Video-rate scanning probe control challenges: setting the stage for a microscopy revolution

Asian Journal of Control

Volumn 11, Issue 2, 2009, Pages 110-129

  Rost, M J ^a,b   van Baarle, G J C ^a,b   Katan, A J ^a   van Spengen, W M ^a,c   Schakel, P ^a   van Loo, W A ^a   Oosterkamp, T H ^a,b   Frenken, J W M ^a  

^a LEIDEN UNIVERSITY   (Netherlands)

^b Leiden Probe Microscopy   (Netherlands)

^c Faleo Systems   (Netherlands)

Author keywords

Control electronics; Mechanical issues; Scanning probe microscopy; Video rate

Indexed keywords

ATOMIC FORCE MICROSCOPY; CATALYSIS; HYDROPHOBICITY; MICROSCOPES; SCANNING PROBE MICROSCOPY;

ACCELERATION LIMITS; CATALYTIC REACTIONS; CONTROL ELECTRONICS; DESIGN AND CONSTRUCTION; DIRECT OBSERVATIONS; MECHANICAL ISSUES; TECHNICAL REQUIREMENT; VIDEO RATES;

FILM GROWTH;

EID: 72449180321     PISSN: 15618625     EISSN: None     Source Type: Journal    
DOI: 10.1002/asjc.88     Document Type: Article

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