Effect of dielectric roughness on performance of pentacene TFTs and restoration of performance with a polymeric smoothing layer

Journal of Physical Chemistry B

Volumn 109, Issue 21, 2005, Pages 10574-10577

  Fritz, Sandra E ^a   Kelley, Tommie Wilson ^b   Frisbie, C Daniel ^a  

^a University of Minnesota   (United States)

^b 3M COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION RATE; FILM MORPHOLOGY; METALLIC LAYERS; TRAP WIDTH;

CARRIER MOBILITY; DEPOSITION; DIELECTRIC PROPERTIES; GRAIN SIZE AND SHAPE; MORPHOLOGY; SILICA; SURFACE ROUGHNESS; TRANSPORT PROPERTIES;

THIN FILM TRANSISTORS;

EID: 20744435013     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp044318f     Document Type: Article

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