Analytical current-voltage relationships for electron tunneling across rough interfaces

Journal of Applied Physics

Volumn 97, Issue 7, 2005, Pages

  Kogut, L ^a   Komvopoulos, K ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT INTERFACES; CONTACT LOADS; ELECTRICAL CONTACT RESISTANCE (ECR); INSULATING FILMS;

CHARGE TRANSFER; CURRENT DENSITY; ELECTRIC LOADS; ELECTROMECHANICAL DEVICES; ELECTRON TUNNELING; INSULATING MATERIALS; INTERFACES (MATERIALS); MONOLAYERS; PERMITTIVITY; SCANNING TUNNELING MICROSCOPY; SILICA; SURFACE ROUGHNESS; SURFACE TOPOGRAPHY; ULTRATHIN FILMS;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 17444425312     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1866472     Document Type: Article

References (19)

1. J. C. Fisher and I. Giaever, J. Appl. Phys. 32, 172 (1961).
2. G. Reiss, F. Schneider, J. Vancea, and H. Hoffmann, Appl. Phys. Lett. 57, 867 (1990).
3. D. Z.-Y. Ting, Appl. Phys. Lett. 73, 2769 (1998).
4. L. Mao, C. Tan, and M. Xu, Solid-State Electron. 45, 531 (2001).
5. J. Beale and R. F. Pease, IEEE Trans. Compon., Packag. Manuf. Technol., Part A 17, 257 (1994).
6. K. Hansen, S. K. Nielsen, M. Brandbyge, E. Lægsgaard, I. Stensgaard, nd F. Besenbacher, Appl. Phys. Lett. 77, 708 (2000).
7. C. I. Pakes, S. Ramelow, S. Prawer, and D. N. Jamieson, Appl. Phys. Lett. 84, 3142 (2004).
8. R. E. Holmlin, R. Haag, M. L. Chabinyc, R. F. Ismagilov, A. E. Cohen, A. Terfort, M. A. Rampi, and G. M. Whitesides, J. Am. Chem. Soc. 123, 5075 (2001).
9. L. Kogut and K. Komvopoulos, J. Appl. Phys. 95, 576 (2004).
10. L. Kogut and K. Komvopoulos, Appl. Phys. Lett. 84, 4842 (2004).
11. A. Lumbantobing, L. Kogut, and K. Komvopoulos, J. Microelectromech. Syst. 13, 977 (2004).
12. G. S. Ferguson, M. K. Chaudhury, G. B. Sigal, and G. M. Whitesides, Science 253, 776 (1991).
13. L. Weber, M. Lehr, and E. Gmelin, Physica B 217, 181 (1996).
14. T. Itoh, T. Suga, G. Engelmann, J. Wolf, O. Ehrmann, and H. Reichl, Rev. Sci. Instrum. 71, 2224 (2000).
15. J. G. Simmons, J. Appl. Phys. 34, 1793 (1963).
16. L. Kogut, A. Lumbantobing, and K. Komvopoulos, in Proceedings of the Solid-State Sensor, Actuator and Microsystems Workshop, Hilton Head Island, SC, 2004, pp. 310-315.
17. L. Kogut and K. Komvopoulos, J. Appl. Phys. 94, 6386 (2003).
18. K. Komvopoulos and N. Ye, J. Tribol. 123, 632 (2001).
19. C. B. Parker, J. P. Maria, and A. I. Kingon, Appl. Phys. Lett. 81, 340 (2002).