-
1
-
-
28744447283
-
Industry study on issues of MEMS reliability and accelerated lifetime testing
-
C. Fung, "Industry study on issues of MEMS reliability and accelerated lifetime testing," in Proc. 43rd Annu. IEEE Int. Rel. Phys. Symp. 2005, pp. 312-316.
-
(2005)
Proc. 43rd Annu. IEEE Int. Rel. Phys. Symp
, pp. 312-316
-
-
Fung, C.1
-
2
-
-
27644531339
-
Effect of nanoscale heating on electrical transport in RF MEMS switch contacts
-
Oct
-
B. D. Jensen, L.-W. Chow, K. Huang, K. Saitou, J. L. Volakis, and K. Kurabayashi, "Effect of nanoscale heating on electrical transport in RF MEMS switch contacts," J. Microelectromech. Syst., vol. 14, no. 5, pp. 935-946, Oct. 2005.
-
(2005)
J. Microelectromech. Syst
, vol.14
, Issue.5
, pp. 935-946
-
-
Jensen, B.D.1
Chow, L.-W.2
Huang, K.3
Saitou, K.4
Volakis, J.L.5
Kurabayashi, K.6
-
3
-
-
57449110516
-
Cryogenic performance of RF MEMS switch contacts
-
Dec
-
C. Brown, A. Morris, A. Kingon, and J. Krim, "Cryogenic performance of RF MEMS switch contacts," J. Microelectromech. Syst., vol. 17, no. 6, pp. 1460-1467, Dec. 2008.
-
(2008)
J. Microelectromech. Syst
, vol.17
, Issue.6
, pp. 1460-1467
-
-
Brown, C.1
Morris, A.2
Kingon, A.3
Krim, J.4
-
4
-
-
33745063923
-
The dynamic response of resistive microswitches: Switching time and bouncing
-
Jul
-
A. Granaldi and P. Decuzzi, "The dynamic response of resistive microswitches: Switching time and bouncing," J. Micromech. Microeng. vol. 16, no. 7, pp. 1108-1115, Jul. 2006.
-
(2006)
J. Micromech. Microeng
, vol.16
, Issue.7
, pp. 1108-1115
-
-
Granaldi, A.1
Decuzzi, P.2
-
5
-
-
33745100674
-
Bouncing dynamics of resistive microswitches with an adhesive tip
-
Jul
-
P. Decuzzi, G. P. Demelio, G. Pascasio, and V. Zaza, "Bouncing dynamics of resistive microswitches with an adhesive tip," J. Appl. Phys., vol. 100, no. 2, p. 024 313, Jul. 2006.
-
(2006)
J. Appl. Phys
, vol.100
, Issue.2
, pp. 024-313
-
-
Decuzzi, P.1
Demelio, G.P.2
Pascasio, G.3
Zaza, V.4
-
6
-
-
33750004656
-
Active opening force and passive contact force electrostatic switches for soft metal contact materials
-
Oct
-
J. Oberhammer and G. Stemme, "Active opening force and passive contact force electrostatic switches for soft metal contact materials," J. Microelectromech. Syst., vol. 15, no. 5, pp. 1235-1242, Oct. 2006.
-
(2006)
J. Microelectromech. Syst
, vol.15
, Issue.5
, pp. 1235-1242
-
-
Oberhammer, J.1
Stemme, G.2
-
7
-
-
33750004510
-
Mechanical, thermal, and material influences on ohmic-contact-type MEMS switch operation
-
Istanbul, Turkey
-
N. E. McGruer, G. G. Adams, L. Chen, Z. J. Guo, and Y. Du, "Mechanical, thermal, and material influences on ohmic-contact-type MEMS switch operation," in Proc. 19th MEMS, Istanbul, Turkey, 2006, pp. 230-233.
-
(2006)
Proc. 19th MEMS
, pp. 230-233
-
-
McGruer, N.E.1
Adams, G.G.2
Chen, L.3
Guo, Z.J.4
Du, Y.5
-
8
-
-
4243100605
-
Selecting metal alloy electric contact materials for MEMS switches
-
Aug
-
R. A. Coutu, P. E. Kladitis, K. D. Leedy, and R. L. Crane, "Selecting metal alloy electric contact materials for MEMS switches," J. Micromech. Microeng., vol. 14, no. 8, pp. 1157-1164, Aug. 2004.
-
(2004)
J. Micromech. Microeng
, vol.14
, Issue.8
, pp. 1157-1164
-
-
Coutu, R.A.1
Kladitis, P.E.2
Leedy, K.D.3
Crane, R.L.4
-
9
-
-
33744815256
-
Microswitches with sputtered Au, AuPd, Au-on-AuPt, and AuPtCu alloy electric contacts
-
Jun
-
R. A. Coutu, J. R. Reid, R. Cortez, R. E. Strawser, and P. E. Kladitis, "Microswitches with sputtered Au, AuPd, Au-on-AuPt, and AuPtCu alloy electric contacts," IEEE Trans. Compon. Packag. Technol., vol. 29, no. 2, pp. 341-349, Jun. 2006.
-
(2006)
IEEE Trans. Compon. Packag. Technol
, vol.29
, Issue.2
, pp. 341-349
-
-
Coutu, R.A.1
Reid, J.R.2
Cortez, R.3
Strawser, R.E.4
Kladitis, P.E.5
-
10
-
-
0033319678
-
Contact physics of gold microcontacts for MEMS switches
-
Sep
-
D. Hyman and M. Mehregany, "Contact physics of gold microcontacts for MEMS switches," IEEE Trans. Compon. Packag. Technol., vol. 22, no. 3, pp. 357-364, Sep. 1999.
-
(1999)
IEEE Trans. Compon. Packag. Technol
, vol.22
, Issue.3
, pp. 357-364
-
-
Hyman, D.1
Mehregany, M.2
-
11
-
-
0031678165
-
Contact materials for microrelays
-
J. Schimkat, "Contact materials for microrelays," in Proc. 11th MEMS Workshop, 1998, pp. 190-194.
-
(1998)
Proc. 11th MEMS Workshop
, pp. 190-194
-
-
Schimkat, J.1
-
12
-
-
33747423324
-
The effects of surface contamination on resistance degradation of hot-switched low-force MEMS electrical contacts
-
D. J. Dickel and M. T. Dugger, "The effects of surface contamination on resistance degradation of hot-switched low-force MEMS electrical contacts," in Proc. 51st IEEE Holm Conf. Elect. Contacts, 2005, pp. 255-258.
-
(2005)
Proc. 51st IEEE Holm Conf. Elect. Contacts
, pp. 255-258
-
-
Dickel, D.J.1
Dugger, M.T.2
-
13
-
-
33144470276
-
Contact evolution in micromechanical switch
-
Paper WTC2005-63970. CD-ROM
-
L. Chen, N. E. McGruer, and G. G. Adams, "Contact evolution in micromechanical switch," in Proc. WTC2005, World Tribology Congr. III, Paper WTC2005-63970. CD-ROM.
-
Proc. WTC2005, World Tribology Congr. III
-
-
Chen, L.1
McGruer, N.E.2
Adams, G.G.3
-
14
-
-
3042768343
-
Finite element analysis of the thermal characteristics of MEMS switches
-
X. Yan, N. E. McGruer, G. G. Adams, and S. Majumder, "Finite element analysis of the thermal characteristics of MEMS switches," in Proc. 12th Int Conf. Transducers, Solid-State Sensors, Actuator Microsyst., 2003, vol. 1, pp. 412-415.
-
(2003)
Proc. 12th Int Conf. Transducers, Solid-State Sensors, Actuator Microsyst
, vol.1
, pp. 412-415
-
-
Yan, X.1
McGruer, N.E.2
Adams, G.G.3
Majumder, S.4
-
15
-
-
51649090154
-
A new test facility for efficient evaluation of MEMS contact materials
-
Sep
-
Z. Yang, D. Lichtenwalner, A. Morris, S. Menzel, C. Nauenheim, A. Gruverman, J. Krim, and A. I. Kingon, "A new test facility for efficient evaluation of MEMS contact materials," J. Micromech. Microeng., vol. 17, no. 9, pp. 1788-1795, Sep. 2007.
-
(2007)
J. Micromech. Microeng
, vol.17
, Issue.9
, pp. 1788-1795
-
-
Yang, Z.1
Lichtenwalner, D.2
Morris, A.3
Menzel, S.4
Nauenheim, C.5
Gruverman, A.6
Krim, J.7
Kingon, A.I.8
-
17
-
-
84897487319
-
High performance integrated RF MEMS: Part 1 - The process
-
A. S. Morris, S. Cunningham, D. Dereus, and G. Schropfer, "High performance integrated RF MEMS: Part 1 - The process," in Proc. 33rd Eur. Microw. Conf., 2003, pp. 21-24.
-
(2003)
Proc. 33rd Eur. Microw. Conf
, pp. 21-24
-
-
Morris, A.S.1
Cunningham, S.2
Dereus, D.3
Schropfer, G.4
-
19
-
-
0017519172
-
Four-point sheet resistance correction factors for thin rectangular samples
-
Aug
-
D. S. Perloff, "Four-point sheet resistance correction factors for thin rectangular samples," Solid State Electron., vol. 20, no. 8, pp. 681-687, Aug. 1977.
-
(1977)
Solid State Electron
, vol.20
, Issue.8
, pp. 681-687
-
-
Perloff, D.S.1
-
20
-
-
0006337660
-
A redetermination of the lattice spacings and densities of gold-nickel solutions
-
A. F. Crawley and D. J. Fabian, "A redetermination of the lattice spacings and densities of gold-nickel solutions," J. Inst. Met., vol. 94, pp. 39-40, 1966.
-
(1966)
J. Inst. Met
, vol.94
, pp. 39-40
-
-
Crawley, A.F.1
Fabian, D.J.2
-
21
-
-
3042825189
-
Force dependence of RF MEMS switch contact heating
-
B. D. Jensen, L. W. Chow, R. F. Webbink, K. Saitou, J. L. Volakis, and K. Kurabayashi, "Force dependence of RF MEMS switch contact heating," in Proc. 17th IEEE Int. Conf. MEMS, 2004, pp. 137-140.
-
(2004)
Proc. 17th IEEE Int. Conf. MEMS
, pp. 137-140
-
-
Jensen, B.D.1
Chow, L.W.2
Webbink, R.F.3
Saitou, K.4
Volakis, J.L.5
Kurabayashi, K.6
-
25
-
-
67349095531
-
Physics Dept., North Carolina State Univ., Raleigh, NC
-
unpublished
-
C. Brown, Physics Dept., North Carolina State Univ., Raleigh, NC, unpublished.
-
-
-
Brown, C.1
-
27
-
-
0016070147
-
X-ray photoelectron spectroscopic studies of nickel-oxygen surfaces using oxygen and argon ion-bombardment
-
Jun
-
K. S. Kim and N. Winograd, "X-ray photoelectron spectroscopic studies of nickel-oxygen surfaces using oxygen and argon ion-bombardment," Surf. Sci., vol. 43, no. 2, pp. 625-643, Jun. 1974.
-
(1974)
Surf. Sci
, vol.43
, Issue.2
, pp. 625-643
-
-
Kim, K.S.1
Winograd, N.2
-
28
-
-
45449087172
-
2 catalysts
-
2 catalysts," J. Electron Spectrosc. Relat. Phenom., vol. 16, p. 267, 1979.
-
(1979)
J. Electron Spectrosc. Relat. Phenom
, vol.16
, pp. 267
-
-
Lorenz, P.1
Finster, J.2
Wendit, G.3
Salyn, J.V.4
Zumadilov, E.K.5
Nefedov, V.I.6
-
29
-
-
0009789519
-
Adsorption of ethylenediamine on clean and oxygen covered Fe/ Ni(100) surfaces studied by XPS
-
K. Kishi, "Adsorption of ethylenediamine on clean and oxygen covered Fe/ Ni(100) surfaces studied by XPS," J. Electron Spectrosc. Relat. Phenom., vol. 46, p. 237, 1988.
-
(1988)
J. Electron Spectrosc. Relat. Phenom
, vol.46
, pp. 237
-
-
Kishi, K.1
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