Threshold voltage shifting for memory and tuning in printed transistor circuits

Materials Science and Engineering R: Reports

Volumn 72, Issue 4, 2011, Pages 49-80

  Dhar, Bal Mukund ^a   Özgün, Recep ^a   Dawidczyk, Tom ^a   Andreou, Andreas ^a   Katz, Howard E ^a  

^a Johns Hopkins University   (United States)

Author keywords

Charged Dielectrics; Circuit Tuning; Memory; Organic Transistors; Printed Electronics; Threshold Voltage

Indexed keywords

COMPUTER CIRCUITS; DATA STORAGE EQUIPMENT; FREQUENCY RESPONSE; TIMING CIRCUITS; TRANSISTORS; TUNING;

CIRCUIT APPLICATION; CIRCUIT TUNING; ELECTRONIC TECHNOLOGIES; FLOATING GATE MEMORY; HIGH FREQUENCY RESPONSE; ORGANIC TRANSISTOR; PRINTED ELECTRONICS; RELIABLE PERFORMANCE;

THRESHOLD VOLTAGE;

EID: 79955477304     PISSN: 0927796X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mser.2010.11.001     Document Type: Review

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