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Volumn 94, Issue 1, 2003, Pages 471-479

Light-induced bias stress reversal in polyfluorene thin-film transistors

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; INTERFACES (MATERIALS); SEMICONDUCTING POLYMERS; SILICA; STRESSES;

EID: 0041339891     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1581352     Document Type: Article
Times cited : (230)

References (34)
  • 20
    • 1542515852 scopus 로고    scopus 로고
    • edited by H. Ehrenreich and F. Spaepen (Academic, New York, 1996)
    • N. C. Greenham and R. H. Friend, Solid State Physics, edited by H. Ehrenreich and F. Spaepen (Academic, New York, 1996), Vol. 49, p. 1, 1996.
    • (1996) Solid State Physics , vol.49 , pp. 1
    • Greenham, N.C.1    Friend, R.H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.