Atomic force microscopy as a tool for atom manipulation

Nature Nanotechnology

Volumn 4, Issue 12, 2009, Pages 803-810

  Custance, Oscar ^a   Perez, Ruben ^b   Morita, Seizo ^c  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^c OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

MOLECULES; SCANNING TUNNELING MICROSCOPY;

ATOM MANIPULATION; BUILDING BLOCKES; CRYOGENIC TEMPERATURES; MODEL SYSTEM; NANOSCALE DEVICE; SCANNING PROBE TECHNIQUES; SINGLE ATOMS;

ATOMIC FORCE MICROSCOPY;

ATOM; ATOMIC FORCE MICROSCOPY; NANOANALYSIS; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; REVIEW; ROOM TEMPERATURE; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTY; TECHNIQUE;

EID: 72549108942     PISSN: 17483387     EISSN: 17483395     Source Type: Journal    
DOI: 10.1038/nnano.2009.347     Document Type: Review

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