메뉴 건너뛰기




Volumn 12, Issue 5, 2002, Pages 702-713

A physical model to predict stiction in MEMS

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; APPROXIMATION THEORY; ATMOSPHERIC HUMIDITY; CONDENSATION; ELECTROSTATICS; MATHEMATICAL MODELS; MOLECULAR DYNAMICS; STICTION; SURFACE ROUGHNESS; TEMPERATURE; VAN DER WAALS FORCES;

EID: 0036732328     PISSN: 09601317     EISSN: None     Source Type: Journal    
DOI: 10.1088/0960-1317/12/5/329     Document Type: Article
Times cited : (209)

References (29)
  • 22
    • 0034541813 scopus 로고    scopus 로고
    • An adhesion model for MEMS surfaces taking into account the effect of surface roughness (materials and device characterization in micromachining III)
    • (2000) Proc. SPIE , vol.4175 , pp. 104
    • Van Spengen, W.M.1    De Wolf, I.2    Puers, B.3
  • 25
    • 0030141923 scopus 로고    scopus 로고
    • Methodology for roughness measurement and contact analysis for optimization of interface roughness
    • (1996) IEEE Trans. Magn. , vol.32 , pp. 1819
    • Bhushan, B.1
  • 27
    • 0004241302 scopus 로고    scopus 로고
    • Electrostatic micro walkers
    • PhD Thesis University of Twente, The Netherlands
    • (2000) , pp. 74
    • Tas, N.R.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.