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Volumn 132, Issue 3, 2010, Pages 0309161-0309164

Probe-tip induced damage in compliant substrates

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIGITAL STORAGE; MOLECULAR DYNAMICS; NANOPROBES; SILICA;

EID: 77955313486     PISSN: 10871357     EISSN: 15288935     Source Type: Journal    
DOI: 10.1115/1.4001660     Document Type: Article
Times cited : (9)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.