, G.3    Campbell, S.A.4    Cui, T.5
  • 158
    • 0031651628 scopus 로고    scopus 로고
    • Low coverage adsorption in cylindrical pores
    • G. Stan, and M.W. Cole Low coverage adsorption in cylindrical pores Surf. Sci. 395 1998 280 291
    • (1998) Surf. Sci. , vol.395 , pp. 280-291
    • Stan, G.1    Cole, M.W.2
  • 159
    • 84863946240 scopus 로고    scopus 로고
    • A chemical route to control molecular mobility on graphene
    • M. Jafary-Zadeh, C.D. Reddy, and T.-W. Zhang A chemical route to control molecular mobility on graphene Phys. Chem. Chem. Phys. 14 2012 10533 10539
    • (2012) Phys. Chem. Chem. Phys. , vol.14 , pp. 10533-10539
    • Jafary-Zadeh, M.1    Reddy, C.D.2    Zhang, T.-W.3
  • 161
    • 0028196078 scopus 로고
    • Stepwise isotherms and phase-transitions in physisorbed films
    • A. Thomy, and Z. Duval Stepwise isotherms and phase-transitions in physisorbed films Surf. Sci. 299 300 1994 415 425
    • (1994) Surf. Sci. , vol.299 , Issue.300 , pp. 415-425
    • Thomy, A.1    Duval, Z.2
  • 163
    • 75749094312 scopus 로고    scopus 로고
    • Phase transitions of adsorbed atoms on the surface of a carbon nanotube
    • Z. Wang, J. Wei, P. Morse, J.G. Dash, O.E. Vilches, and D.H. Cobden Phase transitions of adsorbed atoms on the surface of a carbon nanotube Science 327 2010 552 554
    • (2010) Science , vol.327 , pp. 552-554
    • Wang, Z.1    Wei, J.2    Morse, P.3    Dash, J.G.4    Vilches, O.E.5    Cobden, D.H.6
  • 164
    • 84867267229 scopus 로고    scopus 로고
    • Frictional temperature rise in a sliding physisorbed monolayer of Kr/graphene
    • M. Walker, C. Jaye, J. Krim, and M.W. Cole Frictional temperature rise in a sliding physisorbed monolayer of Kr/graphene J. Phys. Condens. Matter 24 2012 424201
    • (2012) J. Phys. Condens. Matter , vol.24 , pp. 424201
    • Walker, M.1    Jaye, C.2    Krim, J.3    Cole, M.W.4


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